JP3850403B2 - 粒子検出装置 - Google Patents
粒子検出装置 Download PDFInfo
- Publication number
- JP3850403B2 JP3850403B2 JP2003352133A JP2003352133A JP3850403B2 JP 3850403 B2 JP3850403 B2 JP 3850403B2 JP 2003352133 A JP2003352133 A JP 2003352133A JP 2003352133 A JP2003352133 A JP 2003352133A JP 3850403 B2 JP3850403 B2 JP 3850403B2
- Authority
- JP
- Japan
- Prior art keywords
- particle
- particles
- classifier
- concentration
- particle detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000002245 particle Substances 0.000 title claims description 124
- 238000001514 detection method Methods 0.000 claims description 27
- 239000012530 fluid Substances 0.000 claims description 13
- 230000001678 irradiating effect Effects 0.000 claims description 3
- 230000010354 integration Effects 0.000 description 5
- 238000000149 argon plasma sintering Methods 0.000 description 4
- 230000005494 condensation Effects 0.000 description 4
- 238000009833 condensation Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000010419 fine particle Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 239000011859 microparticle Substances 0.000 description 4
- 230000007613 environmental effect Effects 0.000 description 3
- 239000000284 extract Substances 0.000 description 2
- 239000013618 particulate matter Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 239000011882 ultra-fine particle Substances 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002356 laser light scattering Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
Claims (1)
- 浮遊粒子の粒子濃度を測定する粒子検出装置であって、粒子を浮遊させた状態で、ある大きさの範囲の粒子を取り出す分級器と、この分級器により取り出され、粒子検出領域に導かれた複数の粒子に同時に光を照射してそれらの粒子が発する散乱光を検出する粒子検出部と、この粒子検出部の出力信号から粒子濃度を求める演算処理部からなり、前記分級器は、粒子を複数段の大きさの範囲に分ける分級手段を備えて前記複数段をある時間間隔で切り替え、前記演算処理部は、前記粒子検出部のアナログ出力信号を所定時間だけ積分し、この積分値を前記所定時間の間に粒子検出領域を通過した試料流体の体積で除して前記分級器の各段毎に粒子濃度を求めることを特徴とする粒子検出装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003352133A JP3850403B2 (ja) | 2003-10-10 | 2003-10-10 | 粒子検出装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003352133A JP3850403B2 (ja) | 2003-10-10 | 2003-10-10 | 粒子検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005114664A JP2005114664A (ja) | 2005-04-28 |
JP3850403B2 true JP3850403B2 (ja) | 2006-11-29 |
Family
ID=34543164
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2003352133A Expired - Fee Related JP3850403B2 (ja) | 2003-10-10 | 2003-10-10 | 粒子検出装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3850403B2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2018516360A (ja) * | 2015-04-17 | 2018-06-21 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 埃の処理 |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007071794A (ja) * | 2005-09-09 | 2007-03-22 | Rion Co Ltd | 粒子検出器 |
JP4792611B2 (ja) * | 2006-02-01 | 2011-10-12 | リオン株式会社 | 粒子計測装置 |
GB2473048A (en) * | 2009-08-28 | 2011-03-02 | Naneum Ltd | Detecting and counting carbon nanotubes and separating larger particles |
JP5326120B2 (ja) * | 2009-10-28 | 2013-10-30 | 柴田科学株式会社 | 流体中の粒子質量濃度測定装置及びその測定方法並びに流体中の粒子密度測定装置及びその測定方法 |
JP5950319B2 (ja) | 2010-06-15 | 2016-07-13 | 新日本空調株式会社 | パーティクル濃度測定装置 |
JP5780584B2 (ja) * | 2011-03-11 | 2015-09-16 | セイコーインスツル株式会社 | パーティクルカウンタ |
JP6191477B2 (ja) * | 2014-01-24 | 2017-09-06 | 株式会社島津製作所 | 粒子径測定装置及び粒子径測定方法 |
KR102222298B1 (ko) * | 2019-01-03 | 2021-03-04 | 주식회사 리트코 | 미립자 측정이 가능한 시스템 |
KR102621578B1 (ko) * | 2021-04-13 | 2024-01-05 | 서강대학교 산학협력단 | 입자의 밀도 측정 장치 및 방법 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01210849A (ja) * | 1988-02-18 | 1989-08-24 | Dan Kagaku:Kk | 光散乱式粒子計数器 |
JPH02167444A (ja) * | 1988-09-28 | 1990-06-27 | Mitsubishi Kasei Corp | コークス粒度の測定方法 |
