JP4598255B2 - クリーンカバー - Google Patents

クリーンカバー Download PDF

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Publication number
JP4598255B2
JP4598255B2 JP2000307831A JP2000307831A JP4598255B2 JP 4598255 B2 JP4598255 B2 JP 4598255B2 JP 2000307831 A JP2000307831 A JP 2000307831A JP 2000307831 A JP2000307831 A JP 2000307831A JP 4598255 B2 JP4598255 B2 JP 4598255B2
Authority
JP
Japan
Prior art keywords
eyepiece
inspection
cover
shield member
clean cover
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2000307831A
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English (en)
Japanese (ja)
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JP2002118157A5 (enExample
JP2002118157A (ja
Inventor
規夫 丸山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2000307831A priority Critical patent/JP4598255B2/ja
Publication of JP2002118157A publication Critical patent/JP2002118157A/ja
Publication of JP2002118157A5 publication Critical patent/JP2002118157A5/ja
Application granted granted Critical
Publication of JP4598255B2 publication Critical patent/JP4598255B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Microscoopes, Condenser (AREA)
  • Devices For Use In Laboratory Experiments (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2000307831A 2000-10-06 2000-10-06 クリーンカバー Expired - Fee Related JP4598255B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000307831A JP4598255B2 (ja) 2000-10-06 2000-10-06 クリーンカバー

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000307831A JP4598255B2 (ja) 2000-10-06 2000-10-06 クリーンカバー

Publications (3)

Publication Number Publication Date
JP2002118157A JP2002118157A (ja) 2002-04-19
JP2002118157A5 JP2002118157A5 (enExample) 2007-11-22
JP4598255B2 true JP4598255B2 (ja) 2010-12-15

Family

ID=18788271

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000307831A Expired - Fee Related JP4598255B2 (ja) 2000-10-06 2000-10-06 クリーンカバー

Country Status (1)

Country Link
JP (1) JP4598255B2 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4855170B2 (ja) * 2006-07-28 2012-01-18 株式会社日立ハイテクノロジーズ 電子顕微鏡装置
US12070361B2 (en) * 2020-05-08 2024-08-27 Micah Nuzum Protective shield for surgical microscope

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0662305B2 (ja) * 1983-12-29 1994-08-17 オ−ストラリア国 テクネチウム−９９ｍ−標識放射医薬の製造
JP3709254B2 (ja) * 1997-05-02 2005-10-26 オリンパス株式会社 ウェハ検査装置

Also Published As

Publication number Publication date
JP2002118157A (ja) 2002-04-19

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