JP3953716B2 - 基板洗浄装置 - Google Patents
基板洗浄装置 Download PDFInfo
- Publication number
- JP3953716B2 JP3953716B2 JP2000233251A JP2000233251A JP3953716B2 JP 3953716 B2 JP3953716 B2 JP 3953716B2 JP 2000233251 A JP2000233251 A JP 2000233251A JP 2000233251 A JP2000233251 A JP 2000233251A JP 3953716 B2 JP3953716 B2 JP 3953716B2
- Authority
- JP
- Japan
- Prior art keywords
- contact pressure
- substrate
- cleaning
- cleaned
- control panel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
- B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
- B08B1/34—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members rotating about an axis parallel to the surface
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
- B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
- B08B1/36—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members rotating about an axis orthogonal to the surface
Landscapes
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning In General (AREA)
- Cleaning By Liquid Or Steam (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000233251A JP3953716B2 (ja) | 2000-08-01 | 2000-08-01 | 基板洗浄装置 |
| US09/918,570 US20020029431A1 (en) | 2000-08-01 | 2001-08-01 | Substrate cleaning apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000233251A JP3953716B2 (ja) | 2000-08-01 | 2000-08-01 | 基板洗浄装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002050602A JP2002050602A (ja) | 2002-02-15 |
| JP2002050602A5 JP2002050602A5 (https=) | 2005-07-21 |
| JP3953716B2 true JP3953716B2 (ja) | 2007-08-08 |
Family
ID=18725796
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000233251A Expired - Lifetime JP3953716B2 (ja) | 2000-08-01 | 2000-08-01 | 基板洗浄装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US20020029431A1 (https=) |
| JP (1) | JP3953716B2 (https=) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE60033811T2 (de) * | 2000-09-08 | 2007-11-15 | Qimonda Dresden Gmbh & Co. Ohg | Wafer-Reinigungsvorrichtung |
| US7007333B1 (en) * | 2002-06-28 | 2006-03-07 | Lam Research Corporation | System and method for a combined contact and non-contact wafer cleaning module |
| US7743449B2 (en) * | 2002-06-28 | 2010-06-29 | Lam Research Corporation | System and method for a combined contact and non-contact wafer cleaning module |
| JP4152853B2 (ja) * | 2003-09-30 | 2008-09-17 | 株式会社 日立ディスプレイズ | 表面処理装置、および、液晶表示装置の製造方法 |
| US8608858B2 (en) * | 2004-09-28 | 2013-12-17 | Ebara Corporation | Substrate cleaning apparatus and method for determining timing of replacement of cleaning member |
| US7823241B2 (en) * | 2007-03-22 | 2010-11-02 | Taiwan Semiconductor Manufacturing Co., Ltd. | System for cleaning a wafer |
| US8356376B2 (en) | 2008-06-18 | 2013-01-22 | Tokyo Electron Limited | Substrate cleaning apparatus, substrate cleaning method, and storage medium |
| JP4976342B2 (ja) * | 2008-06-18 | 2012-07-18 | 東京エレクトロン株式会社 | 基板洗浄装置および基板洗浄方法、ならびに記憶媒体 |
| JP5229702B2 (ja) * | 2008-12-11 | 2013-07-03 | 株式会社レヨーン工業 | クリーンローラ装置 |
| DE102009014006A1 (de) * | 2009-03-19 | 2010-09-23 | Sms Siemag Aktiengesellschaft | Verfahren und Vorrichtung zur Reinigung eines Metallbandes |
| JP5535687B2 (ja) * | 2010-03-01 | 2014-07-02 | 株式会社荏原製作所 | 基板洗浄方法及び基板洗浄装置 |
| JP2012138498A (ja) * | 2010-12-27 | 2012-07-19 | Toshiba Corp | 洗浄方法 |
| JP5937456B2 (ja) * | 2012-08-07 | 2016-06-22 | 東京エレクトロン株式会社 | 基板洗浄装置および基板洗浄ユニット |
| JP5878441B2 (ja) * | 2012-08-20 | 2016-03-08 | 株式会社荏原製作所 | 基板洗浄装置及び基板処理装置 |
| JP6262983B2 (ja) | 2012-10-25 | 2018-01-17 | 株式会社荏原製作所 | 基板洗浄装置及び基板洗浄方法 |
| CN103953209B (zh) * | 2012-12-12 | 2017-06-09 | 保利集团澳门有限公司 | 水池系统及建造使用方法 |
