JP4140737B2 - 広帯域分光回転補償器楕円偏光計 - Google Patents
広帯域分光回転補償器楕円偏光計 Download PDFInfo
- Publication number
- JP4140737B2 JP4140737B2 JP50724798A JP50724798A JP4140737B2 JP 4140737 B2 JP4140737 B2 JP 4140737B2 JP 50724798 A JP50724798 A JP 50724798A JP 50724798 A JP50724798 A JP 50724798A JP 4140737 B2 JP4140737 B2 JP 4140737B2
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- Prior art keywords
- light beam
- sample
- compensator
- ellipsometer
- wavelength
- Prior art date
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- Expired - Lifetime
Links
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- 230000010287 polarization Effects 0.000 claims description 55
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 230000001934 delay Effects 0.000 description 5
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- 239000010409 thin film Substances 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
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- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 description 1
- 229910001635 magnesium fluoride Inorganic materials 0.000 description 1
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- 229910052751 metal Inorganic materials 0.000 description 1
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0229—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0232—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using shutters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
- G01N2021/213—Spectrometric ellipsometry
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/685,606 | 1996-07-24 | ||
| US08/685,606 US5877859A (en) | 1996-07-24 | 1996-07-24 | Broadband spectroscopic rotating compensator ellipsometer |
| PCT/US1997/013313 WO1998003853A1 (en) | 1996-07-24 | 1997-07-22 | Broadband spectroscopic rotating compensator ellipsometer |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2000515247A JP2000515247A (ja) | 2000-11-14 |
| JP2000515247A5 JP2000515247A5 (enExample) | 2005-03-10 |
| JP4140737B2 true JP4140737B2 (ja) | 2008-08-27 |
Family
ID=24752935
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50724798A Expired - Lifetime JP4140737B2 (ja) | 1996-07-24 | 1997-07-22 | 広帯域分光回転補償器楕円偏光計 |
Country Status (6)
| Country | Link |
|---|---|
| US (7) | US5877859A (enExample) |
| EP (2) | EP0914600B1 (enExample) |
| JP (1) | JP4140737B2 (enExample) |
| DE (1) | DE69716272T2 (enExample) |
| ES (1) | ES2185038T3 (enExample) |
| WO (1) | WO1998003853A1 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20140045388A (ko) * | 2011-05-13 | 2014-04-16 | 케이엘에이-텐코 코포레이션 | 재구성가능한 분광 타원계 |
| JP2021529328A (ja) * | 2018-07-12 | 2021-10-28 | コリア リサーチ インスティトゥート オブ スタンダーズ アンド サイエンス | 垂直入射エリプソメータおよびこれを用いた試験片の光物性の測定方法 |
Families Citing this family (163)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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| US7616319B1 (en) | 1995-09-20 | 2009-11-10 | James D. Welch | Spectroscopic ellipsometer and polarimeter systems |
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| US6064061A (en) * | 1998-03-31 | 2000-05-16 | Advanced Optical Technologies, L.L.C. | Enhancements in radiant energy transducer systems |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20140045388A (ko) * | 2011-05-13 | 2014-04-16 | 케이엘에이-텐코 코포레이션 | 재구성가능한 분광 타원계 |
| JP2021529328A (ja) * | 2018-07-12 | 2021-10-28 | コリア リサーチ インスティトゥート オブ スタンダーズ アンド サイエンス | 垂直入射エリプソメータおよびこれを用いた試験片の光物性の測定方法 |
| JP7316355B2 (ja) | 2018-07-12 | 2023-07-27 | コリア リサーチ インスティトゥート オブ スタンダーズ アンド サイエンス | 垂直入射エリプソメータおよびこれを用いた試験片の光物性の測定方法 |
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| Publication number | Publication date |
|---|---|
| JP2000515247A (ja) | 2000-11-14 |
| US5973787A (en) | 1999-10-26 |
| US6650415B2 (en) | 2003-11-18 |
| US20040042009A1 (en) | 2004-03-04 |
| US6449043B2 (en) | 2002-09-10 |
| EP0914600A1 (en) | 1999-05-12 |
| DE69716272T2 (de) | 2003-06-26 |
| EP1197741A3 (en) | 2002-08-07 |
| US6320657B1 (en) | 2001-11-20 |
| US6134012A (en) | 2000-10-17 |
| WO1998003853A1 (en) | 1998-01-29 |
| EP1197741A2 (en) | 2002-04-17 |
| EP0914600B1 (en) | 2002-10-09 |
| US20020191186A1 (en) | 2002-12-19 |
| ES2185038T3 (es) | 2003-04-16 |
| US5877859A (en) | 1999-03-02 |
| DE69716272D1 (de) | 2002-11-14 |
| US20020018205A1 (en) | 2002-02-14 |
| US6831743B2 (en) | 2004-12-14 |
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