JP4854445B2 - Cmpコンディショナおよびその製造方法 - Google Patents
Cmpコンディショナおよびその製造方法 Download PDFInfo
- Publication number
- JP4854445B2 JP4854445B2 JP2006258894A JP2006258894A JP4854445B2 JP 4854445 B2 JP4854445 B2 JP 4854445B2 JP 2006258894 A JP2006258894 A JP 2006258894A JP 2006258894 A JP2006258894 A JP 2006258894A JP 4854445 B2 JP4854445 B2 JP 4854445B2
- Authority
- JP
- Japan
- Prior art keywords
- protective layer
- layer
- cmp conditioner
- binder phase
- fine particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/12—Dressing tools; Holders therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D18/00—Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/04—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially inorganic
- B24D3/06—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially inorganic metallic or mixture of metals with ceramic materials, e.g. hard metals, "cermets", cements
- B24D3/08—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially inorganic metallic or mixture of metals with ceramic materials, e.g. hard metals, "cermets", cements for close-grained structure, e.g. using metal with low melting point
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Other Surface Treatments For Metallic Materials (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006258894A JP4854445B2 (ja) | 2006-09-25 | 2006-09-25 | Cmpコンディショナおよびその製造方法 |
| PCT/JP2007/068356 WO2008038583A1 (en) | 2006-09-25 | 2007-09-21 | Cmp conditioner and process for producing the same |
| US12/311,226 US20090239454A1 (en) | 2006-09-25 | 2007-09-21 | Cmp conditioner and process for producing the same |
| TW096135548A TW200902234A (en) | 2006-09-25 | 2007-09-21 | CMP conditioner and its manufacturing method |
| KR1020097005986A KR20090074741A (ko) | 2006-09-25 | 2007-09-21 | Cmp 컨디셔너 및 그의 제조방법 |
| CNA2007800355219A CN101547770A (zh) | 2006-09-25 | 2007-09-21 | Cmp修整器和其制备方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006258894A JP4854445B2 (ja) | 2006-09-25 | 2006-09-25 | Cmpコンディショナおよびその製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008073825A JP2008073825A (ja) | 2008-04-03 |
| JP4854445B2 true JP4854445B2 (ja) | 2012-01-18 |
Family
ID=39230018
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006258894A Expired - Fee Related JP4854445B2 (ja) | 2006-09-25 | 2006-09-25 | Cmpコンディショナおよびその製造方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20090239454A1 (OSRAM) |
| JP (1) | JP4854445B2 (OSRAM) |
| KR (1) | KR20090074741A (OSRAM) |
| CN (1) | CN101547770A (OSRAM) |
| TW (1) | TW200902234A (OSRAM) |
| WO (1) | WO2008038583A1 (OSRAM) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2646973C (en) * | 2008-12-18 | 2015-12-01 | Sunnen Products Company | Honing tool having enhanced wear resistance properties |
| US8512098B1 (en) * | 2010-09-28 | 2013-08-20 | Jeffrey Bonner | Machining technique using a plated superabrasive grinding wheel on a swiss style screw machine |
| TWI422466B (zh) * | 2011-01-28 | 2014-01-11 | Advanced Surface Tech Inc | 鑽石研磨工具及其製造方法 |
| CN203390712U (zh) * | 2013-04-08 | 2014-01-15 | 宋健民 | 化学机械研磨修整器 |
| JP5681826B1 (ja) * | 2014-06-16 | 2015-03-11 | 嘉五郎 小倉 | 軸芯測定装置 |
| JP6453666B2 (ja) * | 2015-02-20 | 2019-01-16 | 東芝メモリ株式会社 | 研磨パッドドレッサの作製方法 |
| CN108237467B (zh) * | 2016-12-23 | 2020-10-02 | 中芯国际集成电路制造(上海)有限公司 | 一种研磨垫的处理方法 |
| TWI636854B (zh) * | 2017-06-12 | 2018-10-01 | 中國砂輪企業股份有限公司 | 研磨工具及其製造方法 |
| KR102013386B1 (ko) * | 2018-01-29 | 2019-08-22 | 새솔다이아몬드공업 주식회사 | 역도금 패드 컨디셔너 제조방법 및 패드 컨디셔너 |
| CN110634776B (zh) * | 2019-09-18 | 2022-03-01 | 西安奕斯伟材料科技有限公司 | 一种硅片样品的制备装置及制备方法 |
| CN110782779B (zh) * | 2019-11-01 | 2022-05-13 | Oppo广东移动通信有限公司 | 玻璃件及其表面抛光方法、玻璃壳体和电子设备 |
| TWI806466B (zh) * | 2022-03-03 | 2023-06-21 | 中國砂輪企業股份有限公司 | 拋光墊修整器及其製造方法 |
