JP4558250B2 - 飛行時間型質量分析計の質量相関パルス引出しを行なう方法及び装置 - Google Patents
飛行時間型質量分析計の質量相関パルス引出しを行なう方法及び装置 Download PDFInfo
- Publication number
- JP4558250B2 JP4558250B2 JP2001502956A JP2001502956A JP4558250B2 JP 4558250 B2 JP4558250 B2 JP 4558250B2 JP 2001502956 A JP2001502956 A JP 2001502956A JP 2001502956 A JP2001502956 A JP 2001502956A JP 4558250 B2 JP4558250 B2 JP 4558250B2
- Authority
- JP
- Japan
- Prior art keywords
- mass
- ions
- voltage
- ion
- mass spectrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13871199P | 1999-06-11 | 1999-06-11 | |
| PCT/US2000/015501 WO2000076638A1 (en) | 1999-06-11 | 2000-06-07 | Method and apparatus of mass-correlated pulsed extraction for a time-of-flight mass spectrometer |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004500683A JP2004500683A (ja) | 2004-01-08 |
| JP2004500683A5 JP2004500683A5 (OSRAM) | 2004-12-24 |
| JP4558250B2 true JP4558250B2 (ja) | 2010-10-06 |
Family
ID=22483274
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001502956A Expired - Lifetime JP4558250B2 (ja) | 1999-06-11 | 2000-06-07 | 飛行時間型質量分析計の質量相関パルス引出しを行なう方法及び装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US6518568B1 (OSRAM) |
| EP (1) | EP1227875A4 (OSRAM) |
| JP (1) | JP4558250B2 (OSRAM) |
| AU (1) | AU6197900A (OSRAM) |
| WO (1) | WO2000076638A1 (OSRAM) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6858839B1 (en) * | 2000-02-08 | 2005-02-22 | Agilent Technologies, Inc. | Ion optics for mass spectrometers |
| DE10158924B4 (de) * | 2001-11-30 | 2006-04-20 | Bruker Daltonik Gmbh | Pulser für Flugzeitmassenspektrometer mit orthogonalem Ioneneinschuss |
| WO2003086589A2 (en) * | 2002-04-10 | 2003-10-23 | Johns Hopkins University | Miniaturized sample scanning mass analyzer |
| US6876790B2 (en) * | 2002-05-17 | 2005-04-05 | Science & Engineering Services, Inc. | Method of coupling a laser signal to an optical carrier |
| US7372021B2 (en) | 2002-05-30 | 2008-05-13 | The Johns Hopkins University | Time-of-flight mass spectrometer combining fields non-linear in time and space |
| AU2003238769A1 (en) * | 2002-05-30 | 2003-12-19 | The Johns Hopkins University | Time of flight mass specrometer combining fields non-linear in time and space |
| WO2004008470A2 (en) * | 2002-07-17 | 2004-01-22 | The Johns Hopkins University | Time-of-flight mass spectrometers for improving resolution and mass range employing an impulse extraction ion source |
| AU2003262835A1 (en) * | 2002-08-23 | 2004-03-11 | Efeckta Technologies Corporation | Image processing of mass spectrometry data for using at multiple resolutions |
| US6784423B2 (en) * | 2002-09-20 | 2004-08-31 | Lucent Technologies Inc. | Characterization of individual particle atomic composition by aerosol mass spectrometry |
| US7157701B2 (en) * | 2004-05-20 | 2007-01-02 | Mississippi State University Research And Technology Corporation | Compact time-of-flight mass spectrometer |
| US7576323B2 (en) | 2004-09-27 | 2009-08-18 | Johns Hopkins University | Point-of-care mass spectrometer system |
| US7176454B2 (en) * | 2005-02-09 | 2007-02-13 | Applera Corporation | Ion sources for mass spectrometry |
| US7385186B2 (en) | 2005-05-13 | 2008-06-10 | Applera Corporation | Methods of operating ion optics for mass spectrometry |
| US7405396B2 (en) | 2005-05-13 | 2008-07-29 | Applera Corporation | Sample handling mechanisms and methods for mass spectrometry |
| US7351959B2 (en) | 2005-05-13 | 2008-04-01 | Applera Corporation | Mass analyzer systems and methods for their operation |
| US7375569B2 (en) * | 2005-09-21 | 2008-05-20 | Leco Corporation | Last stage synchronizer system |
