JP4255646B2 - レーザーの放射波長を監視するための装置 - Google Patents

レーザーの放射波長を監視するための装置 Download PDF

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Publication number
JP4255646B2
JP4255646B2 JP2002129643A JP2002129643A JP4255646B2 JP 4255646 B2 JP4255646 B2 JP 4255646B2 JP 2002129643 A JP2002129643 A JP 2002129643A JP 2002129643 A JP2002129643 A JP 2002129643A JP 4255646 B2 JP4255646 B2 JP 4255646B2
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Japan
Prior art keywords
radiation
laser
slice
wavelength
angle
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Expired - Fee Related
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JP2002129643A
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English (en)
Japanese (ja)
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JP2002344078A (ja
JP2002344078A5 (enExample
Inventor
ロベルト・ラーノ
フランコ・デルピアノ
クリスチアナ・コンタルディ
Original Assignee
アバゴ・テクノロジーズ・ファイバー・アイピー（シンガポール）プライベート・リミテッド
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Publication of JP2002344078A5 publication Critical patent/JP2002344078A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
    • H01S5/068—Stabilisation of laser output parameters
    • H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
    • H01S5/0687—Stabilising the frequency of the laser
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0246—Measuring optical wavelength
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/022—Mountings; Housings
    • H01S5/023—Mount members, e.g. sub-mount members
    • H01S5/02325—Mechanically integrated components on mount members or optical micro-benches

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)
JP2002129643A 2001-05-02 2002-05-01 レーザーの放射波長を監視するための装置 Expired - Fee Related JP4255646B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP01304026A EP1255097B1 (en) 2001-05-02 2001-05-02 A device for monitoring the emission wavelength of a laser
EP01304026.6 2001-05-02

Publications (3)

Publication Number Publication Date
JP2002344078A JP2002344078A (ja) 2002-11-29
JP2002344078A5 JP2002344078A5 (enExample) 2005-09-29
JP4255646B2 true JP4255646B2 (ja) 2009-04-15

Family

ID=8181942

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002129643A Expired - Fee Related JP4255646B2 (ja) 2001-05-02 2002-05-01 レーザーの放射波長を監視するための装置

Country Status (4)

Country Link
US (1) US6574253B2 (enExample)
EP (1) EP1255097B1 (enExample)
JP (1) JP4255646B2 (enExample)
DE (1) DE60130193T2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1389812A1 (en) * 2002-08-13 2004-02-18 Agilent Technologies Inc A mounting arrangement for high frequency electro-optical components
WO2004084607A2 (en) * 2003-03-19 2004-10-07 Binoptics Corporation High smsr unidirectional etched lasers and low back-reflection photonic device
JP5690268B2 (ja) * 2008-08-26 2015-03-25 ザ ユニバーシティー コート オブザ ユニバーシティー オブ グラスゴー 測定システム、位置決定装置、波長決定装置、及び屈折率決定装置
US9160452B2 (en) 2012-12-29 2015-10-13 Zephyr Photonics Inc. Apparatus for modular implementation of multi-function active optical cables
CN114459618B (zh) * 2021-12-10 2023-07-18 江苏师范大学 用于测量激光的斐索干涉波长计、光学设备

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4081760A (en) * 1976-06-03 1978-03-28 Coherent, Inc. Etalon laser mode selector
EP0284908B1 (de) * 1987-03-30 1993-10-27 Siemens Aktiengesellschaft Anordnung zur Steuerung oder Regelung einer Emissionswellenlänge und emittierten Leistung eines Halbleiterlasers
JP3681447B2 (ja) * 1995-10-25 2005-08-10 富士通株式会社 光波長安定化システム
US5825792A (en) * 1996-07-11 1998-10-20 Northern Telecom Limited Wavelength monitoring and control assembly for WDM optical transmission systems
JP2989775B2 (ja) * 1997-01-21 1999-12-13 サンテック株式会社 レーザ光源の波長安定化装置
US6134253A (en) * 1998-02-19 2000-10-17 Jds Uniphase Corporation Method and apparatus for monitoring and control of laser emission wavelength
FR2788605B1 (fr) * 1999-01-20 2002-07-19 Matra Marconi Space France Separateur spectral et lidar doppler a detection directe en faisant application

Also Published As

Publication number Publication date
DE60130193D1 (de) 2007-10-11
US20020163943A1 (en) 2002-11-07
US6574253B2 (en) 2003-06-03
DE60130193T2 (de) 2008-05-15
JP2002344078A (ja) 2002-11-29
EP1255097A1 (en) 2002-11-06
EP1255097B1 (en) 2007-08-29

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