KR100920277B1 - 파라미터 값 및 에러 표시 보존 방법과, 알고리즘 제어변수 복원 방법과, 에러 표시에서의 분기 방법 - Google Patents

파라미터 값 및 에러 표시 보존 방법과, 알고리즘 제어변수 복원 방법과, 에러 표시에서의 분기 방법 Download PDF

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KR100920277B1
KR100920277B1 KR1020020022396A KR20020022396A KR100920277B1 KR 100920277 B1 KR100920277 B1 KR 100920277B1 KR 1020020022396 A KR1020020022396 A KR 1020020022396A KR 20020022396 A KR20020022396 A KR 20020022396A KR 100920277 B1 KR100920277 B1 KR 100920277B1
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test
error
dut
program
pipeline
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KR20020082791A (ko
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크레치알란에스2세
조단스티븐디
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베리지 (싱가포르) 피티이. 엘티디.
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
KR1020020022396A 2001-04-25 2002-04-24 파라미터 값 및 에러 표시 보존 방법과, 알고리즘 제어변수 복원 방법과, 에러 표시에서의 분기 방법 Expired - Lifetime KR100920277B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/842,433 2001-04-25
US09/842,433 US6574764B2 (en) 2001-04-25 2001-04-25 Algorithmically programmable memory tester with history FIFO's that aid in error analysis and recovery

Publications (2)

Publication Number Publication Date
KR20020082791A KR20020082791A (ko) 2002-10-31
KR100920277B1 true KR100920277B1 (ko) 2009-10-08

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KR1020020022396A Expired - Lifetime KR100920277B1 (ko) 2001-04-25 2002-04-24 파라미터 값 및 에러 표시 보존 방법과, 알고리즘 제어변수 복원 방법과, 에러 표시에서의 분기 방법

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Country Link
US (1) US6574764B2 (enExample)
EP (2) EP1701359A1 (enExample)
JP (1) JP4194799B2 (enExample)
KR (1) KR100920277B1 (enExample)
DE (1) DE60219990T2 (enExample)
TW (1) TW583680B (enExample)

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US6763490B1 (en) * 2000-09-25 2004-07-13 Agilent Technologies, Inc. Method and apparatus for coordinating program execution in a site controller with pattern execution in a tester
US20030088810A1 (en) * 2001-11-02 2003-05-08 Sun Microsystems, Inc. Methods and apparatus for determining software component sizes associated with errors
US7117410B2 (en) * 2002-12-20 2006-10-03 Teradyne, Inc. Distributed failure analysis memory for automatic test equipment
WO2004079428A1 (ja) * 2003-03-03 2004-09-16 Nikon Corporation 顕微鏡デジタル画像取得システム
US7039545B2 (en) * 2004-04-19 2006-05-02 Agilent Technologies, Inc. Apparatus, system and/or method for converting a serial test to a parallel test
US20050285612A1 (en) * 2004-06-23 2005-12-29 From Thirty Incorporated Apparatus for measuring DC parameters in a wafer burn-in system
JP2006275986A (ja) * 2005-03-30 2006-10-12 Advantest Corp 診断プログラム、切替プログラム、試験装置、および診断方法
US7528622B2 (en) * 2005-07-06 2009-05-05 Optimal Test Ltd. Methods for slow test time detection of an integrated circuit during parallel testing
DE102005048872A1 (de) * 2005-10-12 2007-04-26 Mühlbauer Ag Testkopfeinrichtung
US7536662B2 (en) * 2006-06-27 2009-05-19 Atrenta, Inc. Method for recognizing and verifying FIFO structures in integrated circuit designs
US8099583B2 (en) * 2006-08-23 2012-01-17 Axis Semiconductor, Inc. Method of and apparatus and architecture for real time signal processing by switch-controlled programmable processor configuring and flexible pipeline and parallel processing
US20090113245A1 (en) * 2007-10-30 2009-04-30 Teradyne, Inc. Protocol aware digital channel apparatus
US20090112548A1 (en) * 2007-10-30 2009-04-30 Conner George W A method for testing in a reconfigurable tester
US7792656B2 (en) * 2007-12-19 2010-09-07 Advantest Corporation Test apparatus
US8181003B2 (en) * 2008-05-29 2012-05-15 Axis Semiconductor, Inc. Instruction set design, control and communication in programmable microprocessor cores and the like
US8078833B2 (en) * 2008-05-29 2011-12-13 Axis Semiconductor, Inc. Microprocessor with highly configurable pipeline and executional unit internal hierarchal structures, optimizable for different types of computational functions
US8458536B2 (en) * 2008-07-17 2013-06-04 Marvell World Trade Ltd. Data recovery in solid state memory devices
US8527677B1 (en) 2010-06-25 2013-09-03 Altera Corporation Serial communications links with bonded first-in-first-out buffer circuitry
CN103163448B (zh) * 2011-12-16 2016-01-27 中国科学院微电子研究所 对现场可编程门阵列中查找表延迟故障进行检测的方法
US10268572B2 (en) * 2017-08-03 2019-04-23 Fujitsu Limited Interactive software program repair
US10565036B1 (en) 2019-02-14 2020-02-18 Axis Semiconductor, Inc. Method of synchronizing host and coprocessor operations via FIFO communication
CN116705137B (zh) * 2023-05-08 2024-04-02 深圳市晶存科技有限公司 固态硬盘的测试模式切换方法

