JP4122069B2 - フィーラ部材を備えた座標測定装置及びフィーラ部材の位置測定のための光学センサ - Google Patents

フィーラ部材を備えた座標測定装置及びフィーラ部材の位置測定のための光学センサ Download PDF

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JP4122069B2
JP4122069B2 JP50161799A JP50161799A JP4122069B2 JP 4122069 B2 JP4122069 B2 JP 4122069B2 JP 50161799 A JP50161799 A JP 50161799A JP 50161799 A JP50161799 A JP 50161799A JP 4122069 B2 JP4122069 B2 JP 4122069B2
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target
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sensor
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JP2002503339A (ja
JP2002503339A5 (enExample
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クリストーフ,ラルフ
トラペート,オイゲン
シュベンケ,ハインリッヒ
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ベルス・メステヒニーク・ゲーエムベーハー
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Priority claimed from DE29710242U external-priority patent/DE29710242U1/de
Priority claimed from DE19805892A external-priority patent/DE19805892A1/de
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/002Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G01B11/007Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
JP50161799A 1997-06-12 1998-06-10 フィーラ部材を備えた座標測定装置及びフィーラ部材の位置測定のための光学センサ Expired - Fee Related JP4122069B2 (ja)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
DE29710242.7 1997-06-12
DE29710242U DE29710242U1 (de) 1997-06-12 1997-06-12 Taster zur Messung geometrischer Strukturen
DE19743969.1 1997-10-06
DE19743969 1997-10-06
DE19805892A DE19805892A1 (de) 1997-06-12 1998-02-13 Verfahren und Anordnung zur Messung von Strukturen eines Objekts
DE19805892.6 1998-02-13
PCT/EP1998/003526 WO1998057121A1 (de) 1997-06-12 1998-06-10 Koordinatenmessgerät mit tastelement und dieses vermessenden optischen sensor

Publications (3)

Publication Number Publication Date
JP2002503339A JP2002503339A (ja) 2002-01-29
JP2002503339A5 JP2002503339A5 (enExample) 2005-12-22
JP4122069B2 true JP4122069B2 (ja) 2008-07-23

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JP50161799A Expired - Fee Related JP4122069B2 (ja) 1997-06-12 1998-06-10 フィーラ部材を備えた座標測定装置及びフィーラ部材の位置測定のための光学センサ

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US (2) US6651351B1 (enExample)
EP (1) EP0988505B1 (enExample)
JP (1) JP4122069B2 (enExample)
AT (1) ATE211815T1 (enExample)
AU (1) AU8336698A (enExample)
DE (2) DE19880875D2 (enExample)
WO (1) WO1998057121A1 (enExample)

