JP4074064B2 - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
- Publication number
- JP4074064B2 JP4074064B2 JP2001053728A JP2001053728A JP4074064B2 JP 4074064 B2 JP4074064 B2 JP 4074064B2 JP 2001053728 A JP2001053728 A JP 2001053728A JP 2001053728 A JP2001053728 A JP 2001053728A JP 4074064 B2 JP4074064 B2 JP 4074064B2
- Authority
- JP
- Japan
- Prior art keywords
- transformer
- high voltage
- circuit
- coil
- microtransformer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
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- Coils Or Transformers For Communication (AREA)
- Semiconductor Integrated Circuits (AREA)
- Rectifiers (AREA)
- Dc-Dc Converters (AREA)
- Read Only Memory (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001053728A JP4074064B2 (ja) | 2001-02-28 | 2001-02-28 | 半導体装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001053728A JP4074064B2 (ja) | 2001-02-28 | 2001-02-28 | 半導体装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002262545A JP2002262545A (ja) | 2002-09-13 |
| JP2002262545A5 JP2002262545A5 (enExample) | 2005-07-21 |
| JP4074064B2 true JP4074064B2 (ja) | 2008-04-09 |
Family
ID=18914157
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001053728A Expired - Fee Related JP4074064B2 (ja) | 2001-02-28 | 2001-02-28 | 半導体装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4074064B2 (enExample) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7391036B2 (en) | 2002-04-17 | 2008-06-24 | Ebara Corporation | Sample surface inspection apparatus and method |
| JP4552004B2 (ja) | 2002-09-27 | 2010-09-29 | 学校法人日本大学 | 咬合確認装置 |
| KR100602065B1 (ko) | 2003-07-31 | 2006-07-14 | 엘지전자 주식회사 | 전원장치와 그의 구동방법 및 이를 이용한 일렉트로루미네센스 표시소자의 구동장치 및 구동방법 |
| US7489526B2 (en) * | 2004-08-20 | 2009-02-10 | Analog Devices, Inc. | Power and information signal transfer using micro-transformers |
| JP2007036216A (ja) | 2005-06-24 | 2007-02-08 | Semiconductor Energy Lab Co Ltd | 半導体装置及び無線通信システム |
| JP4918795B2 (ja) * | 2006-03-16 | 2012-04-18 | 富士電機株式会社 | パワーエレクトロニクス機器 |
| EP1841049B1 (en) * | 2006-03-28 | 2012-08-15 | Infineon Technologies AG | Electromagnetic micro-generator |
| WO2008123082A1 (ja) * | 2007-03-29 | 2008-10-16 | Nec Corporation | インダクタ、配線基板、および半導体装置 |
| JP5658429B2 (ja) | 2008-07-03 | 2015-01-28 | ルネサスエレクトロニクス株式会社 | 回路装置 |
| JP5755414B2 (ja) | 2010-06-08 | 2015-07-29 | 日本電産サンキョー株式会社 | 振れ補正機能付き光学ユニット |
| JP5357136B2 (ja) * | 2010-12-22 | 2013-12-04 | 旭化成エレクトロニクス株式会社 | 変成器 |
| CN107424972A (zh) * | 2012-12-19 | 2017-12-01 | 瑞萨电子株式会社 | 半导体装置 |
| US9293997B2 (en) | 2013-03-14 | 2016-03-22 | Analog Devices Global | Isolated error amplifier for isolated power supplies |
| US9660848B2 (en) | 2014-09-15 | 2017-05-23 | Analog Devices Global | Methods and structures to generate on/off keyed carrier signals for signal isolators |
| US10536309B2 (en) | 2014-09-15 | 2020-01-14 | Analog Devices, Inc. | Demodulation of on-off-key modulated signals in signal isolator systems |
| US10270630B2 (en) | 2014-09-15 | 2019-04-23 | Analog Devices, Inc. | Demodulation of on-off-key modulated signals in signal isolator systems |
| US9998301B2 (en) | 2014-11-03 | 2018-06-12 | Analog Devices, Inc. | Signal isolator system with protection for common mode transients |
| JP6030107B2 (ja) * | 2014-11-28 | 2016-11-24 | ルネサスエレクトロニクス株式会社 | 回路装置 |
| JP6238323B2 (ja) * | 2016-10-19 | 2017-11-29 | ルネサスエレクトロニクス株式会社 | 回路装置 |
-
2001
- 2001-02-28 JP JP2001053728A patent/JP4074064B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2002262545A (ja) | 2002-09-13 |
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