JP4713192B2 - 薄膜トランジスタの作製方法 - Google Patents
薄膜トランジスタの作製方法 Download PDFInfo
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- JP4713192B2 JP4713192B2 JP2005083179A JP2005083179A JP4713192B2 JP 4713192 B2 JP4713192 B2 JP 4713192B2 JP 2005083179 A JP2005083179 A JP 2005083179A JP 2005083179 A JP2005083179 A JP 2005083179A JP 4713192 B2 JP4713192 B2 JP 4713192B2
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| US8900970B2 (en) | 2006-04-28 | 2014-12-02 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing a semiconductor device using a flexible substrate |
| CN100461433C (zh) | 2007-01-04 | 2009-02-11 | 北京京东方光电科技有限公司 | 一种tft阵列结构及其制造方法 |
| JP5429454B2 (ja) * | 2009-04-17 | 2014-02-26 | ソニー株式会社 | 薄膜トランジスタの製造方法および薄膜トランジスタ |
| KR102153034B1 (ko) | 2009-12-04 | 2020-09-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| CN102629609A (zh) * | 2011-07-22 | 2012-08-08 | 京东方科技集团股份有限公司 | 阵列基板及其制作方法、液晶面板、显示装置 |
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| GB9930217D0 (en) * | 1999-12-21 | 2000-02-09 | Univ Cambridge Tech | Solutiion processed transistors |
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Free format text: JAPANESE INTERMEDIATE CODE: R250 |
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| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
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| LAPS | Cancellation because of no payment of annual fees |