JP4732596B2 - 連想メモリ装置 - Google Patents

連想メモリ装置 Download PDF

Info

Publication number
JP4732596B2
JP4732596B2 JP2001011005A JP2001011005A JP4732596B2 JP 4732596 B2 JP4732596 B2 JP 4732596B2 JP 2001011005 A JP2001011005 A JP 2001011005A JP 2001011005 A JP2001011005 A JP 2001011005A JP 4732596 B2 JP4732596 B2 JP 4732596B2
Authority
JP
Japan
Prior art keywords
line
match
search
potential
bit line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2001011005A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001319481A5 (enExample
JP2001319481A (ja
Inventor
秀昭 岩崎
竜一 籏
直樹 金沢
正人 米田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kawasaki Microelectronics Inc
Original Assignee
Kawasaki Microelectronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Microelectronics Inc filed Critical Kawasaki Microelectronics Inc
Priority to JP2001011005A priority Critical patent/JP4732596B2/ja
Priority to US09/795,139 priority patent/US6400594B2/en
Publication of JP2001319481A publication Critical patent/JP2001319481A/ja
Publication of JP2001319481A5 publication Critical patent/JP2001319481A5/ja
Application granted granted Critical
Publication of JP4732596B2 publication Critical patent/JP4732596B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C15/00Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores
    • G11C15/04Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores using semiconductor elements
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C15/00Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores

Landscapes

  • Static Random-Access Memory (AREA)
  • Dram (AREA)
JP2001011005A 2000-03-03 2001-01-19 連想メモリ装置 Expired - Fee Related JP4732596B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2001011005A JP4732596B2 (ja) 2000-03-03 2001-01-19 連想メモリ装置
US09/795,139 US6400594B2 (en) 2000-03-03 2001-03-01 Content addressable memory with potentials of search bit line and/or match line set as intermediate potential between power source potential and ground potential

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2000058569 2000-03-03
JP2000-58569 2000-03-03
JP2000058569 2000-03-03
JP2001011005A JP4732596B2 (ja) 2000-03-03 2001-01-19 連想メモリ装置

Publications (3)

Publication Number Publication Date
JP2001319481A JP2001319481A (ja) 2001-11-16
JP2001319481A5 JP2001319481A5 (enExample) 2008-02-28
JP4732596B2 true JP4732596B2 (ja) 2011-07-27

Family

ID=26586715

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001011005A Expired - Fee Related JP4732596B2 (ja) 2000-03-03 2001-01-19 連想メモリ装置

Country Status (2)

Country Link
US (1) US6400594B2 (enExample)
JP (1) JP4732596B2 (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2277717C (en) * 1999-07-12 2006-12-05 Mosaid Technologies Incorporated Circuit and method for multiple match detection in content addressable memories
CA2307240C (en) 2000-05-01 2011-04-12 Mosaid Technologies Incorporated Matchline sense circuit and method
JP2001357678A (ja) * 2000-06-16 2001-12-26 Hitachi Ltd 半導体集積回路装置
CA2313275C (en) * 2000-06-30 2006-10-17 Mosaid Technologies Incorporated Searchline control circuit and power reduction method
US6822886B2 (en) * 2001-09-24 2004-11-23 Micron Technology, Inc. Reducing signal swing in a match detection circuit
KR100406924B1 (ko) * 2001-10-12 2003-11-21 삼성전자주식회사 내용 주소화 메모리 셀
US6584003B1 (en) * 2001-12-28 2003-06-24 Mosaid Technologies Incorporated Low power content addressable memory architecture
JP2003242784A (ja) * 2002-02-15 2003-08-29 Kawasaki Microelectronics Kk 連想メモリ装置
US6760241B1 (en) * 2002-10-18 2004-07-06 Netlogic Microsystems, Inc. Dynamic random access memory (DRAM) based content addressable memory (CAM) cell
US7006368B2 (en) * 2002-11-07 2006-02-28 Mosaid Technologies Incorporated Mismatch-dependent power allocation technique for match-line sensing in content-addressable memories
JP2004355760A (ja) * 2003-05-30 2004-12-16 Renesas Technology Corp データ記憶回路
US7126834B1 (en) * 2003-09-12 2006-10-24 Netlogic Microsystems, Inc. Sense amplifier architecture for content addressable memory device
JPWO2005050663A1 (ja) 2003-11-21 2007-08-23 株式会社日立製作所 半導体集積回路装置
JP4901288B2 (ja) * 2006-04-25 2012-03-21 ルネサスエレクトロニクス株式会社 内容参照メモリ
US20070247885A1 (en) 2006-04-25 2007-10-25 Renesas Technology Corp. Content addressable memory
US7586771B2 (en) * 2006-09-11 2009-09-08 Jinn-Shyan Wang Tree-style and-type match circuit device applied to content addressable memory
US8358524B1 (en) 2007-06-29 2013-01-22 Netlogic Microsystems, Inc. Methods and circuits for limiting bit line leakage current in a content addressable memory (CAM) device
JP5064171B2 (ja) * 2007-10-31 2012-10-31 ルネサスエレクトロニクス株式会社 連想記憶装置
JP5477621B2 (ja) * 2009-08-03 2014-04-23 ルネサスエレクトロニクス株式会社 連想メモリ
US8130579B2 (en) * 2009-12-21 2012-03-06 Stmicroelectronics Pvt. Ltd. Memory device and method of operation thereof
US9564183B2 (en) * 2014-11-26 2017-02-07 Invecas, Inc. Sense amplifier having a timing circuit for a presearch and a main search
US9640250B1 (en) * 2016-05-16 2017-05-02 Qualcomm Incorporated Efficient compare operation
US10910056B2 (en) * 2018-02-22 2021-02-02 Renesas Electronics Corporation Semiconductor device
CN112259147B (zh) * 2020-10-21 2021-09-10 海光信息技术股份有限公司 内容可寻址存储器、阵列及处理器系统
US12399622B2 (en) * 2023-10-11 2025-08-26 Macronix International Co., Ltd. High-level architecture for 3D-NAND based in-memory search

