JP3775565B2 - ピンホール検査機 - Google Patents
ピンホール検査機 Download PDFInfo
- Publication number
- JP3775565B2 JP3775565B2 JP2000128578A JP2000128578A JP3775565B2 JP 3775565 B2 JP3775565 B2 JP 3775565B2 JP 2000128578 A JP2000128578 A JP 2000128578A JP 2000128578 A JP2000128578 A JP 2000128578A JP 3775565 B2 JP3775565 B2 JP 3775565B2
- Authority
- JP
- Japan
- Prior art keywords
- inspection machine
- specimen
- pinhole inspection
- packaging
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000007689 inspection Methods 0.000 title claims description 23
- 238000004806 packaging method and process Methods 0.000 claims description 6
- 238000007789 sealing Methods 0.000 claims description 5
- 239000012530 fluid Substances 0.000 claims description 3
- 239000011347 resin Substances 0.000 claims description 3
- 229920005989 resin Polymers 0.000 claims description 3
- 239000011810 insulating material Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 239000007788 liquid Substances 0.000 description 3
- 244000046052 Phaseolus vulgaris Species 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 235000010627 Phaseolus vulgaris Nutrition 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 239000002537 cosmetic Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 230000007717 exclusion Effects 0.000 description 1
- 235000013305 food Nutrition 0.000 description 1
- 235000012907 honey Nutrition 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Images
Landscapes
- Examining Or Testing Airtightness (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000128578A JP3775565B2 (ja) | 2000-03-27 | 2000-03-27 | ピンホール検査機 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000128578A JP3775565B2 (ja) | 2000-03-27 | 2000-03-27 | ピンホール検査機 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001272301A JP2001272301A (ja) | 2001-10-05 |
| JP2001272301A5 JP2001272301A5 (cg-RX-API-DMAC10.html) | 2005-04-07 |
| JP3775565B2 true JP3775565B2 (ja) | 2006-05-17 |
Family
ID=18637997
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000128578A Expired - Fee Related JP3775565B2 (ja) | 2000-03-27 | 2000-03-27 | ピンホール検査機 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3775565B2 (cg-RX-API-DMAC10.html) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4825954B2 (ja) * | 2001-02-19 | 2011-11-30 | 日新電子工業株式会社 | シール不良検査機 |
-
2000
- 2000-03-27 JP JP2000128578A patent/JP3775565B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2001272301A (ja) | 2001-10-05 |
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