| GB2476844B (en) | 2010-05-24 | 2011-12-07 | Fasmatech Science And Technology Llc | Improvements relating to the control of ions |
| CN103201821B (zh) * | 2010-09-08 | 2015-08-26 | 株式会社岛津制作所 | 飞行时间型质量分析装置 |
| US8935101B2 (en) * | 2010-12-16 | 2015-01-13 | Thermo Finnigan Llc | Method and apparatus for correlating precursor and product ions in all-ions fragmentation experiments |
| GB201021840D0 (en) * | 2010-12-23 | 2011-02-02 | Micromass Ltd | Improved space focus time of flight mass spectrometer |
| JP2012243667A (ja) * | 2011-05-23 | 2012-12-10 | Jeol Ltd | 飛行時間質量分析装置及び飛行時間質量分析方法 |
| JP5993678B2 (ja) * | 2012-09-14 | 2016-09-14 | 日本電子株式会社 | マスイメージング装置及びマスイメージング装置の制御方法 |
| CA2958745C (en) | 2014-08-29 | 2023-09-19 | Biomerieux, Inc. | Maldi-tof mass spectrometers with delay time variations and related methods |
| US9627190B2 (en) * | 2015-03-27 | 2017-04-18 | Agilent Technologies, Inc. | Energy resolved time-of-flight mass spectrometry |
| US10277268B2 (en) * | 2017-06-02 | 2019-04-30 | Psemi Corporation | Method and apparatus for switching of shunt and through switches of a transceiver |
| CN115472487A (zh) * | 2022-10-13 | 2022-12-13 | 广东省麦思科学仪器创新研究院 | 一种质量分析器及多次反射飞行时间质谱仪 |
| KR102822876B1 (ko) * | 2023-05-22 | 2025-06-18 | 강원대학교산학협력단 | 고분해능 진공 자외선 질량분석 문턱 이온화 질량 분광계 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2612607A (en) | 1947-04-05 | 1952-09-30 | William E Stephens | Mass spectrometer |
| US2685035A (en) | 1951-10-02 | 1954-07-27 | Bendix Aviat Corp | Mass spectrometer |
| US4458149A (en) | 1981-07-14 | 1984-07-03 | Patrick Luis Muga | Time-of-flight mass spectrometer |
| JPS61195554A (ja) * | 1985-02-22 | 1986-08-29 | Shimadzu Corp | 飛行時間型質量分析計 |
| US5504326A (en) * | 1994-10-24 | 1996-04-02 | Indiana University Foundation | Spatial-velocity correlation focusing in time-of-flight mass spectrometry |
| DE4442348C2 (de) * | 1994-11-29 | 1998-08-27 | Bruker Franzen Analytik Gmbh | Verfahren und Vorrichtung zur verbesserten Massenauflösung eines Flugzeit-Massenspektrometers mit Ionenreflektor |
| US5625184A (en) | 1995-05-19 | 1997-04-29 | Perseptive Biosystems, Inc. | Time-of-flight mass spectrometry analysis of biomolecules |
| US5654545A (en) * | 1995-09-19 | 1997-08-05 | Bruker-Franzen Analytik Gmbh | Mass resolution in time-of-flight mass spectrometers with reflectors |
| US5777325A (en) | 1996-05-06 | 1998-07-07 | Hewlett-Packard Company | Device for time lag focusing time-of-flight mass spectrometry |
| JPH09320515A (ja) * | 1996-05-29 | 1997-12-12 | Shimadzu Corp | Maldi−tof質量分析装置 |
| JPH09326243A (ja) * | 1996-06-05 | 1997-12-16 | Shimadzu Corp | Maldi−tof質量分析装置 |
| DE19635643C2 (de) * | 1996-09-03 | 2001-03-15 | Bruker Daltonik Gmbh | Verfahren zur Spektrenaufnahme und lineares Flugzeitmassenspektrometer dafür |
| DE19635646C1 (de) | 1996-09-03 | 1997-12-04 | Bruker Franzen Analytik Gmbh | Korrektur der Massenbestimmung mit MALDI-Flugzeitmassenspektrometern |
| DE19638577C1 (de) | 1996-09-20 | 1998-01-15 | Bruker Franzen Analytik Gmbh | Simultane Fokussierung aller Massen in Flugzeitmassenspektrometern |
| US5869830A (en) * | 1997-08-19 | 1999-02-09 | Bruker-Franzen Analytik Gmbh | Exact mass determination with maldi time-of-flight mass spectrometers |
| JP3695111B2 (ja) * | 1997-12-18 | 2005-09-14 | 株式会社島津製作所 | 飛行時間型質量分析装置 |
| US6348688B1 (en) * | 1998-02-06 | 2002-02-19 | Perseptive Biosystems | Tandem time-of-flight mass spectrometer with delayed extraction and method for use |
| US6469296B1 (en) * | 2000-01-14 | 2002-10-22 | Agilent Technologies, Inc. | Ion acceleration apparatus and method |
| US6441369B1 (en) * | 2000-11-15 | 2002-08-27 | Perseptive Biosystems, Inc. | Tandem time-of-flight mass spectrometer with improved mass resolution |
