JP4487225B2 - Ni−Nb系ターゲット材およびロウ材用下地膜 - Google Patents
Ni−Nb系ターゲット材およびロウ材用下地膜 Download PDFInfo
- Publication number
- JP4487225B2 JP4487225B2 JP2000081091A JP2000081091A JP4487225B2 JP 4487225 B2 JP4487225 B2 JP 4487225B2 JP 2000081091 A JP2000081091 A JP 2000081091A JP 2000081091 A JP2000081091 A JP 2000081091A JP 4487225 B2 JP4487225 B2 JP 4487225B2
- Authority
- JP
- Japan
- Prior art keywords
- target material
- film
- corrosion resistance
- amount
- based target
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Landscapes
- Physical Vapour Deposition (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000081091A JP4487225B2 (ja) | 2000-03-23 | 2000-03-23 | Ni−Nb系ターゲット材およびロウ材用下地膜 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000081091A JP4487225B2 (ja) | 2000-03-23 | 2000-03-23 | Ni−Nb系ターゲット材およびロウ材用下地膜 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2001262328A JP2001262328A (ja) | 2001-09-26 |
JP2001262328A5 JP2001262328A5 (enrdf_load_stackoverflow) | 2007-03-29 |
JP4487225B2 true JP4487225B2 (ja) | 2010-06-23 |
Family
ID=18598072
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2000081091A Expired - Lifetime JP4487225B2 (ja) | 2000-03-23 | 2000-03-23 | Ni−Nb系ターゲット材およびロウ材用下地膜 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4487225B2 (enrdf_load_stackoverflow) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4466902B2 (ja) * | 2003-01-10 | 2010-05-26 | 日鉱金属株式会社 | ニッケル合金スパッタリングターゲット |
JP2005093571A (ja) * | 2003-09-16 | 2005-04-07 | Hitachi Metals Ltd | 薄膜配線層 |
EP1672086B1 (en) * | 2003-10-07 | 2019-03-13 | JX Nippon Mining & Metals Corporation | HIGH-PURITY Ni-V ALLOY, TARGET THEREFROM, HIGH-PURITY Ni-V ALLOY THIN FILM AND PROCESS FOR PRODUCING HIGH-PURITY Ni-V ALLOY |
JP4730662B2 (ja) * | 2005-03-02 | 2011-07-20 | 日立金属株式会社 | 薄膜配線層 |
JP4655281B2 (ja) * | 2005-03-29 | 2011-03-23 | 日立金属株式会社 | 薄膜配線層 |
JP5203908B2 (ja) * | 2008-12-04 | 2013-06-05 | 新日鉄住金マテリアルズ株式会社 | Ni−Mo系合金スパッタリングターゲット板 |
JP2010133001A (ja) * | 2008-12-08 | 2010-06-17 | Hitachi Metals Ltd | Ni合金ターゲット材の製造方法 |
JP5113100B2 (ja) * | 2009-01-28 | 2013-01-09 | Jx日鉱日石金属株式会社 | 高純度ニッケル合金ターゲット |
-
2000
- 2000-03-23 JP JP2000081091A patent/JP4487225B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2001262328A (ja) | 2001-09-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3465108B2 (ja) | 電気・電子部品用銅合金 | |
US6884363B2 (en) | Method of surface treatment for stainless steel product for fuel cell | |
JP5468423B2 (ja) | 高強度高耐熱性銅合金材 | |
US12035469B2 (en) | Pure copper plate, copper/ceramic bonded body, and insulated circuit board | |
JP2015061943A (ja) | 高純度銅マンガン合金スパッタリングターゲット | |
JP4168077B2 (ja) | 酸化膜密着性に優れた電気電子部品用銅合金板 | |
JP4487225B2 (ja) | Ni−Nb系ターゲット材およびロウ材用下地膜 | |
JP4022891B2 (ja) | 配線膜用Al合金膜および配線膜形成用スパッタリングターゲット材 | |
JP5214282B2 (ja) | ダイシング加工性に優れるqfnパッケージ用銅合金板 | |
US5210441A (en) | Lead frame formed of a copper-zirconium alloy | |
JP3819487B2 (ja) | 半導体素子の製造方法 | |
JP5291494B2 (ja) | 高強度高耐熱性銅合金板 | |
JP2015203148A (ja) | 銅合金材、セラミック配線基板及びセラミック配線基板の製造方法 | |
CN111850420A (zh) | 一种具有室温零热膨胀效应的合金材料 | |
TW202113093A (zh) | 均溫板用鈦銅合金板及均溫板 | |
JP3296709B2 (ja) | 電子機器用薄板銅合金およびその製造方法 | |
JP2004193552A (ja) | 半導体装置配線シード層形成用銅合金スパッタリングターゲット | |
JP4459067B2 (ja) | 高強度高導電性銅合金 | |
JP4485570B2 (ja) | フレキシブル銅基板用バリア膜及びバリア膜形成用スパッタリングターゲット | |
JP5755892B2 (ja) | 銅合金板の製造方法 | |
JP4836359B2 (ja) | スパッタターゲット、ゲート絶縁膜および電子部品 | |
JP2005330591A (ja) | スパッタリングターゲット | |
JP4224880B2 (ja) | Co−Ni合金スパッタリングターゲット及びその製造方法 | |
JP4158337B2 (ja) | 連続鋳造鋳型用クロム・ジルコニウム系銅合金の製造方法 | |
JP5476111B2 (ja) | 電子機器用通電部材用Cr−Cu合金とCr−Cu合金の製造方法、ならびにそのCr−Cu合金を用いたリードフレーム又はバスバーとその製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070214 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070214 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20090820 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090828 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20091015 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20100305 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20100318 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130409 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4487225 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130409 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140409 Year of fee payment: 4 |
|
EXPY | Cancellation because of completion of term |