GB2393790B - Roundness measurement apparatus - Google Patents

Roundness measurement apparatus

Info

Publication number
GB2393790B
GB2393790B GB0320565A GB0320565A GB2393790B GB 2393790 B GB2393790 B GB 2393790B GB 0320565 A GB0320565 A GB 0320565A GB 0320565 A GB0320565 A GB 0320565A GB 2393790 B GB2393790 B GB 2393790B
Authority
GB
United Kingdom
Prior art keywords
measurement apparatus
roundness measurement
roundness
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0320565A
Other languages
English (en)
Other versions
GB2393790A (en
GB0320565D0 (en
Inventor
Noboru Kikuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Publication of GB0320565D0 publication Critical patent/GB0320565D0/en
Publication of GB2393790A publication Critical patent/GB2393790A/en
Application granted granted Critical
Publication of GB2393790B publication Critical patent/GB2393790B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G01B5/201—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures for measuring roundness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • G01B7/282—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures for measuring roundness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
GB0320565A 2002-09-04 2003-09-02 Roundness measurement apparatus Expired - Fee Related GB2393790B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002258742A JP3738844B2 (ja) 2002-09-04 2002-09-04 真円度測定機

Publications (3)

Publication Number Publication Date
GB0320565D0 GB0320565D0 (en) 2003-10-01
GB2393790A GB2393790A (en) 2004-04-07
GB2393790B true GB2393790B (en) 2007-04-11

Family

ID=28786861

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0320565A Expired - Fee Related GB2393790B (en) 2002-09-04 2003-09-02 Roundness measurement apparatus

Country Status (3)

Country Link
JP (1) JP3738844B2 (de)
DE (1) DE10340851B4 (de)
GB (1) GB2393790B (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090259435A1 (en) * 2005-12-05 2009-10-15 Masato Enomoto Roundness Measuring Instrument and Method of Determining Quality of Tip Head
JP2008292199A (ja) 2007-05-22 2008-12-04 Mitsutoyo Corp 真円度測定装置、真円度測定方法、及び真円度測定プログラム
JP5292564B2 (ja) * 2009-05-18 2013-09-18 株式会社ミツトヨ 形状測定装置、その校正方法、及び校正プログラム
US9347761B2 (en) 2013-06-06 2016-05-24 Cedarflat Precision Inc. Two-way roundness device
DE102016110453A1 (de) 2016-06-07 2017-12-07 Carl Mahr Holding Gmbh Messgerät und Verfahren zur Justage der Lage eines rotationssymmetrischen Werkstücks
CN109238212B (zh) * 2018-07-13 2020-04-21 进峰（江门）五金制造有限公司 一种端盖同轴度自动检测仪

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB861323A (en) * 1956-06-12 1961-02-15 Rank Precision Ind Ltd Improvements in and relating to electronic gauging systems
EP0068082A2 (de) * 1981-06-13 1983-01-05 Dr. Johannes Heidenhain GmbH Verfahren zur Messung der Rundheitsabweichungen von Rotations-körpern
JPH04329306A (ja) * 1991-05-02 1992-11-18 Tokyo Seimitsu Co Ltd 真円度測定機の心出し方法及びその装置
JPH0611337A (ja) * 1992-06-25 1994-01-21 Tokyo Seimitsu Co Ltd 真円度測定機の傾き補正方法及び装置
JPH0693902A (ja) * 1992-09-10 1994-04-05 Toyota Motor Corp 筒内噴射式火花点火内燃機関
US20010008994A1 (en) * 2000-01-19 2001-07-19 Mitutoyo Corporation Method and apparatus for measuring roundness

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2654025C2 (de) * 1976-11-27 1986-05-07 Dr.-Ing. Perthen Gmbh, 3000 Hannover Verfahren und Vorrichtung zum Zentrieren eines Werkstückes auf einem Rundheitsprüfgerät
GB8605325D0 (en) * 1986-03-04 1986-04-09 Rank Taylor Hobson Ltd Workpiece position control
DE3769350D1 (de) * 1986-03-04 1991-05-23 Rank Taylor Hobson Ltd Positionskontrolle eines zu bearbeitenden werkstuecks.

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB861323A (en) * 1956-06-12 1961-02-15 Rank Precision Ind Ltd Improvements in and relating to electronic gauging systems
EP0068082A2 (de) * 1981-06-13 1983-01-05 Dr. Johannes Heidenhain GmbH Verfahren zur Messung der Rundheitsabweichungen von Rotations-körpern
JPH04329306A (ja) * 1991-05-02 1992-11-18 Tokyo Seimitsu Co Ltd 真円度測定機の心出し方法及びその装置
JPH0611337A (ja) * 1992-06-25 1994-01-21 Tokyo Seimitsu Co Ltd 真円度測定機の傾き補正方法及び装置
JPH0693902A (ja) * 1992-09-10 1994-04-05 Toyota Motor Corp 筒内噴射式火花点火内燃機関
US20010008994A1 (en) * 2000-01-19 2001-07-19 Mitutoyo Corporation Method and apparatus for measuring roundness

Also Published As

Publication number Publication date
JP2004093529A (ja) 2004-03-25
JP3738844B2 (ja) 2006-01-25
GB2393790A (en) 2004-04-07
GB0320565D0 (en) 2003-10-01
DE10340851B4 (de) 2016-01-14
DE10340851A1 (de) 2004-03-18

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Legal Events

Date Code Title Description
746 Register noted 'licences of right' (sect. 46/1977)

Effective date: 20070817

PCNP Patent ceased through non-payment of renewal fee

Effective date: 20150902