JP4022978B2 - アナログ／ディジタル変換回路測定装置 - Google Patents

アナログ／ディジタル変換回路測定装置 Download PDF

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Publication number
JP4022978B2
JP4022978B2 JP06358498A JP6358498A JP4022978B2 JP 4022978 B2 JP4022978 B2 JP 4022978B2 JP 06358498 A JP06358498 A JP 06358498A JP 6358498 A JP6358498 A JP 6358498A JP 4022978 B2 JP4022978 B2 JP 4022978B2
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Japan
Prior art keywords
analog
digital
conversion circuit
digital code
digital conversion
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Expired - Fee Related
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JP06358498A
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Japanese (ja)
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JPH11261417A5 (enExample
JPH11261417A (ja
Inventor
裕治 源代
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Sony Corp
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Sony Corp
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Priority to JP06358498A priority Critical patent/JP4022978B2/ja
Publication of JPH11261417A publication Critical patent/JPH11261417A/ja
Publication of JPH11261417A5 publication Critical patent/JPH11261417A5/ja
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JP06358498A 1998-03-13 1998-03-13 アナログ／ディジタル変換回路測定装置 Expired - Fee Related JP4022978B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP06358498A JP4022978B2 (ja) 1998-03-13 1998-03-13 アナログ／ディジタル変換回路測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP06358498A JP4022978B2 (ja) 1998-03-13 1998-03-13 アナログ／ディジタル変換回路測定装置

Publications (3)

Publication Number Publication Date
JPH11261417A JPH11261417A (ja) 1999-09-24
JPH11261417A5 JPH11261417A5 (enExample) 2005-07-28
JP4022978B2 true JP4022978B2 (ja) 2007-12-19

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JP06358498A Expired - Fee Related JP4022978B2 (ja) 1998-03-13 1998-03-13 アナログ／ディジタル変換回路測定装置

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Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4649251B2 (ja) * 2005-03-23 2011-03-09 株式会社アドバンテスト 試験装置
JP5342486B2 (ja) * 2010-03-26 2013-11-13 シャープ株式会社 Ａ／ｄ変換器用テスト回路
JP6095955B2 (ja) * 2012-11-16 2017-03-15 ルネサスエレクトロニクス株式会社 測定方法、測定装置及び測定プログラム
JP6289692B2 (ja) * 2017-02-15 2018-03-07 ルネサスエレクトロニクス株式会社 測定方法
CN115473532A (zh) * 2022-11-01 2022-12-13 英彼森半导体(珠海)有限公司 一种adc的dnl性能测试系统及方法

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JPH11261417A (ja) 1999-09-24

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