JP4473297B2 - レーザ直描装置 - Google Patents
レーザ直描装置 Download PDFInfo
- Publication number
- JP4473297B2 JP4473297B2 JP2007244142A JP2007244142A JP4473297B2 JP 4473297 B2 JP4473297 B2 JP 4473297B2 JP 2007244142 A JP2007244142 A JP 2007244142A JP 2007244142 A JP2007244142 A JP 2007244142A JP 4473297 B2 JP4473297 B2 JP 4473297B2
- Authority
- JP
- Japan
- Prior art keywords
- cylindrical lens
- laser beam
- scanning direction
- lens
- axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2004—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by the use of a particular light source, e.g. fluorescent lamps or deep UV light
- G03F7/2006—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by the use of a particular light source, e.g. fluorescent lamps or deep UV light using coherent light; using polarised light
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70383—Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
Description
をシリンドリカルレンズにより副走査方向に集光させながら主走査方向へ偏向させると共
に、被描画体を副走査方向へ移動させて被描画体へ所望のパターンを描画するレーザ直描
装置において、環状の一部を切り欠いた中空馬蹄形のボス部を設けた中空ヒンジピンと、シリンドリカルレンズを支持するレンズホルダと、前記レンズホルダに設けられ、前記シリンドリカルレンズの軸線が前記ボス部の中心を通るようにして前記ボス部の外周に嵌合される円形部と、を備え、前記シリンドリカルレンズの軸線を前記被描画体上のレジスト感度が異なるドライフィルムレジストの表面と平行な方向に回転できるようにしておき、前記シリンドリカルレンズの軸線の前記主走査方向に対する角度を変更できるように構成し、前記回転の中心を前記レーザビームの走査開始点に一致させることを特徴とする。
ポリゴンミラーの回転数をN[rpm]、面数をmとすると、ポリゴンミラーの1面の走査時間tmと偏向角度θの走査時間tsは式1、2で表される。
tm=60/N/m[rpm] ・・・(式1)
ts=tm×θ/(360/m) ・・・(式2)
ポリゴンミラーの偏向角度がθの場合、fθレンズ7に入射するレーザの入射角度は2θである。そこで、fをfθレンズ7の焦点距離、Vをテーブルの送り速度(露光速度)とすると、走査角度αは、式3で表すことができる。
α=tan−1(ts×V/(2×f×θ)) ・・・(式3)
図5はシリンドリカルレンズの軸線と直角な方向の断面図であり、Pはシリンドリカルレンズ9の軸線である。
9 シリンドリカルレンズ
10 被描画体
P シリンドリカルレンズ9の中心軸
Claims (1)
- ラスタデータに基づいて変調されたレーザビームをシリンドリカルレンズにより副走査
方向に集光させながら主走査方向へ偏向させると共に、被描画体を副走査方向へ移動させ
て被描画体へ所望のパターンを描画するレーザ直描装置において、
環状の一部を切り欠いた中空馬蹄形のボス部を設けた中空ヒンジピンと、
シリンドリカルレンズを支持するレンズホルダと、
前記レンズホルダに設けられ、前記シリンドリカルレンズの軸線が前記ボス部の中心を
通るようにして前記ボス部の外周に嵌合される円形部と、
を備え、
前記シリンドリカルレンズの軸線を前記被描画体上のレジスト感度が異なるドライフィ
ルムレジストの表面と平行な方向に回転できるようにしておき、
前記シリンドリカルレンズの軸線の前記主走査方向に対する角度を変更できるように構
成し、
前記回転の中心を前記レーザビームの走査開始点に一致させることを特徴とするレーザ
直描装置。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007244142A JP4473297B2 (ja) | 2007-09-20 | 2007-09-20 | レーザ直描装置 |
TW097128587A TWI428629B (zh) | 2007-09-20 | 2008-07-29 | Laser direct imaging device |
DE102008038837A DE102008038837A1 (de) | 2007-09-20 | 2008-08-13 | Laserdirektabbildungsvorrichtung |
KR1020080079358A KR101406049B1 (ko) | 2007-09-20 | 2008-08-13 | 레이저 직묘 장치 |
US12/191,684 US7969636B2 (en) | 2007-09-20 | 2008-08-14 | Laser direct imaging apparatus |
CN2008102104461A CN101393399B (zh) | 2007-09-20 | 2008-08-15 | 激光直描装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007244142A JP4473297B2 (ja) | 2007-09-20 | 2007-09-20 | レーザ直描装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009075359A JP2009075359A (ja) | 2009-04-09 |
JP4473297B2 true JP4473297B2 (ja) | 2010-06-02 |
Family
ID=40471285
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007244142A Expired - Fee Related JP4473297B2 (ja) | 2007-09-20 | 2007-09-20 | レーザ直描装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7969636B2 (ja) |
JP (1) | JP4473297B2 (ja) |
KR (1) | KR101406049B1 (ja) |
CN (1) | CN101393399B (ja) |
DE (1) | DE102008038837A1 (ja) |
TW (1) | TWI428629B (ja) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI531872B (zh) | 2008-09-22 | 2016-05-01 | Asml荷蘭公司 | 微影裝置、可程式化圖案化器件及微影方法 |
JP4700742B2 (ja) | 2009-03-26 | 2011-06-15 | 本田技研工業株式会社 | 能動型防振支持装置 |
TWI448830B (zh) | 2010-02-09 | 2014-08-11 | Asml Netherlands Bv | 微影裝置及元件製造方法 |
WO2011104180A1 (en) | 2010-02-23 | 2011-09-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
EP2539771B1 (en) | 2010-02-25 | 2017-02-01 | ASML Netherlands BV | Lithographic apparatus and device manufacturing method |
NL2006385A (en) | 2010-04-12 | 2011-10-13 | Asml Netherlands Bv | Substrate handling apparatus and lithographic apparatus. |
CN103238113B (zh) | 2010-12-08 | 2015-09-09 | Asml荷兰有限公司 | 光刻设备和器件制造方法 |
EP2691811B1 (en) | 2011-03-29 | 2018-01-31 | ASML Netherlands B.V. | Measurement of the position of a radiation beam spot in lithography |
