JP4438038B2 - 面型受光素子、およびその製造方法 - Google Patents
面型受光素子、およびその製造方法 Download PDFInfo
- Publication number
- JP4438038B2 JP4438038B2 JP2000218131A JP2000218131A JP4438038B2 JP 4438038 B2 JP4438038 B2 JP 4438038B2 JP 2000218131 A JP2000218131 A JP 2000218131A JP 2000218131 A JP2000218131 A JP 2000218131A JP 4438038 B2 JP4438038 B2 JP 4438038B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- light
- electrode
- receiving element
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)
- Mechanical Coupling Of Light Guides (AREA)
- Optical Couplings Of Light Guides (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Light Receiving Elements (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000218131A JP4438038B2 (ja) | 2000-07-19 | 2000-07-19 | 面型受光素子、およびその製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000218131A JP4438038B2 (ja) | 2000-07-19 | 2000-07-19 | 面型受光素子、およびその製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002033505A JP2002033505A (ja) | 2002-01-31 |
| JP2002033505A5 JP2002033505A5 (enExample) | 2007-09-06 |
| JP4438038B2 true JP4438038B2 (ja) | 2010-03-24 |
Family
ID=18713129
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000218131A Expired - Fee Related JP4438038B2 (ja) | 2000-07-19 | 2000-07-19 | 面型受光素子、およびその製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4438038B2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220244111A1 (en) * | 2021-02-01 | 2022-08-04 | Fuji Electric Co., Ltd. | Semiconductor device and temperature measurement method |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2004090976A2 (en) * | 2003-04-02 | 2004-10-21 | Sun Microsystems, Inc. | Optical communication between face-to-face semiconductor chips |
| US7723206B2 (en) * | 2007-12-05 | 2010-05-25 | Fujifilm Corporation | Photodiode |
| JP5486542B2 (ja) | 2011-03-31 | 2014-05-07 | 浜松ホトニクス株式会社 | フォトダイオードアレイモジュール及びその製造方法 |
| JP6944315B2 (ja) * | 2017-09-05 | 2021-10-06 | 浜松ホトニクス株式会社 | 光検出素子 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS639163A (ja) * | 1986-06-30 | 1988-01-14 | Nec Corp | 半導体受光素子 |
| JP2642645B2 (ja) * | 1987-11-19 | 1997-08-20 | 株式会社日立製作所 | 半導体基板の製造方法及び半導体装置の製造方法 |
| JP2651323B2 (ja) * | 1992-07-22 | 1997-09-10 | 浜松ホトニクス株式会社 | 半導体エネルギー検出器 |
| JPH06151946A (ja) * | 1992-11-12 | 1994-05-31 | Nippon Telegr & Teleph Corp <Ntt> | 半導体受光素子およびその製造方法 |
| JPH07153986A (ja) * | 1993-12-01 | 1995-06-16 | Fujitsu Ltd | 赤外線検知装置 |
| JP3236774B2 (ja) * | 1996-02-16 | 2001-12-10 | 日本電信電話株式会社 | 半導体集積回路 |
| JP3610235B2 (ja) * | 1998-07-22 | 2005-01-12 | キヤノン株式会社 | 面型発光素子装置 |
-
2000
- 2000-07-19 JP JP2000218131A patent/JP4438038B2/ja not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20220244111A1 (en) * | 2021-02-01 | 2022-08-04 | Fuji Electric Co., Ltd. | Semiconductor device and temperature measurement method |
| US12163845B2 (en) * | 2021-02-01 | 2024-12-10 | Fuji Electric Co., Ltd. | Semiconductor device and temperature measurement method |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2002033505A (ja) | 2002-01-31 |
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