JP4679058B2 - 半導体装置の作製方法 - Google Patents
半導体装置の作製方法 Download PDFInfo
- Publication number
- JP4679058B2 JP4679058B2 JP2004009820A JP2004009820A JP4679058B2 JP 4679058 B2 JP4679058 B2 JP 4679058B2 JP 2004009820 A JP2004009820 A JP 2004009820A JP 2004009820 A JP2004009820 A JP 2004009820A JP 4679058 B2 JP4679058 B2 JP 4679058B2
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- JP
- Japan
- Prior art keywords
- film
- substrate
- electrode
- layer
- tft
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Thin Film Transistor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004009820A JP4679058B2 (ja) | 2004-01-16 | 2004-01-16 | 半導体装置の作製方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004009820A JP4679058B2 (ja) | 2004-01-16 | 2004-01-16 | 半導体装置の作製方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005203638A JP2005203638A (ja) | 2005-07-28 |
| JP2005203638A5 JP2005203638A5 (enExample) | 2007-03-01 |
| JP4679058B2 true JP4679058B2 (ja) | 2011-04-27 |
Family
ID=34822732
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004009820A Expired - Fee Related JP4679058B2 (ja) | 2004-01-16 | 2004-01-16 | 半導体装置の作製方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4679058B2 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5186749B2 (ja) * | 2006-09-29 | 2013-04-24 | 大日本印刷株式会社 | 有機半導体素子およびその製造方法 |
| JP5186750B2 (ja) * | 2006-09-29 | 2013-04-24 | 大日本印刷株式会社 | 有機半導体素子およびその製造方法 |
| US8030655B2 (en) | 2007-12-03 | 2011-10-04 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor, display device having thin film transistor |
| US7910929B2 (en) | 2007-12-18 | 2011-03-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| JP5527966B2 (ja) | 2007-12-28 | 2014-06-25 | 株式会社半導体エネルギー研究所 | 薄膜トランジスタ |
| KR20110021654A (ko) * | 2009-08-25 | 2011-03-04 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 미결정 반도체막의 제조방법, 및 반도체장치의 제조방법 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0277116A (ja) * | 1988-03-09 | 1990-03-16 | Tonen Corp | シリコン結晶薄膜の製造方法 |
| JPH02272774A (ja) * | 1989-04-14 | 1990-11-07 | Hitachi Ltd | アクティブマトリクス回路基板 |
| JPH06168883A (ja) * | 1991-02-28 | 1994-06-14 | Tonen Corp | 多結晶シリコン薄膜の製造方法 |
| JP2003318401A (ja) * | 2002-04-22 | 2003-11-07 | Seiko Epson Corp | デバイスの製造方法、デバイス、表示装置、および電子機器 |
-
2004
- 2004-01-16 JP JP2004009820A patent/JP4679058B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2005203638A (ja) | 2005-07-28 |
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