JPH11261417A5 - - Google Patents

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Publication number
JPH11261417A5
JPH11261417A5 JP1998063584A JP6358498A JPH11261417A5 JP H11261417 A5 JPH11261417 A5 JP H11261417A5 JP 1998063584 A JP1998063584 A JP 1998063584A JP 6358498 A JP6358498 A JP 6358498A JP H11261417 A5 JPH11261417 A5 JP H11261417A5
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JP
Japan
Prior art keywords
analog
input
digital
code
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1998063584A
Other languages
English (en)
Japanese (ja)
Other versions
JPH11261417A (ja
JP4022978B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP06358498A priority Critical patent/JP4022978B2/ja
Priority claimed from JP06358498A external-priority patent/JP4022978B2/ja
Publication of JPH11261417A publication Critical patent/JPH11261417A/ja
Publication of JPH11261417A5 publication Critical patent/JPH11261417A5/ja
Application granted granted Critical
Publication of JP4022978B2 publication Critical patent/JP4022978B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP06358498A 1998-03-13 1998-03-13 アナログ／ディジタル変換回路測定装置 Expired - Fee Related JP4022978B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP06358498A JP4022978B2 (ja) 1998-03-13 1998-03-13 アナログ／ディジタル変換回路測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP06358498A JP4022978B2 (ja) 1998-03-13 1998-03-13 アナログ／ディジタル変換回路測定装置

Publications (3)

Publication Number Publication Date
JPH11261417A JPH11261417A (ja) 1999-09-24
JPH11261417A5 true JPH11261417A5 (enExample) 2005-07-28
JP4022978B2 JP4022978B2 (ja) 2007-12-19

Family

ID=13233474

Family Applications (1)

Application Number Title Priority Date Filing Date
JP06358498A Expired - Fee Related JP4022978B2 (ja) 1998-03-13 1998-03-13 アナログ／ディジタル変換回路測定装置

Country Status (1)

Country Link
JP (1) JP4022978B2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4649251B2 (ja) * 2005-03-23 2011-03-09 株式会社アドバンテスト 試験装置
JP5342486B2 (ja) * 2010-03-26 2013-11-13 シャープ株式会社 Ａ／ｄ変換器用テスト回路
JP6095955B2 (ja) * 2012-11-16 2017-03-15 ルネサスエレクトロニクス株式会社 測定方法、測定装置及び測定プログラム
JP6289692B2 (ja) * 2017-02-15 2018-03-07 ルネサスエレクトロニクス株式会社 測定方法
CN115473532A (zh) * 2022-11-01 2022-12-13 英彼森半导体(珠海)有限公司 一种adc的dnl性能测试系统及方法

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