JP4194799B2 - 被試験デバイスの試験中にエラーが生じた場合にテストプログラムのアルゴリズム制御のその時点の状態を回復する方法 - Google Patents

被試験デバイスの試験中にエラーが生じた場合にテストプログラムのアルゴリズム制御のその時点の状態を回復する方法 Download PDF

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JP4194799B2
JP4194799B2 JP2002121654A JP2002121654A JP4194799B2 JP 4194799 B2 JP4194799 B2 JP 4194799B2 JP 2002121654 A JP2002121654 A JP 2002121654A JP 2002121654 A JP2002121654 A JP 2002121654A JP 4194799 B2 JP4194799 B2 JP 4194799B2
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test
memory
dut
error
program
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JP2003007089A (ja
JP2003007089A5 (enExample
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アラン・エス・クレッチ・ジュニア
スティーブン・ディ・ジョルダン
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Verigy Singapore Pte Ltd
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Verigy Singapore Pte Ltd
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP2002121654A 2001-04-25 2002-04-24 被試験デバイスの試験中にエラーが生じた場合にテストプログラムのアルゴリズム制御のその時点の状態を回復する方法 Expired - Lifetime JP4194799B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/842433 2001-04-25
US09/842,433 US6574764B2 (en) 2001-04-25 2001-04-25 Algorithmically programmable memory tester with history FIFO's that aid in error analysis and recovery

Publications (3)

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JP2003007089A JP2003007089A (ja) 2003-01-10
JP2003007089A5 JP2003007089A5 (enExample) 2005-09-29
JP4194799B2 true JP4194799B2 (ja) 2008-12-10

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JP2002121654A Expired - Lifetime JP4194799B2 (ja) 2001-04-25 2002-04-24 被試験デバイスの試験中にエラーが生じた場合にテストプログラムのアルゴリズム制御のその時点の状態を回復する方法

Country Status (6)

Country Link
US (1) US6574764B2 (enExample)
EP (2) EP1701359A1 (enExample)
JP (1) JP4194799B2 (enExample)
KR (1) KR100920277B1 (enExample)
DE (1) DE60219990T2 (enExample)
TW (1) TW583680B (enExample)

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US6763490B1 (en) * 2000-09-25 2004-07-13 Agilent Technologies, Inc. Method and apparatus for coordinating program execution in a site controller with pattern execution in a tester
US20030088810A1 (en) * 2001-11-02 2003-05-08 Sun Microsystems, Inc. Methods and apparatus for determining software component sizes associated with errors
US7117410B2 (en) * 2002-12-20 2006-10-03 Teradyne, Inc. Distributed failure analysis memory for automatic test equipment
JP4696911B2 (ja) * 2003-03-03 2011-06-08 株式会社ニコン 顕微鏡デジタル画像取得システム
US7039545B2 (en) * 2004-04-19 2006-05-02 Agilent Technologies, Inc. Apparatus, system and/or method for converting a serial test to a parallel test
US20050285612A1 (en) * 2004-06-23 2005-12-29 From Thirty Incorporated Apparatus for measuring DC parameters in a wafer burn-in system
JP2006275986A (ja) * 2005-03-30 2006-10-12 Advantest Corp 診断プログラム、切替プログラム、試験装置、および診断方法
US7528622B2 (en) 2005-07-06 2009-05-05 Optimal Test Ltd. Methods for slow test time detection of an integrated circuit during parallel testing
DE102005048872A1 (de) * 2005-10-12 2007-04-26 Mühlbauer Ag Testkopfeinrichtung
US7536662B2 (en) * 2006-06-27 2009-05-19 Atrenta, Inc. Method for recognizing and verifying FIFO structures in integrated circuit designs
US8099583B2 (en) * 2006-08-23 2012-01-17 Axis Semiconductor, Inc. Method of and apparatus and architecture for real time signal processing by switch-controlled programmable processor configuring and flexible pipeline and parallel processing
US20090113245A1 (en) * 2007-10-30 2009-04-30 Teradyne, Inc. Protocol aware digital channel apparatus
US20090112548A1 (en) * 2007-10-30 2009-04-30 Conner George W A method for testing in a reconfigurable tester
US7792656B2 (en) * 2007-12-19 2010-09-07 Advantest Corporation Test apparatus
US8181003B2 (en) * 2008-05-29 2012-05-15 Axis Semiconductor, Inc. Instruction set design, control and communication in programmable microprocessor cores and the like
US8078833B2 (en) * 2008-05-29 2011-12-13 Axis Semiconductor, Inc. Microprocessor with highly configurable pipeline and executional unit internal hierarchal structures, optimizable for different types of computational functions
US8458536B2 (en) * 2008-07-17 2013-06-04 Marvell World Trade Ltd. Data recovery in solid state memory devices
US8527677B1 (en) 2010-06-25 2013-09-03 Altera Corporation Serial communications links with bonded first-in-first-out buffer circuitry
CN103163448B (zh) * 2011-12-16 2016-01-27 中国科学院微电子研究所 对现场可编程门阵列中查找表延迟故障进行检测的方法
US10268572B2 (en) * 2017-08-03 2019-04-23 Fujitsu Limited Interactive software program repair
US10565036B1 (en) 2019-02-14 2020-02-18 Axis Semiconductor, Inc. Method of synchronizing host and coprocessor operations via FIFO communication
CN116705137B (zh) * 2023-05-08 2024-04-02 深圳市晶存科技有限公司 固态硬盘的测试模式切换方法

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US5062109A (en) * 1988-09-02 1991-10-29 Advantest Corporation Memory tester
US5067129A (en) * 1989-08-16 1991-11-19 International Business Machines Corp. Service processor tester
JP3700797B2 (ja) * 1996-08-09 2005-09-28 株式会社アドバンテスト メモリ試験装置
US5930735A (en) * 1997-04-30 1999-07-27 Credence Systems Corporation Integrated circuit tester including at least one quasi-autonomous test instrument
US6067648A (en) * 1998-03-02 2000-05-23 Tanisys Technology, Inc. Programmable pulse generator
EP0992907B1 (en) * 1998-10-06 2005-09-28 Texas Instruments Inc. Trace fifo management
US6233678B1 (en) * 1998-11-05 2001-05-15 Hewlett-Packard Company Method and apparatus for profiling of non-instrumented programs and dynamic processing of profile data
KR100308621B1 (ko) * 1998-11-19 2001-12-17 윤종용 반도체 메모리 장치를 위한 프로그램 가능한 내장 자기 테스트 시스템
US6320812B1 (en) * 2000-09-20 2001-11-20 Agilent Technologies, Inc. Error catch RAM for memory tester has SDRAM memory sets configurable for size and speed

Also Published As

Publication number Publication date
DE60219990T2 (de) 2008-01-17
DE60219990D1 (de) 2007-06-21
US20020162046A1 (en) 2002-10-31
KR100920277B1 (ko) 2009-10-08
US6574764B2 (en) 2003-06-03
EP1253600A2 (en) 2002-10-30
TW583680B (en) 2004-04-11
JP2003007089A (ja) 2003-01-10
EP1253600B1 (en) 2007-05-09
EP1701359A1 (en) 2006-09-13
EP1253600A3 (en) 2004-04-21
KR20020082791A (ko) 2002-10-31

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