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR0135699B1 (ko) * 1994-07-11 1998-04-24 김주용 셀프-리프레쉬 가능한 듀얼포트 동적 캠셀 및 리프레쉬장치
JP3117375B2 (ja) * 1994-11-28 2000-12-11 インターナショナル・ビジネス・マシーンズ・コーポレ−ション 連想メモリの制御回路及び連想メモリ装置
US5659697A (en) * 1994-12-14 1997-08-19 International Business Machines Corporation Translation lookaside buffer for faster processing in response to availability of a first virtual address portion before a second virtual address portion
JPH08212791A (ja) * 1995-02-03 1996-08-20 Kawasaki Steel Corp 連想メモリ装置
JP3769784B2 (ja) * 1995-09-05 2006-04-26 株式会社ルネサステクノロジ 半導体メモリ装置とそれを用いたマイクロコンピュータ
JPH09198878A (ja) * 1996-01-16 1997-07-31 Mitsubishi Electric Corp 半導体記憶装置
US5752260A (en) * 1996-04-29 1998-05-12 International Business Machines Corporation High-speed, multiple-port, interleaved cache with arbitration of multiple access addresses
US5852569A (en) * 1997-05-20 1998-12-22 Quality Semiconductor, Inc. Content addressable memory multiple match detection circuit
JPH11283378A (ja) * 1997-11-26 1999-10-15 Texas Instr Inc <Ti> 内容アドレス・メモリ
CA2266062C (en) * 1999-03-31 2004-03-30 Peter Gillingham Dynamic content addressable memory cell
CA2277717C (en) * 1999-07-12 2006-12-05 Mosaid Technologies Incorporated Circuit and method for multiple match detection in content addressable memories

Also Published As

Publication number Publication date
JP2001319481A (ja) 2001-11-16
US6400594B2 (en) 2002-06-04
US20010026464A1 (en) 2001-10-04

Similar Documents

Publication Publication Date Title
JP4732596B2 (ja) 連想メモリ装置
US5602770A (en) Associative memory device
JP3190868B2 (ja) 連想メモリ装置
US4716320A (en) CMOS sense amplifier with isolated sensing nodes
US9478277B1 (en) Tri-level-cell DRAM and sense amplifier with alternating offset voltage
KR101052812B1 (ko) 감소된 매치라인 용량을 위한 터너리 내용 주소화 메모리셀
CA2217359C (en) Method for multilevel dram sensing
JP2698030B2 (ja) Dram構造
JPH10503317A (ja) 不揮発性連想記憶メモリ
US6426905B1 (en) High speed DRAM local bit line sense amplifier
EP3622514A1 (en) Sense amplifier signal boost
KR19990036155A (ko) 전하 전달 감지 증폭기
US6842359B2 (en) Content addressable memory device having an operation mode setting means
US20040085844A1 (en) Semiconductor memory device with high-speed sense amplifier
JP2660454B2 (ja) Cmosプリチャージおよび等化回路
JP2002358791A (ja) 連想記憶装置及びプリチャージ方法
KR19990022584A (ko) Dram의 글로벌 비트 라인을 이용한 싱글-엔드 센싱
KR100323324B1 (ko) 반도체 메모리 장치
US9589608B2 (en) Semiconductor memory device
CN101231883B (zh) 动态随机存取存储器的高效操作的方法及装置
US7298635B1 (en) Content addressable memory (CAM) cell with single ended write multiplexing
US9177637B1 (en) Wide voltage range high performance sense amplifier
US6618307B2 (en) Dynamic DRAM sense amplifier
US20050018470A1 (en) Semiconductor memory devices for outputting bit cell data without separate reference voltage generator and related methods of outputting bit cell data
JP3415420B2 (ja) 半導体集積回路装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080111

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20080111

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20101221

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110218

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20110419

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20110421

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140428

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 4732596

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313111

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees