JP4732592B2 - 最適化ctプロトコル - Google Patents

最適化ctプロトコル Download PDF

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Publication number
JP4732592B2
JP4732592B2 JP2000611815A JP2000611815A JP4732592B2 JP 4732592 B2 JP4732592 B2 JP 4732592B2 JP 2000611815 A JP2000611815 A JP 2000611815A JP 2000611815 A JP2000611815 A JP 2000611815A JP 4732592 B2 JP4732592 B2 JP 4732592B2
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JP
Japan
Prior art keywords
detector
imaging range
spatial resolution
axial
views
Prior art date
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Expired - Fee Related
Application number
JP2000611815A
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English (en)
Japanese (ja)
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JP2002541897A5 (da
JP2002541897A (ja
Inventor
エディク,ピーター・エム
イシャーク,アフマド・エヌ
ヤブズ,メフメト
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
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General Electric Co
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Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2002541897A publication Critical patent/JP2002541897A/ja
Publication of JP2002541897A5 publication Critical patent/JP2002541897A5/ja
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Publication of JP4732592B2 publication Critical patent/JP4732592B2/ja
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2985In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/027Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis characterised by the use of a particular data acquisition trajectory, e.g. helical or spiral

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Image Input (AREA)
  • Facsimile Scanning Arrangements (AREA)
JP2000611815A 1999-04-15 2000-04-14 最適化ctプロトコル Expired - Fee Related JP4732592B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12939799P 1999-04-15 1999-04-15
US60/129,397 1999-04-15
PCT/US2000/009994 WO2000062675A1 (en) 1999-04-15 2000-04-14 Optimized ct protocol

Publications (3)

Publication Number Publication Date
JP2002541897A JP2002541897A (ja) 2002-12-10
JP2002541897A5 JP2002541897A5 (da) 2007-06-14
JP4732592B2 true JP4732592B2 (ja) 2011-07-27

Family

ID=22439750

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000611815A Expired - Fee Related JP4732592B2 (ja) 1999-04-15 2000-04-14 最適化ctプロトコル

Country Status (5)

Country Link
JP (1) JP4732592B2 (da)
CN (1) CN1247155C (da)
AU (1) AU4240500A (da)
DE (1) DE10081368T1 (da)
WO (1) WO2000062675A1 (da)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4172753B2 (ja) * 2002-04-03 2008-10-29 東芝医用システムエンジニアリング株式会社 X線画像撮影装置
US7280631B2 (en) * 2003-11-26 2007-10-09 General Electric Company Stationary computed tomography system and method
WO2006090321A1 (en) * 2005-02-23 2006-08-31 Philips Intellectual Property & Standards Gmbh Determination of the coverage of a ct scan
US7512284B2 (en) * 2005-03-29 2009-03-31 General Electric Company Volumetric image enhancement system and method
CN101296658B (zh) * 2005-04-25 2011-01-12 北卡罗来纳大学查珀尔希尔分校 使用时间数字信号处理的x射线成像
EP1940291B1 (en) * 2005-10-19 2015-09-23 Koninklijke Philips N.V. X-ray examination apparatus
JP2007135658A (ja) * 2005-11-15 2007-06-07 Ge Medical Systems Global Technology Co Llc X線ct装置およびx線ct透視装置
US8045776B2 (en) * 2007-03-06 2011-10-25 General Electric Company Geometry-dependent filtering in CT method and apparatus
KR101642425B1 (ko) * 2014-10-28 2016-07-25 삼성전자주식회사 방사선 촬영 장치 및 방사선 촬영 장치의 제어 방법

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH056459B2 (da) * 1984-11-27 1993-01-26 Yokokawa Medeikaru Shisutemu Kk
JPH0573416B2 (da) * 1985-07-04 1993-10-14 Tokyo Shibaura Electric Co
JPH06233757A (ja) * 1993-02-12 1994-08-23 Hitachi Ltd 3次元撮影装置
JPH0779965A (ja) * 1993-09-17 1995-03-28 Toshiba Corp X線ct装置
JPH07204195A (ja) * 1994-01-10 1995-08-08 Picker Internatl Inc Ctスキャナ装置、その使用方法およびctスキャン方法
JPH0775603B2 (ja) * 1990-10-01 1995-08-16 ゼネラル・エレクトリック・カンパニイ 検知装置
JPH07313503A (ja) * 1994-05-26 1995-12-05 Hitachi Medical Corp X線ct装置
JPH08168484A (ja) * 1994-07-29 1996-07-02 General Electric Co <Ge> Ctイメージングシステム
JPH08299321A (ja) * 1995-04-27 1996-11-19 Shimadzu Corp X線ct装置
JPH09308627A (ja) * 1996-05-23 1997-12-02 Ge Yokogawa Medical Syst Ltd 画像撮像方法および装置
JPH09313478A (ja) * 1996-06-03 1997-12-09 Ge Yokogawa Medical Syst Ltd 画像再構成方法及び放射線ct装置
WO1998044847A1 (en) * 1997-04-09 1998-10-15 Analogic Corporation Nutating slice ct image reconstruction
JPH10314162A (ja) * 1997-05-15 1998-12-02 Ge Yokogawa Medical Syst Ltd 放射線断層撮影方法および装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6429788A (en) * 1987-07-24 1989-01-31 Toshiba Corp Radiation detector
JPS6443236A (en) * 1987-08-12 1989-02-15 Toshiba Corp Ct scanner
JPS6449994A (en) * 1987-08-20 1989-02-27 Toshiba Corp Radiation detector
US5430784A (en) * 1994-02-28 1995-07-04 General Electric Company Computerized tomography imaging using multi-slice detector with selectable slice thickness

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH056459B2 (da) * 1984-11-27 1993-01-26 Yokokawa Medeikaru Shisutemu Kk
JPH0573416B2 (da) * 1985-07-04 1993-10-14 Tokyo Shibaura Electric Co
JPH0775603B2 (ja) * 1990-10-01 1995-08-16 ゼネラル・エレクトリック・カンパニイ 検知装置
JPH06233757A (ja) * 1993-02-12 1994-08-23 Hitachi Ltd 3次元撮影装置
JPH0779965A (ja) * 1993-09-17 1995-03-28 Toshiba Corp X線ct装置
JPH07204195A (ja) * 1994-01-10 1995-08-08 Picker Internatl Inc Ctスキャナ装置、その使用方法およびctスキャン方法
JPH07313503A (ja) * 1994-05-26 1995-12-05 Hitachi Medical Corp X線ct装置
JPH08168484A (ja) * 1994-07-29 1996-07-02 General Electric Co <Ge> Ctイメージングシステム
JPH08299321A (ja) * 1995-04-27 1996-11-19 Shimadzu Corp X線ct装置
JPH09308627A (ja) * 1996-05-23 1997-12-02 Ge Yokogawa Medical Syst Ltd 画像撮像方法および装置
JPH09313478A (ja) * 1996-06-03 1997-12-09 Ge Yokogawa Medical Syst Ltd 画像再構成方法及び放射線ct装置
WO1998044847A1 (en) * 1997-04-09 1998-10-15 Analogic Corporation Nutating slice ct image reconstruction
JPH10314162A (ja) * 1997-05-15 1998-12-02 Ge Yokogawa Medical Syst Ltd 放射線断層撮影方法および装置

Also Published As

Publication number Publication date
AU4240500A (en) 2000-11-02
DE10081368T1 (de) 2001-06-28
CN1313736A (zh) 2001-09-19
JP2002541897A (ja) 2002-12-10
WO2000062675A1 (en) 2000-10-26
CN1247155C (zh) 2006-03-29

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