| US20140310895A1 (en) * | 2013-04-19 | 2014-10-23 | Applied Materials, Inc. | Scrubber brush force control assemblies, apparatus and methods for chemical mechanical polishing |
| JP6279276B2 (ja) * | 2013-10-03 | 2018-02-14 | 株式会社荏原製作所 | 基板洗浄装置及び基板処理装置 |
| US10141205B2 (en) * | 2014-09-26 | 2018-11-27 | Acm Research (Shanghai) Inc. | Apparatus and method for cleaning semiconductor wafer |
| JP6646460B2 (ja) * | 2016-02-15 | 2020-02-14 | 株式会社荏原製作所 | 基板洗浄装置及び基板処理装置 |
| JP6767834B2 (ja) | 2016-09-29 | 2020-10-14 | 株式会社荏原製作所 | 基板洗浄装置及び基板処理装置 |
| JP6758247B2 (ja) * | 2017-05-10 | 2020-09-23 | 株式会社荏原製作所 | 洗浄装置および基板処理装置、洗浄装置のメンテナンス方法、並びにプログラム |
| JP6974067B2 (ja) * | 2017-08-17 | 2021-12-01 | 株式会社荏原製作所 | 基板を研磨する方法および装置 |
| JP7079164B2 (ja) | 2018-07-06 | 2022-06-01 | 株式会社荏原製作所 | 基板洗浄装置および基板洗浄方法 |
| JP7653785B2 (ja) * | 2020-12-28 | 2025-03-31 | 株式会社Screenホールディングス | 基板洗浄装置および基板洗浄方法 |
| CN115882781A (zh) * | 2022-12-13 | 2023-03-31 | 华能大理风力发电有限公司洱源分公司 | 一种基于力矩传感的光伏板清洗控制方法及系统 |
| CN116984758A (zh) * | 2023-08-30 | 2023-11-03 | 宁波锦世弘机械设备有限公司 | 一种玻璃打孔倒角一体机 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3328426B2 (ja) * | 1994-05-12 | 2002-09-24 | 東京エレクトロン株式会社 | 洗浄装置 |
-
2000
- 2000-08-01 JP JP2000233251A patent/JP3953716B2/ja not_active Expired - Lifetime
-
2001
- 2001-08-01 US US09/918,570 patent/US20020029431A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| US20020029431A1 (en) | 2002-03-14 |
| JP2002050602A (ja) | 2002-02-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP3953716B2 (ja) | 基板洗浄装置 | |
| JP3328426B2 (ja) | 洗浄装置 | |
| KR102401524B1 (ko) | 기판 세정 장치 및 기판 세정 장치에 의해 실행되는 방법 | |
| US6106369A (en) | Polishing system | |
| JP3540524B2 (ja) | 基板処理装置および基板処理方法 | |
| JP6758247B2 (ja) | 洗浄装置および基板処理装置、洗浄装置のメンテナンス方法、並びにプログラム | |
| JP6767834B2 (ja) | 基板洗浄装置及び基板処理装置 | |
| US6491760B2 (en) | Scrub washing method | |
| TW202031424A (zh) | 研削裝置 | |
| US12033847B2 (en) | Cleaning module, substrate processing apparatus including cleaning module, and cleaning method | |
| JP2001038614A (ja) | 研磨装置 | |
| US6595220B2 (en) | Apparatus for conveying a workpiece | |
| US6136138A (en) | Method and apparatus for chemical mechanical polishing of a semiconductor wafer | |
| JP3644805B2 (ja) | 基板洗浄装置 | |
| JP2002313765A (ja) | ブラシ洗浄装置及びその制御方法 | |
| JP2000288928A (ja) | 研磨盤の制御方法および研磨盤 | |
| JP3615724B2 (ja) | ウェハクリーニング装置 | |
| JPH10146751A (ja) | 化学機械研磨装置 | |
| JP2007301690A (ja) | 研磨装置 | |
| JP3172358B2 (ja) | 基板洗浄装置 | |
| JPH08243518A (ja) | 回転式基板洗浄装置 | |
| JPH1029153A (ja) | 半導体ウェーハ研磨装置 | |
| JPH10189512A (ja) | 基板洗浄装置 | |
| JP2020150272A (ja) | 基板洗浄装置および基板洗浄装置で実行される方法 | |
| KR920010691B1 (ko) | 접촉완충장치 부착 세정장치 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20041209 Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20041209 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20041209 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20061220 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20070206 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20070329 Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070329 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20070424 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20070425 |
|
| R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 Ref document number: 3953716 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110511 Year of fee payment: 4 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110511 Year of fee payment: 4 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120511 Year of fee payment: 5 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130511 Year of fee payment: 6 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140511 Year of fee payment: 7 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |