JP4416307B2 - ピンホール検査機 - Google Patents

ピンホール検査機 Download PDF

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Publication number
JP4416307B2
JP4416307B2 JP2000341141A JP2000341141A JP4416307B2 JP 4416307 B2 JP4416307 B2 JP 4416307B2 JP 2000341141 A JP2000341141 A JP 2000341141A JP 2000341141 A JP2000341141 A JP 2000341141A JP 4416307 B2 JP4416307 B2 JP 4416307B2
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Japan
Prior art keywords
subject
inspection
gas
pinhole
pinhole inspection
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Expired - Lifetime
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JP2000341141A
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English (en)
Japanese (ja)
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JP2002116111A (ja
JP2002116111A5 (enrdf_load_stackoverflow
Inventor
正夫 金澤
友次 頂
葉月 和佐
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Nissin Electronics Co Ltd
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Nissin Electronics Co Ltd
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Priority to JP2000341141A priority Critical patent/JP4416307B2/ja
Publication of JP2002116111A publication Critical patent/JP2002116111A/ja
Publication of JP2002116111A5 publication Critical patent/JP2002116111A5/ja
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Publication of JP4416307B2 publication Critical patent/JP4416307B2/ja
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  • Examining Or Testing Airtightness (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP2000341141A 2000-10-04 2000-10-04 ピンホール検査機 Expired - Lifetime JP4416307B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000341141A JP4416307B2 (ja) 2000-10-04 2000-10-04 ピンホール検査機

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000341141A JP4416307B2 (ja) 2000-10-04 2000-10-04 ピンホール検査機

Publications (3)

Publication Number Publication Date
JP2002116111A JP2002116111A (ja) 2002-04-19
JP2002116111A5 JP2002116111A5 (enrdf_load_stackoverflow) 2007-11-22
JP4416307B2 true JP4416307B2 (ja) 2010-02-17

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ID=18815925

Family Applications (1)

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JP2000341141A Expired - Lifetime JP4416307B2 (ja) 2000-10-04 2000-10-04 ピンホール検査機

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JP (1) JP4416307B2 (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103278293A (zh) * 2013-05-14 2013-09-04 山东永聚医药科技有限公司 软包装产品焊接点漏液检测装置和方法
CN103350073A (zh) * 2013-07-23 2013-10-16 楚天科技股份有限公司 一种塑料瓶真空检漏及检漏剔除机构

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7038464B2 (en) * 2004-08-26 2006-05-02 Diamond Machine Werks, Inc. Carrier line oriented spin high voltage leak detection system and method
JP2008039463A (ja) * 2006-08-02 2008-02-21 Nikka Densoku Kk ピンホール検査方法、及びピンホール検査装置
CN110926734B (zh) * 2019-12-11 2025-05-13 楚天科技股份有限公司 一种联排放电检漏机

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103278293A (zh) * 2013-05-14 2013-09-04 山东永聚医药科技有限公司 软包装产品焊接点漏液检测装置和方法
CN103350073A (zh) * 2013-07-23 2013-10-16 楚天科技股份有限公司 一种塑料瓶真空检漏及检漏剔除机构
CN103350073B (zh) * 2013-07-23 2015-03-18 楚天科技股份有限公司 一种塑料瓶真空检漏及检漏剔除机构

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Publication number Publication date
JP2002116111A (ja) 2002-04-19

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