-
2000
- 2000-06-07 JP JP2001502956A patent/JP4558250B2/ja not_active Expired - Lifetime
- 2000-06-07 US US09/589,480 patent/US6518568B1/en not_active Expired - Lifetime
- 2000-06-07 EP EP00948499A patent/EP1227875A4/en not_active Withdrawn
- 2000-06-07 WO PCT/US2000/015501 patent/WO2000076638A1/en not_active Ceased
- 2000-06-07 AU AU61979/00A patent/AU6197900A/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| EP1227875A1 (en) | 2002-08-07 |
| WO2000076638A8 (en) | 2001-08-30 |
| JP2004500683A (ja) | 2004-01-08 |
| US6518568B1 (en) | 2003-02-11 |
| EP1227875A4 (en) | 2006-06-28 |
| WO2000076638A1 (en) | 2000-12-21 |
| AU6197900A (en) | 2001-01-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP4558250B2 (ja) | 飛行時間型質量分析計の質量相関パルス引出しを行なう方法及び装置 | |
| US7888635B2 (en) | Ion funnel ion trap and process | |
| US5712479A (en) | Spatial-velocity correlation focusing in time-of-flight mass spectrometry | |
| US8604423B2 (en) | Method for enhancement of mass resolution over a limited mass range for time-of-flight spectrometry | |
| JP4540230B2 (ja) | タンデム飛行時間質量分析計 | |
| US11862448B2 (en) | Instrument, including an electrostatic linear ion trap with charge detector reset or calibration, for separating ions | |
| JP6527170B2 (ja) | 軸方向パルス変換器を備えた多重反射飛行時間質量分析計 | |
| JP5337801B2 (ja) | 質量分析計、質量分析方法および媒体 | |
| US20050242279A1 (en) | Tandem time of flight mass spectrometer and method of use | |
| US20040159782A1 (en) | Coaxial multiple reflection time-of-flight mass spectrometer | |
| JP7069373B2 (ja) | 飛行時間型質量分析計および質量分析方法 | |
| GB2476964A (en) | Electrostatic trap mass spectrometer | |
| US5861623A (en) | Nth order delayed extraction | |
| GB2361580A (en) | Time of flight mass analyser with selectable drift length | |
| WO2008072377A1 (ja) | イオントラップ飛行時間型質量分析装置 | |
| JP3797200B2 (ja) | 飛行時間型質量分析装置 | |
| WO2010116396A1 (ja) | イオントラップ装置 | |
| WO2016162658A1 (en) | Time of flight mass spectrometer | |
| Nikolaev et al. | Implementation of low-energy surface-induced dissociation (eV SID) and high-energy collision-induced dissociation (keV CID) in a linear sector-TOF hybrid tandem mass spectrometer | |
| US6469296B1 (en) | Ion acceleration apparatus and method | |
| Kovtoun et al. | Mass-correlated pulsed extraction: theoretical analysis and implementation with a linear matrix-assisted laser desorption/ionization time of flight mass spectrometer | |
| US7910878B2 (en) | Method and apparatus for ion axial spatial distribution focusing | |
| WO2021234359A1 (en) | Mass spectrometer | |
| JP2002532845A (ja) | 衝突誘導解離を使用する分子構造分析用のインライン反射飛翔時間型質量分析計 | |
| Amft et al. | Application of the post‐source pulse‐focusing technique in matrix‐assisted laser desorption/ionization time‐of‐flight mass spectrometry: optimization of the experimental parameters and their influence on the capability of the method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070509 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20100114 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100126 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20100420 |
|
| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20100427 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20100524 |
|
| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20100531 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100618 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20100713 |
|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20100721 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 4558250 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130730 Year of fee payment: 3 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |