JP4558250B2 - 飛行時間型質量分析計の質量相関パルス引出しを行なう方法及び装置 - Google Patents

飛行時間型質量分析計の質量相関パルス引出しを行なう方法及び装置 Download PDF

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JP4558250B2
JP4558250B2 JP2001502956A JP2001502956A JP4558250B2 JP 4558250 B2 JP4558250 B2 JP 4558250B2 JP 2001502956 A JP2001502956 A JP 2001502956A JP 2001502956 A JP2001502956 A JP 2001502956A JP 4558250 B2 JP4558250 B2 JP 4558250B2
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mass
ions
voltage
ion
mass spectrometer
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JP2004500683A (ja
JP2004500683A5 (OSRAM
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ブイ. コブトウン,ビアチェスラブ
ジェイ. コッター,ロバート
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Johns Hopkins University
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2001502956A 1999-06-11 2000-06-07 飛行時間型質量分析計の質量相関パルス引出しを行なう方法及び装置 Expired - Lifetime JP4558250B2 (ja)

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US13871199P 1999-06-11 1999-06-11
PCT/US2000/015501 WO2000076638A1 (en) 1999-06-11 2000-06-07 Method and apparatus of mass-correlated pulsed extraction for a time-of-flight mass spectrometer

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JP2004500683A JP2004500683A (ja) 2004-01-08
JP2004500683A5 JP2004500683A5 (OSRAM) 2004-12-24
JP4558250B2 true JP4558250B2 (ja) 2010-10-06

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JP2001502956A Expired - Lifetime JP4558250B2 (ja) 1999-06-11 2000-06-07 飛行時間型質量分析計の質量相関パルス引出しを行なう方法及び装置

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US (1) US6518568B1 (OSRAM)
EP (1) EP1227875A4 (OSRAM)
JP (1) JP4558250B2 (OSRAM)
AU (1) AU6197900A (OSRAM)
WO (1) WO2000076638A1 (OSRAM)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6858839B1 (en) * 2000-02-08 2005-02-22 Agilent Technologies, Inc. Ion optics for mass spectrometers
DE10158924B4 (de) * 2001-11-30 2006-04-20 Bruker Daltonik Gmbh Pulser für Flugzeitmassenspektrometer mit orthogonalem Ioneneinschuss
WO2003086589A2 (en) * 2002-04-10 2003-10-23 Johns Hopkins University Miniaturized sample scanning mass analyzer
US6876790B2 (en) * 2002-05-17 2005-04-05 Science & Engineering Services, Inc. Method of coupling a laser signal to an optical carrier
US7372021B2 (en) 2002-05-30 2008-05-13 The Johns Hopkins University Time-of-flight mass spectrometer combining fields non-linear in time and space
AU2003238769A1 (en) * 2002-05-30 2003-12-19 The Johns Hopkins University Time of flight mass specrometer combining fields non-linear in time and space
WO2004008470A2 (en) * 2002-07-17 2004-01-22 The Johns Hopkins University Time-of-flight mass spectrometers for improving resolution and mass range employing an impulse extraction ion source
AU2003262835A1 (en) * 2002-08-23 2004-03-11 Efeckta Technologies Corporation Image processing of mass spectrometry data for using at multiple resolutions
US6784423B2 (en) * 2002-09-20 2004-08-31 Lucent Technologies Inc. Characterization of individual particle atomic composition by aerosol mass spectrometry
US7157701B2 (en) * 2004-05-20 2007-01-02 Mississippi State University Research And Technology Corporation Compact time-of-flight mass spectrometer
US7576323B2 (en) 2004-09-27 2009-08-18 Johns Hopkins University Point-of-care mass spectrometer system
US7176454B2 (en) * 2005-02-09 2007-02-13 Applera Corporation Ion sources for mass spectrometry
US7385186B2 (en) 2005-05-13 2008-06-10 Applera Corporation Methods of operating ion optics for mass spectrometry
US7405396B2 (en) 2005-05-13 2008-07-29 Applera Corporation Sample handling mechanisms and methods for mass spectrometry
US7351959B2 (en) 2005-05-13 2008-04-01 Applera Corporation Mass analyzer systems and methods for their operation
US7375569B2 (en) * 2005-09-21 2008-05-20 Leco Corporation Last stage synchronizer system
GB2476844B (en) 2010-05-24 2011-12-07 Fasmatech Science And Technology Llc Improvements relating to the control of ions
CN103201821B (zh) * 2010-09-08 2015-08-26 株式会社岛津制作所 飞行时间型质量分析装置
US8935101B2 (en) * 2010-12-16 2015-01-13 Thermo Finnigan Llc Method and apparatus for correlating precursor and product ions in all-ions fragmentation experiments
GB201021840D0 (en) * 2010-12-23 2011-02-02 Micromass Ltd Improved space focus time of flight mass spectrometer
JP2012243667A (ja) * 2011-05-23 2012-12-10 Jeol Ltd 飛行時間質量分析装置及び飛行時間質量分析方法
JP5993678B2 (ja) * 2012-09-14 2016-09-14 日本電子株式会社 マスイメージング装置及びマスイメージング装置の制御方法
CA2958745C (en) 2014-08-29 2023-09-19 Biomerieux, Inc. Maldi-tof mass spectrometers with delay time variations and related methods
US9627190B2 (en) * 2015-03-27 2017-04-18 Agilent Technologies, Inc. Energy resolved time-of-flight mass spectrometry
US10277268B2 (en) * 2017-06-02 2019-04-30 Psemi Corporation Method and apparatus for switching of shunt and through switches of a transceiver
CN115472487A (zh) * 2022-10-13 2022-12-13 广东省麦思科学仪器创新研究院 一种质量分析器及多次反射飞行时间质谱仪
KR102822876B1 (ko) * 2023-05-22 2025-06-18 강원대학교산학협력단 고분해능 진공 자외선 질량분석 문턱 이온화 질량 분광계

