JP4578826B2 - 半導体装置の作製方法 - Google Patents
半導体装置の作製方法 Download PDFInfo
- Publication number
- JP4578826B2 JP4578826B2 JP2004052284A JP2004052284A JP4578826B2 JP 4578826 B2 JP4578826 B2 JP 4578826B2 JP 2004052284 A JP2004052284 A JP 2004052284A JP 2004052284 A JP2004052284 A JP 2004052284A JP 4578826 B2 JP4578826 B2 JP 4578826B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- layer
- semi
- substrate
- semiconductor film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Thin Film Transistor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004052284A JP4578826B2 (ja) | 2004-02-26 | 2004-02-26 | 半導体装置の作製方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004052284A JP4578826B2 (ja) | 2004-02-26 | 2004-02-26 | 半導体装置の作製方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005243951A JP2005243951A (ja) | 2005-09-08 |
| JP2005243951A5 JP2005243951A5 (enExample) | 2007-03-15 |
| JP4578826B2 true JP4578826B2 (ja) | 2010-11-10 |
Family
ID=35025356
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004052284A Expired - Fee Related JP4578826B2 (ja) | 2004-02-26 | 2004-02-26 | 半導体装置の作製方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4578826B2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101534099B1 (ko) * | 2007-12-03 | 2015-07-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 미결정 반도체막, 이 미결정 반도체막을 갖는 박막 트랜지스터, 및 광전 변환 장치의 제작 방법 |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1998373A3 (en) | 2005-09-29 | 2012-10-31 | Semiconductor Energy Laboratory Co, Ltd. | Semiconductor device having oxide semiconductor layer and manufacturing method thereof |
| US7633089B2 (en) * | 2007-07-26 | 2009-12-15 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device and electronic device provided with the same |
| WO2009063606A1 (ja) * | 2007-11-15 | 2009-05-22 | Sharp Kabushiki Kaisha | 薄膜トランジスタ、薄膜トランジスタの作製方法、及び表示装置 |
| KR101545460B1 (ko) * | 2008-09-12 | 2015-08-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 생산 방법 |
| KR102413263B1 (ko) | 2008-09-19 | 2022-06-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체장치 |
| JP5361651B2 (ja) * | 2008-10-22 | 2013-12-04 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| US8841661B2 (en) * | 2009-02-25 | 2014-09-23 | Semiconductor Energy Laboratory Co., Ltd. | Staggered oxide semiconductor TFT semiconductor device and manufacturing method thereof |
| TWI529942B (zh) * | 2009-03-27 | 2016-04-11 | 半導體能源研究所股份有限公司 | 半導體裝置 |
| KR102503687B1 (ko) | 2009-07-03 | 2023-02-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
| TWI582951B (zh) * | 2009-08-07 | 2017-05-11 | 半導體能源研究所股份有限公司 | 半導體裝置及包括該半導體裝置之電話、錶、和顯示裝置 |
| WO2011027676A1 (en) * | 2009-09-04 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4907041A (en) * | 1988-09-16 | 1990-03-06 | Xerox Corporation | Intra-gate offset high voltage thin film transistor with misalignment immunity |
| JPH05226362A (ja) * | 1992-02-12 | 1993-09-03 | Seiko Epson Corp | 半導体装置の製造方法 |
| JP2835798B2 (ja) * | 1992-04-15 | 1998-12-14 | キヤノン株式会社 | 非単結晶シリコン半導体 |
| JPH06168886A (ja) * | 1992-11-30 | 1994-06-14 | Tonen Corp | プラズマcvdによる薄膜形成方法 |
| JPH07131030A (ja) * | 1993-11-05 | 1995-05-19 | Sony Corp | 表示用薄膜半導体装置及びその製造方法 |
| JP3380527B2 (ja) * | 1994-03-11 | 2003-02-24 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| JPH0817738A (ja) * | 1994-06-24 | 1996-01-19 | Mitsui Toatsu Chem Inc | 結晶性半導体薄膜形成方法 |
| JPH11214699A (ja) * | 1998-01-23 | 1999-08-06 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
| JP4357672B2 (ja) * | 1998-11-11 | 2009-11-04 | 株式会社半導体エネルギー研究所 | 露光装置および露光方法および半導体装置の作製方法 |
| JP2001127306A (ja) * | 2000-08-21 | 2001-05-11 | Semiconductor Energy Lab Co Ltd | アクティブマトリクス型表示装置 |
| JP4789322B2 (ja) * | 2000-12-28 | 2011-10-12 | 株式会社半導体エネルギー研究所 | 半導体装置及びその作製方法 |
-
2004
- 2004-02-26 JP JP2004052284A patent/JP4578826B2/ja not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101534099B1 (ko) * | 2007-12-03 | 2015-07-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 미결정 반도체막, 이 미결정 반도체막을 갖는 박막 트랜지스터, 및 광전 변환 장치의 제작 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2005243951A (ja) | 2005-09-08 |
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