Families Citing this family (64)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0988505B1 (de) * 1997-06-12 2002-01-09 Werth Messtechnik GmbH Koordinatenmessgerät mit biegeelastischer Tasterverlängerung und optischem Sensor
GB9907644D0 (en) * 1999-04-06 1999-05-26 Renishaw Plc Surface sensing device with optical sensor
JP2004509345A (ja) * 2000-09-20 2004-03-25 ベルス・メステヒニーク・ゲーエムベーハー 構造の光学的触感式測定を実行するための装置と方法
DE10108774A1 (de) 2001-02-23 2002-09-05 Zeiss Carl Koordinatenmessgerät zum Antasten eines Werkstücks, Tastkopf für ein Koordinatenmessgerät und Verfahren zum Betrieb eines Koordinatenmessgerätes
US20030048448A1 (en) * 2001-03-19 2003-03-13 Fleming Timothy J. Automated apparatus for testing optical filters
US6983547B2 (en) * 2001-03-19 2006-01-10 Veeco Instruments Inc. Goniometer
US7065892B2 (en) * 2001-03-19 2006-06-27 Veeco Instruments Inc. Method and apparatus for calibrating a vision system to a parts handling device
JP2004535580A (ja) * 2001-07-16 2004-11-25 ベルス・メステヒニーク・ゲーエムベーハー 表面特性の測定方法及び座標測定装置
JP2003065748A (ja) * 2001-08-29 2003-03-05 Mitsutoyo Corp 測定装置
DE10159568A1 (de) * 2001-12-04 2003-06-12 Zf Batavia Llc Verfahren zur Überprüfung der Fertigungsqualität von Schubgliedern in Schubgliederbändern
US20060007449A1 (en) 2002-12-13 2006-01-12 Ralf Christoph Method for measuring a contour of a workpiece by scanning
DE10342689B3 (de) * 2003-09-16 2005-05-25 Bundesrepublik Deutschland, vertr. d. d. Bundesministerium für Wirtschaft und Arbeit, dieses vertr. d. d. Präsidenten der Physikalisch-Technischen Bundesanstalt Verfahren zur Herstellung von Prüfkörpern für die Überprüfung von Messgeräten für Mikro-Bohrungen
DE102004022314A1 (de) * 2004-05-04 2005-12-22 Werth Messtechnik Gmbh Koordinatenmessgerät sowie Verfahren zum Messen von Strukturen mittels eines Koordinatenmessgerätes
DE102004022750B4 (de) * 2004-05-07 2007-04-19 Bundesrepublik Deutschland, vertr. d. d. Bundesministerium für Wirtschaft und Technologie, dieses vertr. d. d. Präsidenten der Physikalisch-Technischen Bundesanstalt Verfahren zur Herstellung eines Mikro-Prüfkörpers
DE202004011364U1 (de) * 2004-07-20 2004-09-09 Klingelnberg Gmbh Vorrichtung zum Erkennen eines an einem Messgerät verwendeten Messkopfes
EP2224204B1 (de) 2004-12-16 2021-05-26 Werth Messtechnik GmbH Verfahren zum Messen von Werkstückgeometrien mit einem Koordinatenmessgerät
US7130725B2 (en) * 2004-12-17 2006-10-31 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method for correcting control surface angle measurements in single viewpoint photogrammetry
DE102005011258A1 (de) * 2005-03-11 2006-09-14 Forschungszentrum Karlsruhe Gmbh Verfahren und Vorrichtung zur Messung von Strukturen eines Objekts
JP4705792B2 (ja) * 2005-03-17 2011-06-22 株式会社ミツトヨ 軸間角度補正方法
JP2008536146A (ja) * 2005-04-11 2008-09-04 ファロ テクノロジーズ インコーポレーテッド 3次元座標測定デバイス
GB0508388D0 (en) * 2005-04-26 2005-06-01 Renishaw Plc Surface sensing device with optical sensor
US7185440B2 (en) * 2005-07-18 2007-03-06 Seagate Technology Llc Sensing contact probe
DE102005037160B4 (de) * 2005-08-06 2007-09-06 SIOS Meßtechnik GmbH Verfahren und Vorrichtung zur taktilen Erfassung
CN1329711C (zh) * 2005-09-14 2007-08-01 哈尔滨工业大学 基于双光纤耦合的微小内腔体尺寸测量装置与方法
DE102006001531A1 (de) 2005-09-20 2007-03-22 Werth Messtechnik Gmbh Verfahren und Anordnung zur Messung von Strukturen eines Objekts
DE102005048134B3 (de) * 2005-10-06 2007-02-08 Benteler Automobiltechnik Gmbh Vorrichtung und Verfahren zur optischen Vermessung und/oder Überprüfung von Schweißbaugruppen
DE102005051405B4 (de) * 2005-10-27 2007-08-23 Forschungszentrum Dresden - Rossendorf E.V. Messsensor
DE102006002618B3 (de) * 2006-01-19 2007-07-26 Forschungszentrum Karlsruhe Gmbh Vorrichtung zur Messung von Strukturen eines Objekts
DE102006002619B3 (de) * 2006-01-19 2007-07-26 Forschungszentrum Karlsruhe Gmbh Vorrichtung zur Messung von Strukturen eines Objekts
US7667847B2 (en) * 2006-09-21 2010-02-23 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Photogrammetric system and method used in the characterization of a structure
