JP4684063B2 - タイヤｘ線撮影装置およびタイヤのｘ線撮影方法 - Google Patents

タイヤｘ線撮影装置およびタイヤのｘ線撮影方法 Download PDF

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Publication number
JP4684063B2
JP4684063B2 JP2005276004A JP2005276004A JP4684063B2 JP 4684063 B2 JP4684063 B2 JP 4684063B2 JP 2005276004 A JP2005276004 A JP 2005276004A JP 2005276004 A JP2005276004 A JP 2005276004A JP 4684063 B2 JP4684063 B2 JP 4684063B2
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Japan
Prior art keywords
tire
line
freedom
ray
ray imaging
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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JP2005276004A
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English (en)
Japanese (ja)
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JP2007085928A (ja
Inventor
重信 三枝
達也 土師
良 高巣
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Bridgestone Corp
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Bridgestone Corp
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Application filed by Bridgestone Corp filed Critical Bridgestone Corp
Priority to JP2005276004A priority Critical patent/JP4684063B2/ja
Priority to PCT/JP2006/318599 priority patent/WO2007034814A1/ja
Priority to EP06798155.5A priority patent/EP1939609B1/de
Priority to US12/067,680 priority patent/US7826590B2/en
Priority to CN200680043230XA priority patent/CN101313213B/zh
Publication of JP2007085928A publication Critical patent/JP2007085928A/ja
Application granted granted Critical
Publication of JP4684063B2 publication Critical patent/JP4684063B2/ja
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G01N23/185—Investigating the presence of flaws defects or foreign matter in tyres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/627—Specific applications or type of materials tyres

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  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Radiography Using Non-Light Waves (AREA)
  • Tires In General (AREA)
JP2005276004A 2005-09-22 2005-09-22 タイヤｘ線撮影装置およびタイヤのｘ線撮影方法 Expired - Fee Related JP4684063B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2005276004A JP4684063B2 (ja) 2005-09-22 2005-09-22 タイヤｘ線撮影装置およびタイヤのｘ線撮影方法
PCT/JP2006/318599 WO2007034814A1 (ja) 2005-09-22 2006-09-20 タイヤｘ線撮影装置およびタイヤのｘ線撮影方法
EP06798155.5A EP1939609B1 (de) 2005-09-22 2006-09-20 Röntgenphotographievorrichtung und -verfahren für Reifen mit Zeilensensoren in unterschiedlichen Ebenen
US12/067,680 US7826590B2 (en) 2005-09-22 2006-09-20 Apparatus and method for X-ray photographing a tire
CN200680043230XA CN101313213B (zh) 2005-09-22 2006-09-20 用于对轮胎进行x射线摄影的设备和方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005276004A JP4684063B2 (ja) 2005-09-22 2005-09-22 タイヤｘ線撮影装置およびタイヤのｘ線撮影方法

Publications (2)

Publication Number Publication Date
JP2007085928A JP2007085928A (ja) 2007-04-05
JP4684063B2 true JP4684063B2 (ja) 2011-05-18

Family

ID=37888857

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005276004A Expired - Fee Related JP4684063B2 (ja) 2005-09-22 2005-09-22 タイヤｘ線撮影装置およびタイヤのｘ線撮影方法

Country Status (5)

Country Link
US (1) US7826590B2 (de)
EP (1) EP1939609B1 (de)
JP (1) JP4684063B2 (de)
CN (1) CN101313213B (de)
WO (1) WO2007034814A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5088005B2 (ja) * 2007-06-14 2012-12-05 横浜ゴム株式会社 タイヤの検査方法及びその装置
EP2561332B1 (de) * 2010-04-23 2014-06-18 Siemens Aktiengesellschaft Prüfsystem zur überprüfung von turbinenschaufeln
BR112013006168A2 (pt) * 2010-09-14 2019-09-24 Michelin & Cie aparato de sonda de alta tensão e método para detecção de anomalia de superfície interna de pneu
DE102011009127A1 (de) * 2011-01-21 2012-07-26 Yxlon International Gmbh Räderprüfung mit zwei Detektoren
KR101344804B1 (ko) 2011-11-10 2013-12-26 한국타이어 주식회사 엑스레이 스캔너를 이용한 스틸 카카스 센터링 장치
JP5912992B2 (ja) * 2012-08-17 2016-04-27 株式会社ブリヂストン タイヤ検査装置及びタイヤ検査方法
FR3001802B1 (fr) * 2013-02-04 2019-05-24 Cyxplus Dispositif et procede pour le controle non destructif de pneumatiques par tomographie
CN117309915B (zh) * 2023-09-28 2024-07-16 北京霍里思特科技有限公司 一种用于对轮胎缺陷进行标记的方法和相关产品

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2231792A1 (de) * 1972-06-29 1974-01-17 Werner Dipl Phys Dr Krebs Reifenpruefgeraet
DE2262982A1 (de) * 1972-12-19 1974-06-20 Werner Dipl Phys Dr Krebs Reifenpruefgeraet
JPS62133342A (ja) * 1985-12-02 1987-06-16 ペン、ヴイデイオウ、インコーパレイテイド マルチサイズ　タイヤチヤツク
JPH05131816A (ja) * 1990-02-06 1993-05-28 Spezialmaschinenbau Steffel Gmbh & Co Kg Ｘ線によつて自動車タイヤ等を検査する装置
JP2000111501A (ja) * 1998-10-05 2000-04-21 Toshiba Fa Syst Eng Corp 透視検査装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2239003C3 (de) * 1972-08-08 1978-11-09 Collmann Gmbh & Co Spezialmaschinenbau Kg, 2400 Luebeck Vorrichtung zur allseitigen Röntgenprüfung eines drehbar abgestutzten Kraftfahrzeugreifens
DE3737159A1 (de) * 1987-11-02 1989-05-11 Steffel Gmbh Spezialmaschbau Vorrichtung zur allseitigen roentgenpruefung eines drehbar abgestuetzten kraftfahrzeugreifens waehrend einer reifenumdrehung
EP0355192B1 (de) * 1988-08-25 1992-02-05 Spezialmaschinenbau Steffel GmbH & Co. KG Rundstrahl-Röntgenröhre
DE10319099B4 (de) * 2003-04-28 2005-09-08 Steinbichler Optotechnik Gmbh Verfahren zur Interferenzmessung eines Objektes, insbesondere eines Reifens

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2231792A1 (de) * 1972-06-29 1974-01-17 Werner Dipl Phys Dr Krebs Reifenpruefgeraet
DE2262982A1 (de) * 1972-12-19 1974-06-20 Werner Dipl Phys Dr Krebs Reifenpruefgeraet
JPS62133342A (ja) * 1985-12-02 1987-06-16 ペン、ヴイデイオウ、インコーパレイテイド マルチサイズ　タイヤチヤツク
JPH05131816A (ja) * 1990-02-06 1993-05-28 Spezialmaschinenbau Steffel Gmbh & Co Kg Ｘ線によつて自動車タイヤ等を検査する装置
JP2000111501A (ja) * 1998-10-05 2000-04-21 Toshiba Fa Syst Eng Corp 透視検査装置

Also Published As

Publication number Publication date
WO2007034814A1 (ja) 2007-03-29
US7826590B2 (en) 2010-11-02
EP1939609A4 (de) 2009-11-11
JP2007085928A (ja) 2007-04-05
CN101313213A (zh) 2008-11-26
EP1939609A1 (de) 2008-07-02
US20090285359A1 (en) 2009-11-19
EP1939609B1 (de) 2015-05-27
CN101313213B (zh) 2011-03-30

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