JP4818695B2 - 放射線画像撮像条件の補正装置 - Google Patents
放射線画像撮像条件の補正装置 Download PDFInfo
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- JP4818695B2 JP4818695B2 JP2005334805A JP2005334805A JP4818695B2 JP 4818695 B2 JP4818695 B2 JP 4818695B2 JP 2005334805 A JP2005334805 A JP 2005334805A JP 2005334805 A JP2005334805 A JP 2005334805A JP 4818695 B2 JP4818695 B2 JP 4818695B2
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- 238000012937 correction Methods 0.000 title claims description 91
- 238000003384 imaging method Methods 0.000 title claims description 79
- 230000005855 radiation Effects 0.000 claims description 90
- 238000006073 displacement reaction Methods 0.000 claims description 46
- 230000008859 change Effects 0.000 claims description 15
- 238000010894 electron beam technology Methods 0.000 claims description 8
- 238000004846 x-ray emission Methods 0.000 description 25
- 230000007246 mechanism Effects 0.000 description 22
- 238000013170 computed tomography imaging Methods 0.000 description 20
- 238000001514 detection method Methods 0.000 description 15
- 238000000034 method Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 8
- 238000007781 pre-processing Methods 0.000 description 7
- 230000005540 biological transmission Effects 0.000 description 6
- 238000004364 calculation method Methods 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 238000007689 inspection Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000020169 heat generation Effects 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000002591 computed tomography Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000012466 permeate Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 239000013585 weight reducing agent Substances 0.000 description 1
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
Description
前記放射線放射手段の先端に配置された前記線源体の形状の変化による物理的変位量を測定する変位計と、
測定した前記物理的変位量に基づき、前記線源体と、前記撮像対象物と、前記撮像部との相対的な位置関係を補正する位置補正手段と、を備えることを特徴とする放射線画像撮像条件の補正装置である。
図1は、本発明の実施の形態1におけるX線CT撮像装置の基本構成図である。
図5は、本発明に関連する発明の実施の形態2におけるX線CT撮像装置の基本構成図である。図5において図1と同一または相当部には、同一符号を付し、詳細な説明は省略する。本実施の形態のX線CT撮像装置は、テーブル移動機構6及び検出器移動機構7は、補正値入力に基づく補正のための動作は行わず、CT撮像の為の移動動作のみを行い、画像再構成部4dが、補正値演算部4cからの補正値入力に基づく処理動作を行うようにした点が異なる。
2 テーブル
3 検出器
4 画像取込・処理装置
5 撮像制御装置
6 テーブル移動機構
7 検出器移動機構
8 画像表示装置
9a〜9c レーザ変位計
10 撮像対象物
11 X線放射部移動機構
Claims (2)
- 電子線が衝突することで放射線を発生させる線源体を備える放射線放射手段から前記放射線を放射して撮像対象物の放射線画像を撮像部で撮像する際に用いられる放射線画像撮像条件の補正装置であって、
前記放射線放射手段の先端に配置された前記線源体の形状の変化による物理的変位量を測定する変位計と、
測定した前記物理的変位量に基づき、前記線源体と、前記撮像対象物と、前記撮像部との相対的な位置関係を補正する位置補正手段と、を備えることを特徴とする放射線画像撮像条件の補正装置。 - 前記変位計は、互いに直交する3軸方向から前記物理的変位量を測定する請求項1に記載の放射線画像撮像条件の補正装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005334805A JP4818695B2 (ja) | 2005-11-18 | 2005-11-18 | 放射線画像撮像条件の補正装置 |
US11/560,017 US20070114428A1 (en) | 2005-11-18 | 2006-11-15 | Radiation Image Capturing Condition Correction Apparatus and Radiation Image Capturing Condition Correction Method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005334805A JP4818695B2 (ja) | 2005-11-18 | 2005-11-18 | 放射線画像撮像条件の補正装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007139613A JP2007139613A (ja) | 2007-06-07 |
JP4818695B2 true JP4818695B2 (ja) | 2011-11-16 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005334805A Expired - Fee Related JP4818695B2 (ja) | 2005-11-18 | 2005-11-18 | 放射線画像撮像条件の補正装置 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20070114428A1 (ja) |
JP (1) | JP4818695B2 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5423705B2 (ja) * | 2011-02-28 | 2014-02-19 | 横河電機株式会社 | 放射線検査装置 |
JP6160170B2 (ja) * | 2013-03-28 | 2017-07-12 | 豊和工業株式会社 | X線検査装置及びx線検査装置による被検査物の検査方法 |
FR3019651B1 (fr) * | 2014-04-08 | 2016-05-06 | Univ Joseph Fourier | Dispositif de mesure pour la correction de deplacements parasites dans un tomographe a rayons x |
JP2016205899A (ja) * | 2015-04-17 | 2016-12-08 | 株式会社ミツトヨ | 回転テーブルの制御方法及び装置 |
KR102592905B1 (ko) * | 2016-12-21 | 2023-10-23 | 삼성전자주식회사 | 엑스선 영상 촬영 장치 및 제어방법 |
JP6625082B2 (ja) * | 2017-03-09 | 2019-12-25 | アンリツインフィビス株式会社 | X線検査装置 |
JP7087916B2 (ja) * | 2017-11-21 | 2022-06-21 | 住友金属鉱山株式会社 | 試料測定装置および試料測定方法 |
JP7286485B2 (ja) * | 2019-09-06 | 2023-06-05 | 株式会社ミツトヨ | 計測用x線ct装置 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE8704182U1 (ja) * | 1987-03-20 | 1987-07-09 | Siemens Ag, 1000 Berlin Und 8000 Muenchen, De | |
JPH0291200A (ja) * | 1988-09-28 | 1990-03-30 | Erusoru Prod Kk | 表面に模様を表出した図形石鹸の製造方法 |
US5469429A (en) * | 1993-05-21 | 1995-11-21 | Kabushiki Kaisha Toshiba | X-ray CT apparatus having focal spot position detection means for the X-ray tube and focal spot position adjusting means |
JP4010584B2 (ja) * | 1995-11-21 | 2007-11-21 | 株式会社日立メディコ | X線ct装置 |
DE19746093C2 (de) * | 1997-10-17 | 2002-10-17 | Siemens Ag | C-Bogen-Röntgengerät |
US6200024B1 (en) * | 1998-11-27 | 2001-03-13 | Picker International, Inc. | Virtual C-arm robotic positioning system for use in radiographic imaging equipment |
JP2002028155A (ja) * | 2000-07-14 | 2002-01-29 | Shimadzu Corp | X線透視撮影台 |
JP3891285B2 (ja) * | 2002-11-01 | 2007-03-14 | 株式会社島津製作所 | X線透視装置 |
JP4434701B2 (ja) * | 2003-11-21 | 2010-03-17 | 株式会社東芝 | 寝台装置 |
JP2005176896A (ja) * | 2003-12-16 | 2005-07-07 | Canon Inc | X線画像処理装置、x線画像処理方法、プログラム及びコンピュータ可読記憶媒体 |
US7056016B2 (en) * | 2003-12-23 | 2006-06-06 | General Electric Company | X-ray source support assembly |
-
2005
- 2005-11-18 JP JP2005334805A patent/JP4818695B2/ja not_active Expired - Fee Related
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2006
- 2006-11-15 US US11/560,017 patent/US20070114428A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
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JP2007139613A (ja) | 2007-06-07 |
US20070114428A1 (en) | 2007-05-24 |
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