JP4554512B2 - 検出器及び付随コリメータのアレイを具えたトモグラフィックエネルギー分散型x線回折装置 - Google Patents
検出器及び付随コリメータのアレイを具えたトモグラフィックエネルギー分散型x線回折装置 Download PDFInfo
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- JP4554512B2 JP4554512B2 JP2005500165A JP2005500165A JP4554512B2 JP 4554512 B2 JP4554512 B2 JP 4554512B2 JP 2005500165 A JP2005500165 A JP 2005500165A JP 2005500165 A JP2005500165 A JP 2005500165A JP 4554512 B2 JP4554512 B2 JP 4554512B2
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- collimator
- detector
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- collimators
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 239000011888 foil Substances 0.000 claims description 53
- 230000005855 radiation Effects 0.000 claims description 14
- 238000001514 detection method Methods 0.000 claims description 8
- 238000003384 imaging method Methods 0.000 claims description 7
- 239000004065 semiconductor Substances 0.000 claims 2
- 239000010432 diamond Substances 0.000 description 12
- 238000000034 method Methods 0.000 description 9
- 238000000926 separation method Methods 0.000 description 9
- 239000000463 material Substances 0.000 description 7
- 238000010521 absorption reaction Methods 0.000 description 5
- 239000007787 solid Substances 0.000 description 5
- 229910003460 diamond Inorganic materials 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- 229910052732 germanium Inorganic materials 0.000 description 4
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000005553 drilling Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 230000002745 absorbent Effects 0.000 description 2
- 239000002250 absorbent Substances 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 230000005469 synchrotron radiation Effects 0.000 description 2
- 241001507928 Aria Species 0.000 description 1
- 235000004494 Sorbus aria Nutrition 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000004568 cement Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000002447 crystallographic data Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000002050 diffraction method Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000001575 pathological effect Effects 0.000 description 1
- 210000004872 soft tissue Anatomy 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 210000001519 tissue Anatomy 0.000 description 1
- 238000003325 tomography Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- General Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB0312499.7A GB0312499D0 (en) | 2003-05-31 | 2003-05-31 | Tomographic energy dispersive diffraction imaging system |
| PCT/GB2003/005281 WO2004106906A1 (en) | 2003-05-31 | 2003-12-04 | Tomographic energy dispersive x-ray diffraction apparatus comprising an array of detectors and associated collimators |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006526138A JP2006526138A (ja) | 2006-11-16 |
| JP2006526138A5 JP2006526138A5 (enExample) | 2007-01-18 |
| JP4554512B2 true JP4554512B2 (ja) | 2010-09-29 |
Family
ID=9959089
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005500165A Expired - Fee Related JP4554512B2 (ja) | 2003-05-31 | 2003-12-04 | 検出器及び付随コリメータのアレイを具えたトモグラフィックエネルギー分散型x線回折装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7564947B2 (enExample) |
| EP (1) | EP1629267A1 (enExample) |
| JP (1) | JP4554512B2 (enExample) |
| AU (1) | AU2003290226A1 (enExample) |
| GB (1) | GB0312499D0 (enExample) |
| WO (1) | WO2004106906A1 (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102005016656A1 (de) * | 2005-01-26 | 2006-08-10 | Smiths Heimann Gmbh | Kollimator mit einstellbarer Brennweite |
| JP2009500662A (ja) * | 2005-06-29 | 2009-01-08 | リフレキサイト・コーポレーション | コリメーティングマイクロレンズアレイ |
| US7791033B2 (en) * | 2006-12-01 | 2010-09-07 | Mats Danielsson | System and method for imaging using radio-labeled substances, especially suitable for studying of biological processes |
| US7375338B1 (en) * | 2007-03-07 | 2008-05-20 | General Electric Company | Swappable collimators method and system |
