JP4653972B2 - イオントラップ／飛行時間型質量分析装置および質量分析方法 - Google Patents

イオントラップ／飛行時間型質量分析装置および質量分析方法 Download PDF

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Publication number
JP4653972B2
JP4653972B2 JP2004173340A JP2004173340A JP4653972B2 JP 4653972 B2 JP4653972 B2 JP 4653972B2 JP 2004173340 A JP2004173340 A JP 2004173340A JP 2004173340 A JP2004173340 A JP 2004173340A JP 4653972 B2 JP4653972 B2 JP 4653972B2
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Japan
Prior art keywords
ion trap
ions
ion
time
mass spectrometer
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JP2004173340A
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English (en)
Japanese (ja)
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JP2005353428A (ja
JP2005353428A5 (enExample
Inventor
康 照井
豊治 奥本
司 師子鹿
伸治 永井
勝 冨岡
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Priority to JP2004173340A priority Critical patent/JP4653972B2/ja
Priority to US11/149,263 priority patent/US7186973B2/en
Publication of JP2005353428A publication Critical patent/JP2005353428A/ja
Publication of JP2005353428A5 publication Critical patent/JP2005353428A5/ja
Application granted granted Critical
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0009—Calibration of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2004173340A 2004-06-11 2004-06-11 イオントラップ／飛行時間型質量分析装置および質量分析方法 Expired - Fee Related JP4653972B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2004173340A JP4653972B2 (ja) 2004-06-11 2004-06-11 イオントラップ／飛行時間型質量分析装置および質量分析方法
US11/149,263 US7186973B2 (en) 2004-06-11 2005-06-10 Ion trap/time-of-flight mass analyzing apparatus and mass analyzing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004173340A JP4653972B2 (ja) 2004-06-11 2004-06-11 イオントラップ／飛行時間型質量分析装置および質量分析方法

Publications (3)

Publication Number Publication Date
JP2005353428A JP2005353428A (ja) 2005-12-22
JP2005353428A5 JP2005353428A5 (enExample) 2006-11-16
JP4653972B2 true JP4653972B2 (ja) 2011-03-16

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Family Applications (1)

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JP2004173340A Expired - Fee Related JP4653972B2 (ja) 2004-06-11 2004-06-11 イオントラップ／飛行時間型質量分析装置および質量分析方法

Country Status (2)

Country Link
US (1) US7186973B2 (enExample)
JP (1) JP4653972B2 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4653972B2 (ja) * 2004-06-11 2011-03-16 株式会社日立ハイテクノロジーズ イオントラップ／飛行時間型質量分析装置および質量分析方法
GB0513047D0 (en) 2005-06-27 2005-08-03 Thermo Finnigan Llc Electronic ion trap
US7700912B2 (en) * 2006-05-26 2010-04-20 University Of Georgia Research Foundation, Inc. Mass spectrometry calibration methods
JP4996962B2 (ja) * 2007-04-04 2012-08-08 株式会社日立ハイテクノロジーズ 質量分析装置
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
JP5164621B2 (ja) 2008-03-18 2013-03-21 株式会社日立ハイテクノロジーズ 質量分析装置、質量分析方法および質量分析用プログラム
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
JP5504969B2 (ja) * 2010-02-25 2014-05-28 株式会社島津製作所 質量分析装置
GB201104225D0 (en) * 2011-03-14 2011-04-27 Micromass Ltd Pre scan for mass to charge ratio range
EP2782116B1 (en) * 2011-11-04 2018-05-30 Shimadzu Corporation Mass spectrometer
DE102012013038B4 (de) * 2012-06-29 2014-06-26 Bruker Daltonik Gmbh Auswerfen einer lonenwolke aus 3D-HF-lonenfallen
US9214321B2 (en) * 2013-03-11 2015-12-15 1St Detect Corporation Methods and systems for applying end cap DC bias in ion traps
US10663344B2 (en) * 2017-04-26 2020-05-26 Viavi Solutions Inc. Calibration for an instrument (device, sensor)
CN110455907B (zh) * 2019-07-04 2022-04-19 昆山禾信质谱技术有限公司 基于飞行时间质量分析器的串联质谱数据分析方法
US11282685B2 (en) 2019-10-11 2022-03-22 Thermo Finnigan Llc Methods and systems for tuning a mass spectrometer
EP4281992A1 (en) * 2021-01-20 2023-11-29 DH Technologies Development Pte. Ltd. Mass spectrometer calibration

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5171991A (en) * 1991-01-25 1992-12-15 Finnigan Corporation Quadrupole ion trap mass spectrometer having two axial modulation excitation input frequencies and method of parent and neutral loss scanning
US5200613A (en) * 1991-02-28 1993-04-06 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals
US5448061A (en) * 1992-05-29 1995-09-05 Varian Associates, Inc. Method of space charge control for improved ion isolation in an ion trap mass spectrometer by dynamically adaptive sampling
US5420425A (en) * 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
US5569917A (en) * 1995-05-19 1996-10-29 Varian Associates, Inc. Apparatus for and method of forming a parallel ion beam
JP2000323090A (ja) * 1999-05-13 2000-11-24 Shimadzu Corp イオントラップ型質量分析装置
JP3855593B2 (ja) 2000-04-14 2006-12-13 株式会社日立製作所 質量分析装置
GB0021901D0 (en) * 2000-09-06 2000-10-25 Kratos Analytical Ltd Calibration method
JP3664976B2 (ja) * 2000-12-19 2005-06-29 三菱重工業株式会社 化学物質検出装置
US6498340B2 (en) * 2001-01-12 2002-12-24 Battelle Memorial Institute Method for calibrating mass spectrometers
JP2003016992A (ja) * 2001-06-29 2003-01-17 Shimadzu Corp 液体クロマトグラフ質量分析装置
JP3971958B2 (ja) * 2002-05-28 2007-09-05 株式会社日立ハイテクノロジーズ 質量分析装置
US6914242B2 (en) * 2002-12-06 2005-07-05 Agilent Technologies, Inc. Time of flight ion trap tandem mass spectrometer system
US6983213B2 (en) * 2003-10-20 2006-01-03 Cerno Bioscience Llc Methods for operating mass spectrometry (MS) instrument systems
US20050080578A1 (en) * 2003-10-10 2005-04-14 Klee Matthew S. Mass spectrometry spectral correction
JP3960306B2 (ja) * 2003-12-22 2007-08-15 株式会社島津製作所 イオントラップ装置
JP4284167B2 (ja) * 2003-12-24 2009-06-24 株式会社日立ハイテクノロジーズ イオントラップ／飛行時間型質量分析計による精密質量測定方法
JP4200092B2 (ja) * 2003-12-24 2008-12-24 株式会社日立ハイテクノロジーズ 質量分析装置及びそのキャリブレーション方法
JP4300154B2 (ja) * 2004-05-14 2009-07-22 株式会社日立ハイテクノロジーズ イオントラップ／飛行時間質量分析計およびイオンの精密質量測定方法
JP4653972B2 (ja) * 2004-06-11 2011-03-16 株式会社日立ハイテクノロジーズ イオントラップ／飛行時間型質量分析装置および質量分析方法

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Publication number Publication date
JP2005353428A (ja) 2005-12-22
US20050279926A1 (en) 2005-12-22
US7186973B2 (en) 2007-03-06

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