JPH0758254B2 (ja) * | 1989-04-18 | 1995-06-21 | 財団法人電力中央研究所 | 粉粒体の粒度又は濃度と粒度を測定する測定装置 |
JPH0658315B2 (ja) * | 1990-07-04 | 1994-08-03 | 工業技術院長 | 排ガス中のダスト又はミストの粒径分布及び濃度の連続測定装置 |
JPH0692929B2 (ja) * | 1991-03-26 | 1994-11-16 | 工業技術院長 | 気中微小粒子特性測定装置 |
JPH05143810A (ja) * | 1991-11-22 | 1993-06-11 | Mitsubishi Electric Corp | ダスト計数装置 |
JP2810311B2 (ja) * | 1993-12-28 | 1998-10-15 | 三菱原子燃料株式会社 | 空気中の粒子状放射性物質の濃度測定方法及びその装置 |
JP3532274B2 (ja) * | 1994-11-30 | 2004-05-31 | ミドリ安全株式会社 | 粒子検出装置 |
JP3672158B2 (ja) * | 1997-03-10 | 2005-07-13 | 富士電機システムズ株式会社 | 濁度の測定方法および装置 |
JP3574045B2 (ja) * | 2000-05-31 | 2004-10-06 | 紀本電子工業株式会社 | 浮遊粒子状物質の連続測定装置 |
JP2002188992A (ja) * | 2000-12-22 | 2002-07-05 | Ohbayashi Corp | 粉塵濃度計 |
JP2002257709A (ja) * | 2001-03-06 | 2002-09-11 | Yokogawa Electric Corp | 浮遊物質濃度粒度測定装置 |
JP2003004624A (ja) * | 2001-06-18 | 2003-01-08 | Rion Co Ltd | 粒子検出装置 |
-
2003
- 2003-10-10 JP JP2003352133A patent/JP3850403B2/ja not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2018516360A (ja) * | 2015-04-17 | 2018-06-21 | コーニンクレッカ フィリップス エヌ ヴェKoninklijke Philips N.V. | 埃の処理 |
Also Published As
Publication number | Publication date |
---|---|
JP2005114664A (ja) | 2005-04-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5112312B2 (ja) | 病原体及び微粒子検出システム並びに検出法 | |
US7053783B2 (en) | Pathogen detector system and method | |
JP3850403B2 (ja) | 粒子検出装置 | |
KR101418295B1 (ko) | 크기/형광의 동시적 측정에 의한 병원체 검출 | |
US10006851B2 (en) | Light scattering measurements using simultaneous detection | |
JP5533055B2 (ja) | 光学的測定装置及び光学的測定方法 | |
US20140152978A1 (en) | Optical Detection and Analysis of Particles | |
JP2001502417A (ja) | 空気で運ばれる有害な繊維の検出 | |
JP2005502044A (ja) | 粒子分布の特性の測定方法 | |
MX2012014269A (es) | Metodo y dispositivo para detectar material biologico. | |
JPH0464036A (ja) | 排ガス中のダスト又はミストの粒径分布及び濃度の連続測定装置 | |
JP2012189483A (ja) | 粒子測定装置 | |
JP6238272B2 (ja) | 生物粒子計数器及び生物粒子計数方法 | |
KR890016374A (ko) | 입자상 물질의 분석방법과 장치 및 그 장치의 응용 시스템 | |
KR100503020B1 (ko) | 탁도의측정방법및장치 | |
EP0008874B1 (en) | Method and apparatus for discriminating red blood cells from platelets | |
JPH10311784A (ja) | 濁度の測定方法および装置 | |
JP3504030B2 (ja) | 粒子判定基準の決定方法およびその装置並びにその判定基準を用いた粒子分析装置 | |
US10942106B2 (en) | Particle characterization apparatus and method | |
JP2001183284A (ja) | 花粉分別方法及び装置並びに花粉飛散数計測方法及び装置 | |
JP2002116134A (ja) | 浮遊粒子状物質の測定装置 | |
EP3392644A1 (en) | Particle characterization apparatus and method | |
AU742800B2 (en) | Improved device for measuring the concentration of airborne fibers | |
JP2015206669A (ja) | 捕集装置、検出装置、清浄装置、捕集方法、検出方法、および、清浄方法 | |
JP4716055B2 (ja) | レーザ回折・散乱式粒度分布測定装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050719 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20060414 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20060425 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060616 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20060829 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20060829 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 3850403 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100908 Year of fee payment: 4 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110908 Year of fee payment: 5 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110908 Year of fee payment: 5 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120908 Year of fee payment: 6 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120908 Year of fee payment: 6 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130908 Year of fee payment: 7 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |