JP4728222B2 - 無線周波数クランピング回路 - Google Patents
無線周波数クランピング回路 Download PDFInfo
- Publication number
- JP4728222B2 JP4728222B2 JP2006508711A JP2006508711A JP4728222B2 JP 4728222 B2 JP4728222 B2 JP 4728222B2 JP 2006508711 A JP2006508711 A JP 2006508711A JP 2006508711 A JP2006508711 A JP 2006508711A JP 4728222 B2 JP4728222 B2 JP 4728222B2
- Authority
- JP
- Japan
- Prior art keywords
- diode
- node
- clamping circuit
- anode
- cathode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000003990 capacitor Substances 0.000 claims description 13
- 238000000034 method Methods 0.000 description 5
- 230000000903 blocking effect Effects 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/30—Modifications for providing a predetermined threshold before switching
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/74—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of diodes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/01—Shaping pulses
- H03K5/08—Shaping pulses by limiting; by thresholding; by slicing, i.e. combined limiting and thresholding
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/441—Protection of an amplifier being implemented by clamping means
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
- H03M1/129—Means for adapting the input signal to the range the converter can handle, e.g. limiting, pre-scaling ; Out-of-range indication
- H03M1/1295—Clamping, i.e. adjusting the DC level of the input signal to a predetermined value
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Tone Control, Compression And Expansion, Limiting Amplitude (AREA)
- Emergency Protection Circuit Devices (AREA)
- Amplifiers (AREA)
Description
本発明を特定の応用の例示的な実施形態を参照にしてここで説明するが、本発明はそれに限定されないことを理解すべきである。当業者はその技術的範囲内の付加的な変形、応用、および実施形態と、本発明が特に有用である付加的な分野について認識するであろう。
Claims (6)
- 回路またはコンポーネントを保護するためのクランピング回路(10)において、
前記保護される回路またはコンポーネントに結合されるように構成されている入力/出力ノード(12)と、
前記入力/出力ノード(12)に接続されている陽極を有する第1のダイオード(D1)と、
前記入力/出力ノード(12)に接続されている陰極を有する第2のダイオード(D2)と、
第1のノード(14)を構成している前記第1のダイオード(D1)の陰極と第2のノード(16)を構成している前記第2のダイオード(D2)の陽極との間に接続されている第3のダイオード(D3)と、
第1のノード(14)において前記第1のダイオードの陰極に第1の正の電位を供給するための第1の装置と、
第2のノード(16)において前記第2のダイオードの陽極に第2の負の電位を供給するための第2の装置と、
第1のノード(14)に接続されている前記第1のダイオードの陰極と接地電位との間にそれぞれ接続されている第1のキャパシタ(C1)および第1の抵抗(R3)と、
第2のノード(16)に接続されている前記第2のダイオードの陽極と接地電位との間にそれぞれ接続されている第2のキャパシタ(C2)および第2の抵抗(R4)とを具備していることを特徴とするクランピング回路。 - さらに、前記第3のダイオードと並列に接続されているさらに別のキャパシタを含んでいる請求項1記載のクランピング回路。
- ツェナーダイオードが第3のダイオード(D3)として使用され、そのツェナーダイオード(D3)の陽極または陰極が前記第1のノード(14)に接続される請求項1記載のクランピング回路。
- 前記第1の装置は第1の正の電源(+V)および第1の抵抗(R1)を含んでいる請求項1記載のクランピング回路。
- 前記第2の装置は第2の負の電源(−V)および第2の抵抗(R2)を含んでいる請求項6記載のクランピング回路。
- 第3のダイオード(D3)はツェナーダイオードであり、その陽極は前記第1のダイオード(D1)の陰極に接続されている請求項1記載のクランピング回路。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/385,800 | 2003-03-11 | ||
US10/385,800 US6777996B2 (en) | 2000-02-09 | 2003-03-11 | Radio frequency clamping circuit |
PCT/US2004/003913 WO2004081978A2 (en) | 2003-03-11 | 2004-02-10 | Radio frequency clamping circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006520166A JP2006520166A (ja) | 2006-08-31 |
JP4728222B2 true JP4728222B2 (ja) | 2011-07-20 |
Family
ID=32987308
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006508711A Expired - Lifetime JP4728222B2 (ja) | 2003-03-11 | 2004-02-10 | 無線周波数クランピング回路 |
Country Status (4)
Country | Link |
---|---|
US (1) | US6777996B2 (ja) |
JP (1) | JP4728222B2 (ja) |
KR (1) | KR100635404B1 (ja) |
WO (1) | WO2004081978A2 (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6777996B2 (en) * | 2000-02-09 | 2004-08-17 | Raytheon Company | Radio frequency clamping circuit |
JP3759135B2 (ja) * | 2003-09-12 | 2006-03-22 | ローム株式会社 | 半導体装置および電子装置 |
US7254003B2 (en) * | 2005-03-24 | 2007-08-07 | Freescale Semiconductor, Inc. | Differential nulling avalanche (DNA) clamp circuit and method of use |
