JP4068206B2 - モニタシステム、モニタ及び制御システムならびにプリンタシステム - Google Patents

モニタシステム、モニタ及び制御システムならびにプリンタシステム Download PDF

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Publication number
JP4068206B2
JP4068206B2 JP02889198A JP2889198A JP4068206B2 JP 4068206 B2 JP4068206 B2 JP 4068206B2 JP 02889198 A JP02889198 A JP 02889198A JP 2889198 A JP2889198 A JP 2889198A JP 4068206 B2 JP4068206 B2 JP 4068206B2
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Japan
Prior art keywords
light beam
detector
partially transparent
beam detector
movement
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JP02889198A
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English (en)
Japanese (ja)
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JPH10267750A (ja
JPH10267750A5 (enExample
Inventor
ビー．ジャクソン ウォーレン
エイチ．イム マーク
エー．ベルリン アンドリュー
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Xerox Corp
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Xerox Corp
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Publication date
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Accessory Devices And Overall Control Thereof (AREA)
  • Vibration Prevention Devices (AREA)
JP02889198A 1997-02-10 1998-02-10 モニタシステム、モニタ及び制御システムならびにプリンタシステム Expired - Lifetime JP4068206B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/799,559 US6055391A (en) 1997-02-10 1997-02-10 Vibration detection and control system for printers
US799559 1997-02-10

Publications (3)

Publication Number Publication Date
JPH10267750A JPH10267750A (ja) 1998-10-09
JPH10267750A5 JPH10267750A5 (enExample) 2005-08-25
JP4068206B2 true JP4068206B2 (ja) 2008-03-26

Family

ID=25176210

Family Applications (1)

Application Number Title Priority Date Filing Date
JP02889198A Expired - Lifetime JP4068206B2 (ja) 1997-02-10 1998-02-10 モニタシステム、モニタ及び制御システムならびにプリンタシステム

Country Status (4)

Country Link
US (1) US6055391A (enExample)
EP (1) EP0857944B1 (enExample)
JP (1) JP4068206B2 (enExample)
DE (1) DE69823401T2 (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5790255A (en) * 1997-02-10 1998-08-04 Xerox Corporation Transparent light beam detectors
US7791758B2 (en) * 2000-05-02 2010-09-07 Convolve, Inc. Vibration control technology and interface for computer printers and scanners
US6540129B2 (en) * 2000-07-14 2003-04-01 Spraytech, Ltd. Apparatus and method for manufacturing solder balls
KR100394588B1 (ko) * 2001-09-04 2003-08-14 광주과학기술원 광섬유 장주기격자 쌍을 이용한 비선형 광섬유의 공진형비선형성 측정방법
US20040107671A1 (en) * 2002-11-19 2004-06-10 Mcginnis Henry J. Apparatus and method for detecting deflection of a tower
EP1613934A4 (en) * 2003-04-03 2017-08-16 SRI International Method and apparatus for real-time vibration imaging
US7151603B2 (en) * 2004-04-30 2006-12-19 Samsung Electronics Co. Ltd. Overhead transparency clarity simulator
JP4773704B2 (ja) * 2004-10-29 2011-09-14 オーチス エレベータ カンパニー エレベータの制御装置
JP2008003496A (ja) * 2006-06-26 2008-01-10 Canon Inc 画像形成装置
US7684025B2 (en) * 2006-10-19 2010-03-23 Xerox Corporation Auto-adjust of imaging module mechanical setup
US8295983B2 (en) * 2008-11-10 2012-10-23 Silent Printer Holdings, Llc Apparatus and method for characterization and control of usage disturbances in a usage environment of printers and other dynamic systems
GB2516782B (en) * 2009-05-27 2015-06-17 Silixa Ltd Method of flow monitoring
ES2384766B1 (es) * 2010-12-10 2013-05-22 Fundación Imdea Nanociencia Fotodetector sensible a la posición, procedimiento de obtención del mismo y procedimiento de medida de la respuesta del fotodetector.
JP5834532B2 (ja) * 2011-06-23 2015-12-24 株式会社大林組 モード解析方法およびモード解析システム
JP5741313B2 (ja) * 2011-08-12 2015-07-01 株式会社大林組 モード解析方法、モード解析システム、変位計測方法、および変位計測システム
GB201212701D0 (en) * 2012-07-17 2012-08-29 Silixa Ltd Structure monitoring
JP6386776B2 (ja) * 2014-05-02 2018-09-05 キヤノン株式会社 記録装置及びその制御方法
US9931835B2 (en) 2016-03-08 2018-04-03 Océ Holdings B.V. Print head friction detection system
CN106595506B (zh) * 2016-11-30 2019-01-04 济南大学 一种水库坝体变形监测方法及系统
CN108613633B (zh) * 2018-04-23 2020-04-10 洛阳市鑫晟鑫建筑科技有限公司 一种钢结构建筑焊接主梁监测装置
CN109297429A (zh) * 2018-12-05 2019-02-01 河南送变电建设有限公司 一种用于检测gis设备抽真空过程中壳体变形的装置
JP7646319B2 (ja) * 2019-10-04 2025-03-17 キヤノン株式会社 画像形成装置
CN115950371B (zh) * 2023-02-27 2023-10-03 中国矿业大学 基于光学显微的一点应变测量方法

