JP2006526138A5 - - Google Patents

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Publication number
JP2006526138A5
JP2006526138A5 JP2005500165A JP2005500165A JP2006526138A5 JP 2006526138 A5 JP2006526138 A5 JP 2006526138A5 JP 2005500165 A JP2005500165 A JP 2005500165A JP 2005500165 A JP2005500165 A JP 2005500165A JP 2006526138 A5 JP2006526138 A5 JP 2006526138A5
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JP
Japan
Prior art keywords
collimator
foil
plate
array
apertures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2005500165A
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English (en)
Japanese (ja)
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JP4554512B2 (ja
JP2006526138A (ja
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Publication date
Priority claimed from GBGB0312499.7A external-priority patent/GB0312499D0/en
Application filed filed Critical
Publication of JP2006526138A publication Critical patent/JP2006526138A/ja
Publication of JP2006526138A5 publication Critical patent/JP2006526138A5/ja
Application granted granted Critical
Publication of JP4554512B2 publication Critical patent/JP4554512B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2005500165A 2003-05-31 2003-12-04 検出器及び付随コリメータのアレイを具えたトモグラフィックエネルギー分散型x線回折装置 Expired - Fee Related JP4554512B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0312499.7A GB0312499D0 (en) 2003-05-31 2003-05-31 Tomographic energy dispersive diffraction imaging system
PCT/GB2003/005281 WO2004106906A1 (en) 2003-05-31 2003-12-04 Tomographic energy dispersive x-ray diffraction apparatus comprising an array of detectors and associated collimators

Publications (3)

Publication Number Publication Date
JP2006526138A JP2006526138A (ja) 2006-11-16
JP2006526138A5 true JP2006526138A5 (enExample) 2007-01-18
JP4554512B2 JP4554512B2 (ja) 2010-09-29

Family

ID=9959089

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005500165A Expired - Fee Related JP4554512B2 (ja) 2003-05-31 2003-12-04 検出器及び付随コリメータのアレイを具えたトモグラフィックエネルギー分散型x線回折装置

Country Status (6)

Country Link
US (1) US7564947B2 (enExample)
EP (1) EP1629267A1 (enExample)
JP (1) JP4554512B2 (enExample)
AU (1) AU2003290226A1 (enExample)
GB (1) GB0312499D0 (enExample)
WO (1) WO2004106906A1 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005016656A1 (de) * 2005-01-26 2006-08-10 Smiths Heimann Gmbh Kollimator mit einstellbarer Brennweite
WO2007002797A2 (en) * 2005-06-29 2007-01-04 Reflexite Corporation Method and apparatus for aperture sculpting in a microlens array film
US7791033B2 (en) * 2006-12-01 2010-09-07 Mats Danielsson System and method for imaging using radio-labeled substances, especially suitable for studying of biological processes
US7375338B1 (en) * 2007-03-07 2008-05-20 General Electric Company Swappable collimators method and system
US7889845B2 (en) * 2007-12-20 2011-02-15 Morpho Detection, Inc. Secondary collimator and method of assembling the same
US7742574B2 (en) * 2008-04-11 2010-06-22 Mats Danielsson Approach and device for focusing x-rays
US7813477B2 (en) 2009-03-05 2010-10-12 Morpho Detection, Inc. X-ray diffraction device, object imaging system, and method for operating a security system
US8204174B2 (en) 2009-06-04 2012-06-19 Nextray, Inc. Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals
US8315358B2 (en) 2009-06-04 2012-11-20 Nextray, Inc. Strain matching of crystals and horizontally-spaced monochromator and analyzer crystal arrays in diffraction enhanced imaging systems and related methods
CN105612416B (zh) * 2013-07-25 2019-01-01 模拟技术公司 对象内物品的衍射特征的生成
US9939393B2 (en) 2015-09-28 2018-04-10 United Technologies Corporation Detection of crystallographic properties in aerospace components
FR3046240A1 (fr) * 2015-12-24 2017-06-30 Commissariat Energie Atomique Procede d’analyse d’un objet par diffraction x
WO2018102792A1 (en) * 2016-12-02 2018-06-07 Ningbo Infinite Materials Technology Co., Ltd X-ray diffraction and x-ray spectroscopy method and related apparatus
AU2019361733B2 (en) * 2018-10-19 2024-12-05 Commonwealth Scientific And Industrial Research Organisation An energy dispersive X-ray diffraction analyser having an improved reflection geometry
CN111380880B (zh) * 2018-12-28 2023-04-07 中国兵器工业第五九研究所 衍射装置及无损检测工件内部晶体取向均匀性的方法
JP7165400B2 (ja) * 2019-03-19 2022-11-04 株式会社リガク X線分析装置
DE102022210085A1 (de) * 2022-09-23 2024-03-28 Siemens Healthcare Gmbh Verfahren zur Herstellung eines Bauteils für ein medizinisches Bildgebungsgerät