WO2009038465A1 (en) * 2007-09-17 2009-03-26 Conoptica As Rotating part position and change finding method and apparatus
DE102008037441A1 (de) 2008-06-30 2009-12-31 Werth Messtechnik Gmbh Verfahren zum Messen der Geometrie eines Werkstücks
EP2194357A1 (de) * 2008-12-03 2010-06-09 Leica Geosystems AG Optisches Sensorelement für eine Messmaschine, und messmaschinenseitiges Kupplungselement hierfür
DE102010037738A1 (de) 2009-09-24 2011-04-07 Werth Messtechnik Gmbh Verfahren und Koordinatenmessgerät zur Bestimmung der Geometrie eines Messobjektes
EP2504658B1 (de) 2009-11-26 2019-02-27 Werth Messtechnik GmbH Verfahren und anordnung zur taktil-optischen bestimmung der geometrie eines messobjektes
US8638453B2 (en) * 2011-03-02 2014-01-28 Envirosight Llc Pipe diameter measurement device
CN107255462B (zh) * 2011-07-08 2019-07-23 卡尔蔡司工业测量技术有限公司 在测量工件的坐标时的误差修正和/或避免
DE102011079447A1 (de) 2011-07-20 2013-01-24 Robert Bosch Gmbh Vorrichtung zur taktilen Formbestimmung
JP5946259B2 (ja) * 2011-10-20 2016-07-06 東芝機械株式会社 測定装置、測定方法およびタッチプローブ
JP5857657B2 (ja) * 2011-11-16 2016-02-10 株式会社リコー 着脱ユニットおよびこれを備えた画像形成装置
CN102589422B (zh) * 2011-12-16 2014-10-15 哈尔滨工业大学 正交光路二维微焦准直与三维坐标传感器
DE102011056805A1 (de) 2011-12-21 2013-06-27 Werth Messtechnik Gmbh Verfahren zum opto-taktilen Messen eines Objektes sowie Koordinatenmessgerät
US20130168364A1 (en) * 2011-12-29 2013-07-04 Daniel J. Ketelaar Go/no go ball feeler gauge for parts checking jigs and method
US9019511B2 (en) 2012-02-27 2015-04-28 Quality Vision International, Inc. Optical probe for vision measurements
DE102013104490A1 (de) * 2013-01-25 2014-07-31 Werth Messtechnik Gmbh Verfahren und Vorrichtung zur Bestimmung der Geometrie von Strukturen mittels Computertomografie
DE102014108353A1 (de) 2013-06-13 2014-12-18 Werth Messtechnik Gmbh Verfahren und Vorrichtung zur Bestimmung von Geometrien an Messobjekten mittels eines kombinierten Sensorsystems
WO2015082683A2 (de) 2013-12-06 2015-06-11 Werth Messtechnik Gmbh Vorrichtung und verfahren zur messung von werkstücken
DE102014117978A1 (de) 2013-12-06 2015-06-11 Werth Messtechnik Gmbh Vorrichtung und Verfahren zur Messung von Werkstücken
JP5946884B2 (ja) * 2014-10-24 2016-07-06 ファナック株式会社 対象物の位置を検出する位置検出システム
EP3230683B1 (de) 2014-12-12 2019-10-02 Werth Messtechnik GmbH Koordinatenmessgerät und verfahren zur messung von merkmalen an werkstücken
DE102015121582A1 (de) 2014-12-12 2016-06-16 Werth Messtechnik Gmbh Verfahren und Vorrichtung zur Messung von Merkmalen an Werkstücken
EP3147627B1 (de) 2015-09-22 2023-04-26 GF Machining Solutions AG Optische messtaster-kalibration
ITUB20169908A1 (it) * 2016-01-11 2017-07-11 Torino Politecnico Dispositivo tastatore, marker per dispositivo tastatore e sistema di misura per effettuare misure fotogrammetriche di oggetti di grandi dimensioni
JP6797639B2 (ja) * 2016-11-02 2020-12-09 株式会社キーエンス 画像測定装置
JP6797638B2 (ja) * 2016-11-02 2020-12-09 株式会社キーエンス 画像測定装置
US10006757B1 (en) * 2017-06-16 2018-06-26 Mitutoyo Corporation Optical configuration for measurement device using emitter material configuration with quadrant photodetectors
US10323928B2 (en) * 2017-06-16 2019-06-18 Mitutoyo Corporation Optical configuration for measurement device using emitter material configuration
WO2019067755A1 (en) 2017-09-29 2019-04-04 Mitutoyo Corporation CONFIGURATION OF COMPACT MEASURING DEVICE FOR INTEGRATING COMPLEX CIRCUITS
CH715610A1 (fr) 2018-12-04 2020-06-15 Watch Out S A Système et procédés de mesure du profil d'une pièce.
JP7337664B2 (ja) * 2019-11-06 2023-09-04 オークマ株式会社 工作機械における位置計測センサの補正値計測方法及び補正値計測システム
DE102021112120A1 (de) 2021-05-10 2022-11-10 Carl Mahr Holding Gmbh Faseroptische Punktsonde und Distanzmesssystem mit einer faseroptischen Punktsonde
US12492889B2 (en) 2021-07-29 2025-12-09 Mitutoyo Corporation Chromatic range sensor system including camera
DE102023117023A1 (de) 2022-06-30 2024-01-04 Werth Messtechnik Gmbh Verfahren zum Betreiben eines Koordinatenmessgeräts und Vorrichtung zur Ausführung
DE102023104741A1 (de) 2023-02-27 2024-08-29 Physikalisch-Technische Bundesanstalt Braunschweig Und Berlin Vorrichtung und Verfahren zur taktil-optischen Messung von Werkstücken