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2612607A (en) 1947-04-05 1952-09-30 William E Stephens Mass spectrometer
US2685035A (en) 1951-10-02 1954-07-27 Bendix Aviat Corp Mass spectrometer
US4458149A (en) 1981-07-14 1984-07-03 Patrick Luis Muga Time-of-flight mass spectrometer
JPS61195554A (ja) * 1985-02-22 1986-08-29 Shimadzu Corp 飛行時間型質量分析計
US5504326A (en) * 1994-10-24 1996-04-02 Indiana University Foundation Spatial-velocity correlation focusing in time-of-flight mass spectrometry
DE4442348C2 (de) * 1994-11-29 1998-08-27 Bruker Franzen Analytik Gmbh Verfahren und Vorrichtung zur verbesserten Massenauflösung eines Flugzeit-Massenspektrometers mit Ionenreflektor
US5625184A (en) 1995-05-19 1997-04-29 Perseptive Biosystems, Inc. Time-of-flight mass spectrometry analysis of biomolecules
US5654545A (en) * 1995-09-19 1997-08-05 Bruker-Franzen Analytik Gmbh Mass resolution in time-of-flight mass spectrometers with reflectors
US5777325A (en) 1996-05-06 1998-07-07 Hewlett-Packard Company Device for time lag focusing time-of-flight mass spectrometry
JPH09320515A (ja) * 1996-05-29 1997-12-12 Shimadzu Corp Maldi−tof質量分析装置
JPH09326243A (ja) * 1996-06-05 1997-12-16 Shimadzu Corp Maldi−tof質量分析装置
DE19635643C2 (de) * 1996-09-03 2001-03-15 Bruker Daltonik Gmbh Verfahren zur Spektrenaufnahme und lineares Flugzeitmassenspektrometer dafür
DE19635646C1 (de) 1996-09-03 1997-12-04 Bruker Franzen Analytik Gmbh Korrektur der Massenbestimmung mit MALDI-Flugzeitmassenspektrometern
DE19638577C1 (de) 1996-09-20 1998-01-15 Bruker Franzen Analytik Gmbh Simultane Fokussierung aller Massen in Flugzeitmassenspektrometern
US5869830A (en) * 1997-08-19 1999-02-09 Bruker-Franzen Analytik Gmbh Exact mass determination with maldi time-of-flight mass spectrometers
JP3695111B2 (ja) * 1997-12-18 2005-09-14 株式会社島津製作所 飛行時間型質量分析装置
US6348688B1 (en) * 1998-02-06 2002-02-19 Perseptive Biosystems Tandem time-of-flight mass spectrometer with delayed extraction and method for use
US6469296B1 (en) * 2000-01-14 2002-10-22 Agilent Technologies, Inc. Ion acceleration apparatus and method
US6441369B1 (en) * 2000-11-15 2002-08-27 Perseptive Biosystems, Inc. Tandem time-of-flight mass spectrometer with improved mass resolution

Also Published As

Publication number Publication date
EP1227875A1 (en) 2002-08-07
WO2000076638A8 (en) 2001-08-30
JP2004500683A (ja) 2004-01-08
US6518568B1 (en) 2003-02-11
EP1227875A4 (en) 2006-06-28
WO2000076638A1 (en) 2000-12-21
AU6197900A (en) 2001-01-02

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