| US7889845B2 (en) * | 2007-12-20 | 2011-02-15 | Morpho Detection, Inc. | Secondary collimator and method of assembling the same |
| US7742574B2 (en) * | 2008-04-11 | 2010-06-22 | Mats Danielsson | Approach and device for focusing x-rays |
| US7813477B2 (en) | 2009-03-05 | 2010-10-12 | Morpho Detection, Inc. | X-ray diffraction device, object imaging system, and method for operating a security system |
| WO2010141735A2 (en) | 2009-06-04 | 2010-12-09 | Nextray, Inc. | Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods |
| US8204174B2 (en) | 2009-06-04 | 2012-06-19 | Nextray, Inc. | Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals |
| EP3025148A1 (en) * | 2013-07-25 | 2016-06-01 | Analogic Corporation | Generation of diffraction signature of item within object |
| US9939393B2 (en) | 2015-09-28 | 2018-04-10 | United Technologies Corporation | Detection of crystallographic properties in aerospace components |
| FR3046240A1 (fr) * | 2015-12-24 | 2017-06-30 | Commissariat Energie Atomique | Procede d’analyse d’un objet par diffraction x |
| WO2018102792A1 (en) * | 2016-12-02 | 2018-06-07 | Ningbo Infinite Materials Technology Co., Ltd | X-ray diffraction and x-ray spectroscopy method and related apparatus |
| FI131496B1 (en) * | 2018-10-19 | 2025-05-23 | Commw Scient Ind Res Org | Energy-dispersive X-ray diffraction analyzer with an improved reflection geometry |
| CN111380880B (zh) * | 2018-12-28 | 2023-04-07 | 中国兵器工业第五九研究所 | 衍射装置及无损检测工件内部晶体取向均匀性的方法 |
| JP7165400B2 (ja) * | 2019-03-19 | 2022-11-04 | 株式会社リガク | X線分析装置 |
| DE102022210085A1 (de) * | 2022-09-23 | 2024-03-28 | Siemens Healthcare Gmbh | Verfahren zur Herstellung eines Bauteils für ein medizinisches Bildgebungsgerät |
Family Cites Families (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AT346629B (de) * | 1972-01-28 | 1978-11-27 | Efanov Valery P | Verfahren zur roentgendiffraktionstopographier- ung von einkristallen und einrichtung zur durchfuehrung desselben |
| US3988585A (en) * | 1974-06-11 | 1976-10-26 | Medical Data Systems Corporation | Three-dimensional rectilinear scanner |
| GB1578882A (en) | 1976-02-09 | 1980-11-12 | Univ Ohio State | Solid state detector |
| US4088888A (en) * | 1977-02-25 | 1978-05-09 | General Electric Company | Gantry for computed tomography |
| DE2840965C2 (de) | 1978-09-20 | 1982-11-11 | Siemens AG, 1000 Berlin und 8000 München | Strahlendiagnostikgerät für die Erzeugung von Schichtbildern eines Aufnahmeobjekts |
| US4288697A (en) * | 1979-05-03 | 1981-09-08 | Albert Richard D | Laminate radiation collimator |
| JPS56101542A (en) * | 1980-01-19 | 1981-08-14 | Taiji Yoneda | Tomography device of x-ray diffraction |
| DE3007456A1 (de) | 1980-02-28 | 1981-09-10 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Anordnung zur untersuchung eines koerpers mittels durchdringender strahlung |
| JPS57165746A (en) * | 1981-04-03 | 1982-10-12 | Taiji Yoneda | Pickup device for tomographic image by picture processing of x-ray diffraction image |
| US4951305A (en) * | 1989-05-30 | 1990-08-21 | Eastman Kodak Company | X-ray grid for medical radiography and method of making and using same |
| DE4101544A1 (de) * | 1991-01-19 | 1992-07-23 | Philips Patentverwaltung | Roentgengeraet |
| JP3233955B2 (ja) * | 1991-09-19 | 2001-12-04 | 株式会社東芝 | X線ct装置 |
| US5231655A (en) * | 1991-12-06 | 1993-07-27 | General Electric Company | X-ray collimator |
| US5263075A (en) | 1992-01-13 | 1993-11-16 | Ion Track Instruments, Inc. | High angular resolution x-ray collimator |
| US5651047A (en) * | 1993-01-25 | 1997-07-22 | Cardiac Mariners, Incorporated | Maneuverable and locateable catheters |
| US5491738A (en) * | 1993-03-15 | 1996-02-13 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | X-ray diffraction apparatus |
| DE4430615C2 (de) * | 1994-08-17 | 1998-04-02 | Deutsches Elektronen Synchr | Verfahren und Vorrichtung zur abbildenden Pulverdiffraktometrie |
| GB2297835A (en) * | 1995-02-08 | 1996-08-14 | Secr Defence | Three dimensional detection of contraband using x rays |