DE102006026803A1 (de) * | 2006-06-07 | 2007-12-13 | Deutsche Thomson-Brandt Gmbh | Schutzschaltung für eine Eingangsstufe |
US7911236B2 (en) * | 2006-11-22 | 2011-03-22 | Intel Mobile Communications GmbH | Detection circuit and detection method |
US20090001270A1 (en) * | 2007-06-28 | 2009-01-01 | Aleph America | RF detector and temperature sensor |
US8237456B2 (en) * | 2009-03-02 | 2012-08-07 | Atmel Corporation | Capacitive sensing |
US8837099B2 (en) * | 2009-08-17 | 2014-09-16 | Analog Devices, Inc. | Guarded electrical overstress protection circuit |
CN111416614B (zh) * | 2020-04-10 | 2023-10-27 | 成都仕芯半导体有限公司 | 高线性度射频电路及改善射频电路线性度的方法 |
CN111799608A (zh) * | 2020-07-09 | 2020-10-20 | 东莞市贝恩电子科技有限公司 | 插座电路及具有其的插座 |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51137353A (en) * | 1975-05-22 | 1976-11-27 | Graphtec Corp | Amplitude limiting circuit |
JPS5621405A (en) * | 1979-07-31 | 1981-02-27 | Hitachi Ltd | Clamp circuit |
JPS6345081Y2 (ja) * | 1983-10-31 | 1988-11-22 | ||
JPH0461371A (ja) * | 1990-06-29 | 1992-02-27 | Oki Electric Ind Co Ltd | 半導体装置 |
JPH10214905A (ja) * | 1997-01-29 | 1998-08-11 | New Japan Radio Co Ltd | 信号入力回路 |
JP2002050698A (ja) * | 2000-08-02 | 2002-02-15 | Nec Corp | 半導体装置 |
US6456472B1 (en) * | 2000-04-07 | 2002-09-24 | Philsar Semiconductor Inc. | ESD protection in mixed signal ICs |
US6496341B1 (en) * | 2000-07-13 | 2002-12-17 | United Microelectronics Corp. | SOI electrostatic discharge protection circuit |
JP2002368563A (ja) * | 2001-06-11 | 2002-12-20 | Victor Co Of Japan Ltd | 振幅制限回路 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4571511A (en) * | 1983-06-27 | 1986-02-18 | Rca Corporation | Noise reduction system |
US4736271A (en) * | 1987-06-23 | 1988-04-05 | Signetics Corporation | Protection device utilizing one or more subsurface diodes and associated method of manufacture |
US5610790A (en) * | 1995-01-20 | 1997-03-11 | Xilinx, Inc. | Method and structure for providing ESD protection for silicon on insulator integrated circuits |
US6130811A (en) * | 1997-01-07 | 2000-10-10 | Micron Technology, Inc. | Device and method for protecting an integrated circuit during an ESD event |
US6777996B2 (en) * | 2000-02-09 | 2004-08-17 | Raytheon Company | Radio frequency clamping circuit |
JP2002135072A (ja) * | 2000-09-12 | 2002-05-10 | Fusion Lighting Inc | 電圧クランプ回路 |
-
2003
- 2003-03-11 US US10/385,800 patent/US6777996B2/en not_active Expired - Lifetime
-
2004
- 2004-02-10 KR KR1020057016816A patent/KR100635404B1/ko active IP Right Grant
- 2004-02-10 WO PCT/US2004/003913 patent/WO2004081978A2/en active Application Filing
- 2004-02-10 JP JP2006508711A patent/JP4728222B2/ja not_active Expired - Lifetime
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51137353A (en) * | 1975-05-22 | 1976-11-27 | Graphtec Corp | Amplitude limiting circuit |
JPS5621405A (en) * | 1979-07-31 | 1981-02-27 | Hitachi Ltd | Clamp circuit |
JPS6345081Y2 (ja) * | 1983-10-31 | 1988-11-22 | ||
JPH0461371A (ja) * | 1990-06-29 | 1992-02-27 | Oki Electric Ind Co Ltd | 半導体装置 |
JPH10214905A (ja) * | 1997-01-29 | 1998-08-11 | New Japan Radio Co Ltd | 信号入力回路 |
US6456472B1 (en) * | 2000-04-07 | 2002-09-24 | Philsar Semiconductor Inc. | ESD protection in mixed signal ICs |
US6496341B1 (en) * | 2000-07-13 | 2002-12-17 | United Microelectronics Corp. | SOI electrostatic discharge protection circuit |
JP2002050698A (ja) * | 2000-08-02 | 2002-02-15 | Nec Corp | 半導体装置 |
JP2002368563A (ja) * | 2001-06-11 | 2002-12-20 | Victor Co Of Japan Ltd | 振幅制限回路 |
Also Published As
Publication number | Publication date |
---|---|
WO2004081978A2 (en) | 2004-09-23 |
KR100635404B1 (ko) | 2006-10-19 |
WO2004081978A3 (en) | 2004-11-04 |
KR20050109544A (ko) | 2005-11-21 |
JP2006520166A (ja) | 2006-08-31 |
US20030189453A1 (en) | 2003-10-09 |
US6777996B2 (en) | 2004-08-17 |
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