Citations (5)

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EP0356999A2 (en) * 1988-09-02 1990-03-07 Advantest Corporation Memory tester
EP0999499A2 (en) * 1998-11-05 2000-05-10 Hewlett-Packard Company Method and apparatus for profiling of non-instrumented programs and dynamic processing of profile data
KR20000033120A (ko) * 1998-11-19 2000-06-15 윤종용 반도체 메모리 장치를 위한 프로그램 가능한 내장 자기 테스트시스템
US6173238B1 (en) * 1996-08-09 2001-01-09 Advantest Corporation Memory testing apparatus
KR20010020404A (ko) * 1997-04-30 2001-03-15 오쿠모토 리차드 적어도 하나의 준 자율 테스트 장비를 포함하는 집적 회로 테스터

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US5067129A (en) * 1989-08-16 1991-11-19 International Business Machines Corp. Service processor tester
US6067648A (en) * 1998-03-02 2000-05-23 Tanisys Technology, Inc. Programmable pulse generator
EP0992907B1 (en) * 1998-10-06 2005-09-28 Texas Instruments Inc. Trace fifo management
US6320812B1 (en) * 2000-09-20 2001-11-20 Agilent Technologies, Inc. Error catch RAM for memory tester has SDRAM memory sets configurable for size and speed

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0356999A2 (en) * 1988-09-02 1990-03-07 Advantest Corporation Memory tester
US6173238B1 (en) * 1996-08-09 2001-01-09 Advantest Corporation Memory testing apparatus
KR20010020404A (ko) * 1997-04-30 2001-03-15 오쿠모토 리차드 적어도 하나의 준 자율 테스트 장비를 포함하는 집적 회로 테스터
EP0999499A2 (en) * 1998-11-05 2000-05-10 Hewlett-Packard Company Method and apparatus for profiling of non-instrumented programs and dynamic processing of profile data
KR20000033120A (ko) * 1998-11-19 2000-06-15 윤종용 반도체 메모리 장치를 위한 프로그램 가능한 내장 자기 테스트시스템

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EP1253600A3 (en) 2004-04-21
EP1253600A2 (en) 2002-10-30
JP4194799B2 (ja) 2008-12-10
KR20020082791A (ko) 2002-10-31
DE60219990D1 (de) 2007-06-21
TW583680B (en) 2004-04-11
DE60219990T2 (de) 2008-01-17
JP2003007089A (ja) 2003-01-10
EP1701359A1 (en) 2006-09-13
EP1253600B1 (en) 2007-05-09
US6574764B2 (en) 2003-06-03
US20020162046A1 (en) 2002-10-31

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