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3180030A (en) * 1961-02-23 1965-04-27 Bendix Corp Gage probe
DE2605772A1 (de) 1976-02-13 1977-08-18 Komeg Kontroll Technik Ingenie Messmaschine zur kontrolle von werkstuecken beliebiger abmessungen
US4574199A (en) * 1983-01-27 1986-03-04 Diffracto Ltd. Sensing location of an object
DD222391A1 (de) 1984-03-01 1985-05-15 Zeiss Jena Veb Carl Verfahren und anordnung zur optischen kontrolle mechanischer messobjektabtastung
GB2180117B (en) 1985-09-05 1989-09-06 Ferranti Plc Three-dimensional position measuring apparatus
GB8706790D0 (en) * 1987-03-21 1987-04-23 Renishaw Plc Interferometer position measurement system
JPH0789045B2 (ja) 1988-12-15 1995-09-27 富山県 三次元変位量測定器
DE3920716C1 (enExample) * 1989-06-24 1990-11-29 Wild Leitz Gmbh, 6330 Wetzlar, De
DE4002043C2 (de) 1990-01-24 1997-03-20 Paul Hans Ulrich Prof Dipl Ing Meßsystem zur Ermittlung geometrischer Bearbeitungsdaten an zu vermessenden Formen
US5251156A (en) * 1990-08-25 1993-10-05 Carl-Zeiss-Stiftung, Heidenheim/Brenz Method and apparatus for non-contact measurement of object surfaces
US5125165A (en) * 1990-11-28 1992-06-30 Mitutoyo Corporation Precision linear measuring device having an improved spindle mounting device
NO174025C (no) * 1991-10-11 1994-03-02 Metronor Sa System for punktvis maaling av romlige koordinater
GB9201123D0 (en) * 1992-01-20 1992-03-11 Vernon Gauging Systems Limited Gauging apparatus
DE4327250C5 (de) * 1992-09-25 2008-11-20 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zur Koordinatenmessung an Werkstücken
DE4312579A1 (de) 1993-04-17 1994-10-20 Matthias Schum Meßmaschine
DE4325744C1 (de) * 1993-07-31 1994-12-15 Heidenhain Gmbh Dr Johannes Mehrkoordinaten-Tastkopf
DE4433917A1 (de) * 1994-09-23 1996-03-28 Zeiss Carl Fa Verfahren zur Messung von Werkstücken mit einem handgeführten Koordinatenmeßgerät
DE59509004D1 (de) * 1995-03-10 2001-03-08 Heidenhain Gmbh Dr Johannes Mehrkoordinaten-Tastkopf mit gleichen Auslenkungen
DE19514815C2 (de) * 1995-04-21 1997-02-13 Gerlach Dieter Meßeinrichtung mit einem auf einer Führungseinheit entlang eines Maßstabs verfahrbaren Meßkopf und mit einem Taster
US5825666A (en) 1995-06-07 1998-10-20 Freifeld; Daniel Optical coordinate measuring machines and optical touch probes
JPH0926316A (ja) * 1995-07-11 1997-01-28 Mitsutoyo Corp 非接触三次元変位検出装置
JP3267116B2 (ja) * 1995-09-19 2002-03-18 ミノルタ株式会社 接触式センサおよび移動体
JP3075981B2 (ja) * 1996-04-05 2000-08-14 松下電器産業株式会社 形状測定装置
NL1003175C2 (nl) * 1996-05-21 1997-11-25 Wilhelmus Petrus Van Vliet Mechanisch tastsysteem voorzien van een contactloos meetsysteem dat 6 vrijheidsgraden kan meten voor gebruik in coördinaten meetmachines, gereedschapsmachines en robots, geschikt om met hoge snelheid geometrische eigenschappen van werkstukken te bepalen.
EP0988505B1 (de) * 1997-06-12 2002-01-09 Werth Messtechnik GmbH Koordinatenmessgerät mit biegeelastischer Tasterverlängerung und optischem Sensor
US6021579A (en) * 1998-04-01 2000-02-08 Joseph M. Schimmels Spatial parallel compliant mechanism
DE19816272C2 (de) * 1998-04-11 2000-05-11 Werth Messtechnik Gmbh Verfahren und Anordnung zur Messung von Strukturen eines Objekts
DE19816270A1 (de) * 1998-04-11 1999-10-21 Werth Messtechnik Gmbh Verfahren und Anordnung zur Erfassung der Geometrie von Gegenständen mittels eines Koordinatenmeßgeräts
US6240651B1 (en) * 1998-06-17 2001-06-05 Mycrona Gmbh Coordinate measuring machine having a non-sensing probe
JP2000199710A (ja) * 1999-01-06 2000-07-18 Mitsutoyo Corp タッチ信号プロ―ブの接触部位検出構造

Also Published As

Publication number Publication date
ATE211815T1 (de) 2002-01-15
EP0988505A1 (de) 2000-03-29
JP2002503339A (ja) 2002-01-29
US6651351B1 (en) 2003-11-25
US20050000102A1 (en) 2005-01-06
EP0988505B1 (de) 2002-01-09
DE29823884U1 (de) 2000-02-24
AU8336698A (en) 1998-12-30
WO1998057121A1 (de) 1998-12-17
DE19880875D2 (de) 2000-07-13

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