Family Cites Families (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT346629B (de) * 1972-01-28 1978-11-27 Efanov Valery P Verfahren zur roentgendiffraktionstopographier- ung von einkristallen und einrichtung zur durchfuehrung desselben
US3988585A (en) 1974-06-11 1976-10-26 Medical Data Systems Corporation Three-dimensional rectilinear scanner
GB1578882A (en) 1976-02-09 1980-11-12 Univ Ohio State Solid state detector
US4088888A (en) * 1977-02-25 1978-05-09 General Electric Company Gantry for computed tomography
DE2840965C2 (de) 1978-09-20 1982-11-11 Siemens AG, 1000 Berlin und 8000 München Strahlendiagnostikgerät für die Erzeugung von Schichtbildern eines Aufnahmeobjekts
US4288697A (en) 1979-05-03 1981-09-08 Albert Richard D Laminate radiation collimator
JPS56101542A (en) * 1980-01-19 1981-08-14 Taiji Yoneda Tomography device of x-ray diffraction
DE3007456A1 (de) 1980-02-28 1981-09-10 Philips Patentverwaltung Gmbh, 2000 Hamburg Anordnung zur untersuchung eines koerpers mittels durchdringender strahlung
JPS57165746A (en) * 1981-04-03 1982-10-12 Taiji Yoneda Pickup device for tomographic image by picture processing of x-ray diffraction image
US4951305A (en) 1989-05-30 1990-08-21 Eastman Kodak Company X-ray grid for medical radiography and method of making and using same
DE4101544A1 (de) * 1991-01-19 1992-07-23 Philips Patentverwaltung Roentgengeraet
JP3233955B2 (ja) * 1991-09-19 2001-12-04 株式会社東芝 X線ct装置
US5231655A (en) 1991-12-06 1993-07-27 General Electric Company X-ray collimator
US5263075A (en) 1992-01-13 1993-11-16 Ion Track Instruments, Inc. High angular resolution x-ray collimator
US5651047A (en) * 1993-01-25 1997-07-22 Cardiac Mariners, Incorporated Maneuverable and locateable catheters
US5491738A (en) * 1993-03-15 1996-02-13 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration X-ray diffraction apparatus
DE4430615C2 (de) * 1994-08-17 1998-04-02 Deutsches Elektronen Synchr Verfahren und Vorrichtung zur abbildenden Pulverdiffraktometrie
GB2297835A (en) * 1995-02-08 1996-08-14 Secr Defence Three dimensional detection of contraband using x rays
US5629524A (en) * 1995-02-21 1997-05-13 Advanced Scientific Concepts, Inc. High speed crystallography detector
US5589690A (en) * 1995-03-21 1996-12-31 National Institute Of Standards And Technology Apparatus and method for monitoring casting process
DE19510168C2 (de) * 1995-03-21 2001-09-13 Heimann Systems Gmbh & Co Verfahren und Vorrichtung zur Bestimmung von kristallinen und polykristallinen Materialien in einem Untersuchungsbereich
US5717733A (en) * 1995-05-31 1998-02-10 Quanta Vision, Inc. X-ray and neutron diffractometric imaging of the internal structure of objects
FR2735874B1 (fr) 1995-06-20 1997-08-22 Centre Nat Rech Scient Dispositif d'analyse non invasif par radio-imagerie, notamment pour l'examen in vito de petits animaux, et procede de mise en oeuvre
FR2745640B1 (fr) * 1996-02-29 1998-04-10 Commissariat Energie Atomique Dispositif d'imagerie multicoupes
US6005913A (en) * 1996-04-01 1999-12-21 Siemens Westinghouse Power Corporation System and method for using X-ray diffraction to detect subsurface crystallographic structure
JPH10153664A (ja) * 1996-09-30 1998-06-09 Shimadzu Corp 2次元アレイ型放射線検出器
NL1009012C2 (nl) * 1998-04-28 1999-10-29 Stichting Tech Wetenschapp Werkwijze voor het bepalen van celparameters van een kristalstructuur onder toepassing van diffractie.
US6442233B1 (en) * 1998-06-18 2002-08-27 American Science And Engineering, Inc. Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection
US6621888B2 (en) * 1998-06-18 2003-09-16 American Science And Engineering, Inc. X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects
US6163592A (en) * 1999-01-28 2000-12-19 Bruker Axs, Inc. Beam scattering measurement system with transmitted beam energy detection
DE10009285A1 (de) * 2000-02-28 2001-08-30 Philips Corp Intellectual Pty Computertomograph zur Ermittlung des Impulsübertrags-Spektrums in einem Untersuchungsbereich
WO2002065480A1 (en) * 2001-02-01 2002-08-22 Creatv Microtech, Inc. tNTI-SCATTER GRIDS AND COLLIMATOR DESIGNS, AND THEIR MOTION, FABRICATION AND ASSEMBLY
DE60222768T2 (de) * 2001-04-03 2008-07-17 Koninklijke Philips Electronics N.V. Computertomograph
US20060104414A1 (en) * 2002-01-30 2006-05-18 Mayo William E Combinatorial contraband detection using energy dispersive x-ray diffraction
US6819738B2 (en) * 2002-08-15 2004-11-16 Ge Medical Systems Global Technology Company, Llc Hybrid scintillator/photo sensor & direct conversion detector
EP1537407A1 (en) * 2002-09-04 2005-06-08 Koninklijke Philips Electronics N.V. Anti-scattering x-ray shielding for ct scanners
US7065175B2 (en) * 2003-03-03 2006-06-20 Varian Medical Systems Technologies, Inc. X-ray diffraction-based scanning system
DE10317677A1 (de) * 2003-04-17 2004-11-18 Bruker Axs Gmbh Primärstrahlfänger
US6956928B2 (en) * 2003-05-05 2005-10-18 Bruker Axs, Inc. Vertical small angle x-ray scattering system
US7092485B2 (en) * 2003-05-27 2006-08-15 Control Screening, Llc X-ray inspection system for detecting explosives and other contraband

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