| US5629524A (en) * | 1995-02-21 | 1997-05-13 | Advanced Scientific Concepts, Inc. | High speed crystallography detector |
| US5589690A (en) * | 1995-03-21 | 1996-12-31 | National Institute Of Standards And Technology | Apparatus and method for monitoring casting process |
| DE19510168C2 (de) * | 1995-03-21 | 2001-09-13 | Heimann Systems Gmbh & Co | Verfahren und Vorrichtung zur Bestimmung von kristallinen und polykristallinen Materialien in einem Untersuchungsbereich |
| US5717733A (en) * | 1995-05-31 | 1998-02-10 | Quanta Vision, Inc. | X-ray and neutron diffractometric imaging of the internal structure of objects |
| FR2735874B1 (fr) * | 1995-06-20 | 1997-08-22 | Centre Nat Rech Scient | Dispositif d'analyse non invasif par radio-imagerie, notamment pour l'examen in vito de petits animaux, et procede de mise en oeuvre |
| FR2745640B1 (fr) * | 1996-02-29 | 1998-04-10 | Commissariat Energie Atomique | Dispositif d'imagerie multicoupes |
| US6005913A (en) * | 1996-04-01 | 1999-12-21 | Siemens Westinghouse Power Corporation | System and method for using X-ray diffraction to detect subsurface crystallographic structure |
| JPH10153664A (ja) * | 1996-09-30 | 1998-06-09 | Shimadzu Corp | 2次元アレイ型放射線検出器 |
| NL1009012C2 (nl) * | 1998-04-28 | 1999-10-29 | Stichting Tech Wetenschapp | Werkwijze voor het bepalen van celparameters van een kristalstructuur onder toepassing van diffractie. |
| US6621888B2 (en) * | 1998-06-18 | 2003-09-16 | American Science And Engineering, Inc. | X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects |
| US6442233B1 (en) * | 1998-06-18 | 2002-08-27 | American Science And Engineering, Inc. | Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection |
| US6163592A (en) * | 1999-01-28 | 2000-12-19 | Bruker Axs, Inc. | Beam scattering measurement system with transmitted beam energy detection |
| DE10009285A1 (de) * | 2000-02-28 | 2001-08-30 | Philips Corp Intellectual Pty | Computertomograph zur Ermittlung des Impulsübertrags-Spektrums in einem Untersuchungsbereich |
| WO2002065480A1 (en) * | 2001-02-01 | 2002-08-22 | Creatv Microtech, Inc. | tNTI-SCATTER GRIDS AND COLLIMATOR DESIGNS, AND THEIR MOTION, FABRICATION AND ASSEMBLY |
| JP4216078B2 (ja) * | 2001-04-03 | 2009-01-28 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | パルス運動量移動スペクトルを決定するコンピュータ断層撮影装置 |
| WO2003065077A2 (en) * | 2002-01-30 | 2003-08-07 | Rutgers, The State University | Combinatorial contraband detection using energy dispersive x-ray diffraction |
| US6819738B2 (en) * | 2002-08-15 | 2004-11-16 | Ge Medical Systems Global Technology Company, Llc | Hybrid scintillator/photo sensor & direct conversion detector |
| JP2005537846A (ja) * | 2002-09-04 | 2005-12-15 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | Ctスキャナ用の散乱防止x線遮蔽 |
| US7065175B2 (en) * | 2003-03-03 | 2006-06-20 | Varian Medical Systems Technologies, Inc. | X-ray diffraction-based scanning system |
| DE10317677A1 (de) * | 2003-04-17 | 2004-11-18 | Bruker Axs Gmbh | Primärstrahlfänger |
| US6956928B2 (en) * | 2003-05-05 | 2005-10-18 | Bruker Axs, Inc. | Vertical small angle x-ray scattering system |
| US7092485B2 (en) * | 2003-05-27 | 2006-08-15 | Control Screening, Llc | X-ray inspection system for detecting explosives and other contraband |
-
2003
- 2003-05-31 GB GBGB0312499.7A patent/GB0312499D0/en not_active Ceased
- 2003-12-04 US US10/558,699 patent/US7564947B2/en not_active Expired - Fee Related
- 2003-12-04 JP JP2005500165A patent/JP4554512B2/ja not_active Expired - Fee Related
- 2003-12-04 WO PCT/GB2003/005281 patent/WO2004106906A1/en not_active Ceased
- 2003-12-04 EP EP03782591A patent/EP1629267A1/en not_active Ceased
- 2003-12-04 AU AU2003290226A patent/AU2003290226A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| JP2006526138A (ja) | 2006-11-16 |
| US7564947B2 (en) | 2009-07-21 |
| US20060251215A1 (en) | 2006-11-09 |
| EP1629267A1 (en) | 2006-03-01 |
| WO2004106906A1 (en) | 2004-12-09 |
| AU2003290226A1 (en) | 2005-01-21 |
| GB0312499D0 (en) | 2003-07-09 |
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