| TWI823456B (zh) * | 2022-07-01 | 2023-11-21 | 詠巨科技有限公司 | 修整組件、其製造方法及應用其的組合式修整器 |
| TWI889633B (zh) * | 2025-01-23 | 2025-07-01 | 日鐵精工股份有限公司 | 鑽石修整器的製造設備以及鑽石修整器的製造方法 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3334041A (en) * | 1964-08-28 | 1967-08-01 | Norton Co | Coated abrasives |
| SE442305B (sv) * | 1984-06-27 | 1985-12-16 | Santrade Ltd | Forfarande for kemisk gasutfellning (cvd) for framstellning av en diamantbelagd sammansatt kropp samt anvendning av kroppen |
| US4992082A (en) * | 1989-01-12 | 1991-02-12 | Ford Motor Company | Method of toughening diamond coated tools |
| US5206083A (en) * | 1989-09-18 | 1993-04-27 | Cornell Research Foundation, Inc. | Diamond and diamond-like films and coatings prepared by deposition on substrate that contain a dispersion of diamond particles |
| SE503038C2 (sv) * | 1993-07-09 | 1996-03-11 | Sandvik Ab | Diamantbelagt skärande verktyg av hårdmetall eller keramik |
| US5551959A (en) * | 1994-08-24 | 1996-09-03 | Minnesota Mining And Manufacturing Company | Abrasive article having a diamond-like coating layer and method for making same |
| US5688557A (en) * | 1995-06-07 | 1997-11-18 | Lemelson; Jerome H. | Method of depositing synthetic diamond coatings with intermediates bonding layers |
| JPH1058306A (ja) * | 1996-08-09 | 1998-03-03 | Mitsubishi Materials Corp | 研磨布のドレッシング装置および研磨布ドレッシング用砥石 |
| US6054183A (en) * | 1997-07-10 | 2000-04-25 | Zimmer; Jerry W. | Method for making CVD diamond coated substrate for polishing pad conditioning head |
| US5921856A (en) * | 1997-07-10 | 1999-07-13 | Sp3, Inc. | CVD diamond coated substrate for polishing pad conditioning head and method for making same |
| JP2001210613A (ja) * | 2000-01-27 | 2001-08-03 | Allied Material Corp | Cmp用パッドコンディショナー |
| JP3609059B2 (ja) * | 2002-04-15 | 2005-01-12 | 株式会社ノリタケスーパーアブレーシブ | Cmp加工用ドレッサ |
| JP4463084B2 (ja) * | 2003-11-27 | 2010-05-12 | 株式会社オクテック | ドレッシング工具 |
| US9624135B2 (en) * | 2004-09-23 | 2017-04-18 | Antionette Can | Polycrystalline abrasive materials and method of manufacture |
| JP2007109767A (ja) * | 2005-10-12 | 2007-04-26 | Mitsubishi Materials Corp | Cmpコンディショナおよびその製造方法 |
| JP2007260886A (ja) * | 2006-03-30 | 2007-10-11 | Mitsubishi Materials Corp | Cmpコンディショナおよびその製造方法 |
-
2006
- 2006-09-25 JP JP2006258894A patent/JP4854445B2/ja not_active Expired - Fee Related
-
2007
- 2007-09-21 WO PCT/JP2007/068356 patent/WO2008038583A1/ja not_active Ceased
- 2007-09-21 CN CNA2007800355219A patent/CN101547770A/zh active Pending
- 2007-09-21 US US12/311,226 patent/US20090239454A1/en not_active Abandoned
- 2007-09-21 TW TW096135548A patent/TW200902234A/zh not_active IP Right Cessation
- 2007-09-21 KR KR1020097005986A patent/KR20090074741A/ko not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| US20090239454A1 (en) | 2009-09-24 |
| JP2008073825A (ja) | 2008-04-03 |
| CN101547770A (zh) | 2009-09-30 |
| KR20090074741A (ko) | 2009-07-07 |
| TW200902234A (en) | 2009-01-16 |
| WO2008038583A1 (en) | 2008-04-03 |
| TWI335854B (OSRAM) | 2011-01-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20090206 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20111025 |
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| A01 | Written decision to grant a patent or to grant a registration (utility model) |
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| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20111025 |
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| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20141104 Year of fee payment: 3 |
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| R150 | Certificate of patent or registration of utility model |
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| LAPS | Cancellation because of no payment of annual fees |