JP3738844B2 - 真円度測定機 - Google Patents

真円度測定機 Download PDF

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Publication number
JP3738844B2
JP3738844B2 JP2002258742A JP2002258742A JP3738844B2 JP 3738844 B2 JP3738844 B2 JP 3738844B2 JP 2002258742 A JP2002258742 A JP 2002258742A JP 2002258742 A JP2002258742 A JP 2002258742A JP 3738844 B2 JP3738844 B2 JP 3738844B2
Authority
JP
Japan
Prior art keywords
measured
eccentricity
measurement
inclination
measuring machine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2002258742A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004093529A (ja
Inventor
昇 菊地
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority to JP2002258742A priority Critical patent/JP3738844B2/ja
Priority to GB0320565A priority patent/GB2393790B/en
Priority to DE10340851.7A priority patent/DE10340851B4/de
Publication of JP2004093529A publication Critical patent/JP2004093529A/ja
Application granted granted Critical
Publication of JP3738844B2 publication Critical patent/JP3738844B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G01B5/201—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures for measuring roundness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G01B7/282—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures for measuring roundness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
JP2002258742A 2002-09-04 2002-09-04 真円度測定機 Expired - Fee Related JP3738844B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2002258742A JP3738844B2 (ja) 2002-09-04 2002-09-04 真円度測定機
GB0320565A GB2393790B (en) 2002-09-04 2003-09-02 Roundness measurement apparatus
DE10340851.7A DE10340851B4 (de) 2002-09-04 2003-09-04 Rundheitsmessvorrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002258742A JP3738844B2 (ja) 2002-09-04 2002-09-04 真円度測定機

Publications (2)

Publication Number Publication Date
JP2004093529A JP2004093529A (ja) 2004-03-25
JP3738844B2 true JP3738844B2 (ja) 2006-01-25

Family

ID=28786861

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002258742A Expired - Fee Related JP3738844B2 (ja) 2002-09-04 2002-09-04 真円度測定機

Country Status (3)

Country Link
JP (1) JP3738844B2 (de)
DE (1) DE10340851B4 (de)
GB (1) GB2393790B (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007066746A1 (ja) * 2005-12-05 2007-06-14 Tokyo Seimitsu Co., Ltd. 真円度測定装置及び先端子良否判定方法
JP2008292199A (ja) * 2007-05-22 2008-12-04 Mitsutoyo Corp 真円度測定装置、真円度測定方法、及び真円度測定プログラム
JP5292564B2 (ja) * 2009-05-18 2013-09-18 株式会社ミツトヨ 形状測定装置、その校正方法、及び校正プログラム
US9347761B2 (en) 2013-06-06 2016-05-24 Cedarflat Precision Inc. Two-way roundness device
DE102016110453A1 (de) 2016-06-07 2017-12-07 Carl Mahr Holding Gmbh Messgerät und Verfahren zur Justage der Lage eines rotationssymmetrischen Werkstücks
CN109238212B (zh) * 2018-07-13 2020-04-21 进峰（江门）五金制造有限公司 一种端盖同轴度自动检测仪

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB861323A (en) * 1956-06-12 1961-02-15 Rank Precision Ind Ltd Improvements in and relating to electronic gauging systems
DE2654025C2 (de) * 1976-11-27 1986-05-07 Dr.-Ing. Perthen Gmbh, 3000 Hannover Verfahren und Vorrichtung zum Zentrieren eines Werkstückes auf einem Rundheitsprüfgerät
DE3123489A1 (de) * 1981-06-13 1982-12-30 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Verfahren zur messung der rundheitsabweichungen von rotationskoerpern und einrichtungen zur durchfuehrung des verfahrens
EP0240150B1 (de) * 1986-03-04 1991-04-17 Rank Taylor Hobson Limited Positionskontrolle eines zu bearbeitenden Werkstücks
GB8605325D0 (en) * 1986-03-04 1986-04-09 Rank Taylor Hobson Ltd Workpiece position control
JPH04329306A (ja) * 1991-05-02 1992-11-18 Tokyo Seimitsu Co Ltd 真円度測定機の心出し方法及びその装置
JPH0611337A (ja) * 1992-06-25 1994-01-21 Tokyo Seimitsu Co Ltd 真円度測定機の傾き補正方法及び装置
JPH0693902A (ja) * 1992-09-10 1994-04-05 Toyota Motor Corp 筒内噴射式火花点火内燃機関
US6526364B2 (en) * 2000-01-19 2003-02-25 Mitutoyo Corporation Method and apparatus for measuring roundness

Also Published As

Publication number Publication date
GB2393790A (en) 2004-04-07
GB0320565D0 (en) 2003-10-01
GB2393790B (en) 2007-04-11
JP2004093529A (ja) 2004-03-25
DE10340851A1 (de) 2004-03-18
DE10340851B4 (de) 2016-01-14

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