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2155233A1 (de) * 1971-11-06 1973-05-10 Horst Dipl Ing Meissner Verfahren und anordnung zur kontrolle von bauwerken
US4321464A (en) * 1978-06-08 1982-03-23 Westinghouse Electric Corp. Device for measuring vibration phase and amplitude
US4334775A (en) * 1980-04-03 1982-06-15 Western Electric Co., Inc. Method for dynamically determining the horizontal motion and twist of a microwave tower
DE3112026C2 (de) * 1981-03-26 1985-10-03 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Vorrichtung zur Messung der Lage und Bewegung eines schwingfähigen Körpers
US4432239A (en) * 1981-12-08 1984-02-21 Bykov Anatoly P Apparatus for measuring deformation
JPS59109805A (ja) * 1982-12-16 1984-06-25 Matsushita Electric Ind Co Ltd 位置検出装置
US4681450A (en) * 1985-06-21 1987-07-21 Research Corporation Photodetector arrangement for measuring the state of polarization of light
DE3720248A1 (de) * 1987-06-19 1989-01-05 Schenck Ag Carl Verfahren und anordnung zur messung von verformungen an proben oder pruefkoerpern in pruefmaschinen
US4870290A (en) * 1988-09-26 1989-09-26 Honeywell Inc. Object motion sensing and measuring apparatus using position sensing detectors
US5023845A (en) * 1988-10-31 1991-06-11 The United States Of America As Represented By The Secretary Of The Navy Embedded fiber optic beam displacement sensor
US5045684A (en) * 1990-02-28 1991-09-03 University Of Florida Light detection with waveguide having fully and partially reflecting sides
US5144370A (en) * 1991-10-31 1992-09-01 Xerox Corporation Apparatus for detecting the vibration of electrode wires and canceling the vibration thereof
US5253531A (en) * 1992-04-10 1993-10-19 Walker Dana A System and method for monitoring torsional vibrations and operating parameters of rotating shafts
DE4322144C2 (de) * 1992-07-03 1997-06-05 Murata Manufacturing Co Vibratoreinheit
DE69321405T2 (de) * 1992-07-10 1999-05-12 Sharp K.K., Osaka Dokumentengrösseerkennungssystem zu verwenden in einem Dokumentenleser
US5383368A (en) * 1992-11-16 1995-01-24 Southwest Research Institute Deflection sensor for robot links
US5321474A (en) * 1993-03-10 1994-06-14 Xerox Corporation Active damping of electrode wire vibration in scavengeless development in a xerographic apparatus
US5513533A (en) * 1993-04-15 1996-05-07 The United States Of America As Represented By The Secretary Of The Navy Detection of vibrational energy via optical interference patterns
US5418608A (en) * 1993-05-04 1995-05-23 Harbor Branch Oceanographic Institution Inc. Three dimensional mapping systems and methods
JPH0772767A (ja) * 1993-06-15 1995-03-17 Xerox Corp 対話型ユーザ支援システム
US5347132A (en) * 1993-07-30 1994-09-13 Wisconsin Alumni Research Foundation Position sensitive detector providing position information with enhanced reliability and performance
DE4340034C1 (de) * 1993-11-24 1995-02-02 Freudenberg Carl Fa Lagerung
US5530548A (en) * 1994-11-07 1996-06-25 Automotive Systems Laboratory, Inc. Calibratable optical distance sensing system and method
US5790255A (en) * 1997-02-10 1998-08-04 Xerox Corporation Transparent light beam detectors

Also Published As

Publication number Publication date
EP0857944B1 (en) 2004-04-28
EP0857944A1 (en) 1998-08-12
DE69823401D1 (de) 2004-06-03
DE69823401T2 (de) 2004-09-02
US6055391A (en) 2000-04-25
JPH10267750A (ja) 1998-10-09

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