JP4169484B2 - 磁気抵抗メモリアレイの自己試験システム - Google Patents

磁気抵抗メモリアレイの自己試験システム Download PDF

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Publication number
JP4169484B2
JP4169484B2 JP2001028595A JP2001028595A JP4169484B2 JP 4169484 B2 JP4169484 B2 JP 4169484B2 JP 2001028595 A JP2001028595 A JP 2001028595A JP 2001028595 A JP2001028595 A JP 2001028595A JP 4169484 B2 JP4169484 B2 JP 4169484B2
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test
circuit
memory
array
coupled
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Japanese (ja)
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JP2001273799A5 (enExample
JP2001273799A (ja
Inventor
フレデリック・エー・ペルナー
ケネス・ジェイ・エルドレッジ
ラング・ティ・トラン
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Samsung Electronics Co Ltd
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Samsung Electronics Co Ltd
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements

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  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2001028595A 2000-02-04 2001-02-05 磁気抵抗メモリアレイの自己試験システム Expired - Fee Related JP4169484B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/498588 2000-02-04
US09/498,588 US6584589B1 (en) 2000-02-04 2000-02-04 Self-testing of magneto-resistive memory arrays

Publications (3)

Publication Number Publication Date
JP2001273799A JP2001273799A (ja) 2001-10-05
JP2001273799A5 JP2001273799A5 (enExample) 2005-07-21
JP4169484B2 true JP4169484B2 (ja) 2008-10-22

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JP2001028595A Expired - Fee Related JP4169484B2 (ja) 2000-02-04 2001-02-05 磁気抵抗メモリアレイの自己試験システム

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Country Link
US (1) US6584589B1 (enExample)
EP (1) EP1132924A3 (enExample)
JP (1) JP4169484B2 (enExample)
CN (1) CN1252724C (enExample)
HK (1) HK1041361A1 (enExample)

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US8496091B2 (en) 2008-07-23 2013-07-30 Mitsubishi Electric Corporation Elevator car layout information editing system, destination information input device, display device and edition operating device

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JP4698715B2 (ja) * 2002-02-04 2011-06-08 ルネサスエレクトロニクス株式会社 薄膜磁性体記憶装置
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US8929167B2 (en) * 2013-01-31 2015-01-06 Qualcomm Incorporated MRAM self-repair with BIST logic
US9875810B2 (en) * 2013-07-24 2018-01-23 Microsoft Technology Licensing, Llc Self-identifying memory errors
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CN110082672B (zh) * 2018-01-25 2020-09-11 大唐移动通信设备有限公司 一种芯片内逻辑模型的测试方法及装置
CN112041928B (zh) 2018-04-30 2025-01-28 慧与发展有限责任合伙企业 忆阻器交叉杆阵列中模型/权重编程的加速
CN111223518B (zh) * 2018-11-27 2021-08-20 中电海康集团有限公司 用于阻性存储单元的测试结构及耐久性测试方法
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CN112230112B (zh) * 2019-06-28 2024-08-23 中电海康集团有限公司 测试结构和测试方法
CN112259151B (zh) * 2019-07-22 2022-06-24 中电海康集团有限公司 Mram阵列的测试电路
CN112259153B (zh) * 2019-07-22 2022-06-24 中电海康集团有限公司 Mram阵列的测试电路
KR20210109085A (ko) 2020-02-26 2021-09-06 삼성전자주식회사 메모리 장치에 대한 테스트 방법, 메모리 장치를 테스트하는 테스트 장치의 동작 방법, 및 셀프-테스트 기능을 구비한 메모리 장치
CN114267405B (zh) * 2020-09-16 2023-08-22 长鑫存储技术有限公司 电流测试电路、装置、方法及存储介质
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Publication number Priority date Publication date Assignee Title
US8496091B2 (en) 2008-07-23 2013-07-30 Mitsubishi Electric Corporation Elevator car layout information editing system, destination information input device, display device and edition operating device

Also Published As

Publication number Publication date
EP1132924A3 (en) 2002-12-04
JP2001273799A (ja) 2001-10-05
CN1252724C (zh) 2006-04-19
US6584589B1 (en) 2003-06-24
EP1132924A2 (en) 2001-09-12
HK1041361A1 (zh) 2002-07-05
CN1317797A (zh) 2001-10-17

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