NL2008426A (en) | 2011-04-08 | 2012-10-09 | Asml Netherlands Bv | Lithographic apparatus, programmable patterning device and lithographic method. |
NL2008500A (en) | 2011-04-21 | 2012-10-23 | Asml Netherlands Bv | Lithographic apparatus, method for maintaining a lithographic apparatus and device manufacturing method. |
KR101633744B1 (ko) | 2011-08-18 | 2016-06-27 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피 장치 및 디바이스 제조 방법 |
NL2009342A (en) | 2011-10-31 | 2013-05-07 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method. |
CN103946750B (zh) | 2011-11-29 | 2019-03-29 | Asml荷兰有限公司 | 光刻设备、器件制造方法和计算机程序 |
JP5886979B2 (ja) | 2011-11-29 | 2016-03-16 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置用の所望のデバイスパターンのベクタ形式表現を変換する装置および方法、プログラマブルパターニングデバイスにデータを供給する装置および方法、リソグラフィ装置、デバイス製造方法 |
NL2009806A (en) | 2011-12-05 | 2013-06-10 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method. |
JP5881851B2 (ja) | 2011-12-06 | 2016-03-09 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置、セットポイントデータを提供する装置、デバイス製造方法、セットポイントデータの計算方法、およびコンピュータプログラム |
NL2009902A (en) | 2011-12-27 | 2013-07-01 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method. |
US9354502B2 (en) | 2012-01-12 | 2016-05-31 | Asml Netherlands B.V. | Lithography apparatus, an apparatus for providing setpoint data, a device manufacturing method, a method for providing setpoint data and a computer program |
JP5905126B2 (ja) | 2012-01-17 | 2016-04-20 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置及びデバイス製造方法 |
WO2013124114A1 (en) | 2012-02-23 | 2013-08-29 | Asml Netherlands B.V. | Device, lithographic apparatus, method for guiding radiation and device manufacturing method |
NL2012052A (en) | 2013-01-29 | 2014-08-04 | Asml Netherlands Bv | A radiation modulator for a lithography apparatus, a lithography apparatus, a method of modulating radiation for use in lithography, and a device manufacturing method. |
JP6651768B2 (ja) * | 2015-09-28 | 2020-02-19 | 株式会社ニコン | パターン描画装置 |
TWI620038B (zh) | 2017-01-11 | 2018-04-01 | 財團法人工業技術研究院 | 曝光方法和系統以及雷射直接成像系統 |
US11709232B2 (en) | 2018-06-20 | 2023-07-25 | Xiaobo Wang | Laser scanning device and laser radar |
CN112286009B (zh) * | 2020-09-28 | 2021-06-01 | 江苏迪盛智能科技有限公司 | 一种激光直写成像修正方法、装置、设备及存储介质 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4131113A (en) * | 1976-08-19 | 1978-12-26 | California Institute Of Technology | ERG analysis system |
US4407571A (en) * | 1980-08-11 | 1983-10-04 | Bausch & Lomb Incorporated | Compact refraction instrument |
BR9101160A (pt) * | 1991-03-25 | 1992-11-17 | Elevadores Otis Ltda | Sistema de seguranca para travamento de uma porta batente de elevador |
US6034806A (en) | 1997-03-10 | 2000-03-07 | Minolta Co., Ltd. | Light source device and light beam scanning optical apparatus |
JP2001255476A (ja) | 2000-03-13 | 2001-09-21 | Dainippon Screen Mfg Co Ltd | レーザ描画装置 |
US20050270612A1 (en) | 2004-06-04 | 2005-12-08 | Konica Minolta Business Technologies, Inc. | Optical scanning apparatus |
JP2007094122A (ja) | 2005-09-29 | 2007-04-12 | Hitachi Via Mechanics Ltd | レーザ直接描画装置 |
-
2007
- 2007-09-20 JP JP2007244142A patent/JP4473297B2/ja not_active Expired - Fee Related
-
2008
- 2008-07-29 TW TW097128587A patent/TWI428629B/zh not_active IP Right Cessation
- 2008-08-13 KR KR1020080079358A patent/KR101406049B1/ko not_active IP Right Cessation
- 2008-08-13 DE DE102008038837A patent/DE102008038837A1/de not_active Withdrawn
- 2008-08-14 US US12/191,684 patent/US7969636B2/en active Active
- 2008-08-15 CN CN2008102104461A patent/CN101393399B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN101393399B (zh) | 2012-01-25 |
TWI428629B (zh) | 2014-03-01 |
CN101393399A (zh) | 2009-03-25 |
US7969636B2 (en) | 2011-06-28 |
DE102008038837A1 (de) | 2009-04-30 |
JP2009075359A (ja) | 2009-04-09 |
KR101406049B1 (ko) | 2014-06-11 |
TW200914871A (en) | 2009-04-01 |
US20090080047A1 (en) | 2009-03-26 |
KR20090031215A (ko) | 2009-03-25 |
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