JP4246090B2 - 信号検出方法および装置並びに放射線画像信号検出方法およびシステム - Google Patents

信号検出方法および装置並びに放射線画像信号検出方法およびシステム Download PDF

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Publication number
JP4246090B2
JP4246090B2 JP2004078415A JP2004078415A JP4246090B2 JP 4246090 B2 JP4246090 B2 JP 4246090B2 JP 2004078415 A JP2004078415 A JP 2004078415A JP 2004078415 A JP2004078415 A JP 2004078415A JP 4246090 B2 JP4246090 B2 JP 4246090B2
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signal
signal detection
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JP2004078415A
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Japanese (ja)
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JP2005269215A5 (enExample
JP2005269215A (ja
Inventor
晃 山口
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Fujifilm Corp
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Fujifilm Corp
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Priority to JP2004078415A priority Critical patent/JP4246090B2/ja
Priority to US11/081,661 priority patent/US7257500B2/en
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Publication of JP2005269215A5 publication Critical patent/JP2005269215A5/ja
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/65—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/191—Photoconductor image sensors
    • H10F39/195—X-ray, gamma-ray or corpuscular radiation imagers

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Measurement Of Radiation (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Radiography Using Non-Light Waves (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Facsimile Heads (AREA)
JP2004078415A 2004-03-18 2004-03-18 信号検出方法および装置並びに放射線画像信号検出方法およびシステム Expired - Fee Related JP4246090B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2004078415A JP4246090B2 (ja) 2004-03-18 2004-03-18 信号検出方法および装置並びに放射線画像信号検出方法およびシステム
US11/081,661 US7257500B2 (en) 2004-03-18 2005-03-17 Signal detecting method and device, and radiation image signal detecting method and system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004078415A JP4246090B2 (ja) 2004-03-18 2004-03-18 信号検出方法および装置並びに放射線画像信号検出方法およびシステム

Publications (3)

Publication Number Publication Date
JP2005269215A JP2005269215A (ja) 2005-09-29
JP2005269215A5 JP2005269215A5 (enExample) 2006-06-15
JP4246090B2 true JP4246090B2 (ja) 2009-04-02

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JP2004078415A Expired - Fee Related JP4246090B2 (ja) 2004-03-18 2004-03-18 信号検出方法および装置並びに放射線画像信号検出方法およびシステム

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US (1) US7257500B2 (enExample)
JP (1) JP4246090B2 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4448042B2 (ja) * 2005-02-17 2010-04-07 富士フイルム株式会社 信号検出方法および装置並びに放射線画像信号検出方法およびシステム
JP4854972B2 (ja) * 2005-03-08 2012-01-18 富士フイルム株式会社 信号検出装置
WO2007055114A1 (ja) * 2005-11-08 2007-05-18 Matsushita Electric Industrial Co., Ltd. 相関二重サンプリング回路及びサンプルホールド回路
JP2008177387A (ja) * 2007-01-19 2008-07-31 Fujifilm Corp 放射線画像検出装置
EP2180599B1 (en) 2008-10-24 2014-12-17 Advanced Silicon SA X-ray imaging readout and system
JP5324947B2 (ja) * 2009-02-03 2013-10-23 浜松ホトニクス株式会社 信号処理装置および光検出装置
KR101785131B1 (ko) * 2010-03-22 2017-10-12 홀로직, 인크. 디지털 촬상을 위한 상관해제된 채널 샘플링
EP2617132B1 (en) * 2010-09-14 2020-12-02 Advanced Silicon SA Circuit for capacitive touch applications
US20140049291A1 (en) * 2012-08-14 2014-02-20 Luxen Technologies, Inc. Noise-resistant sampling circuit and image sensor
KR20160067251A (ko) * 2014-12-03 2016-06-14 삼성디스플레이 주식회사 유기 발광 표시 장치 및 이의 구동방법

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6037660B2 (ja) * 1980-05-06 1985-08-27 日本ビクター株式会社 音声信号の近似圧縮方式
JP4619640B2 (ja) * 2003-10-10 2011-01-26 富士フイルム株式会社 信号検出方法および装置
JP4265964B2 (ja) * 2003-11-12 2009-05-20 富士フイルム株式会社 放射線画像読取方法および装置
JP4037381B2 (ja) * 2004-03-31 2008-01-23 富士フイルム株式会社 光情報読取方法および装置

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US7257500B2 (en) 2007-08-14
JP2005269215A (ja) 2005-09-29
US20050209803A1 (en) 2005-09-22

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