JP3715189B2 - 位相シフトマスク - Google Patents

位相シフトマスク Download PDF

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Publication number
JP3715189B2
JP3715189B2 JP2000287510A JP2000287510A JP3715189B2 JP 3715189 B2 JP3715189 B2 JP 3715189B2 JP 2000287510 A JP2000287510 A JP 2000287510A JP 2000287510 A JP2000287510 A JP 2000287510A JP 3715189 B2 JP3715189 B2 JP 3715189B2
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JP
Japan
Prior art keywords
film
mask
resist
pattern
phase shift
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2000287510A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002099071A (ja
JP2002099071A5 (https=
Inventor
稔彦 田中
昇雄 長谷川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Technology Corp
Original Assignee
Renesas Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renesas Technology Corp filed Critical Renesas Technology Corp
Priority to JP2000287510A priority Critical patent/JP3715189B2/ja
Priority to TW090102774A priority patent/TW535210B/zh
Priority to US09/800,501 priority patent/US6558855B2/en
Priority to US09/809,094 priority patent/US6576379B2/en
Priority to KR1020010013883A priority patent/KR100706731B1/ko
Publication of JP2002099071A publication Critical patent/JP2002099071A/ja
Publication of JP2002099071A5 publication Critical patent/JP2002099071A5/ja
Application granted granted Critical
Publication of JP3715189B2 publication Critical patent/JP3715189B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/26—Phase shift masks [PSM]; PSM blanks; Preparation thereof
    • G03F1/32—Attenuating PSM [att-PSM], e.g. halftone PSM or PSM having semi-transparent phase shift portion; Preparation thereof
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
    • G03F1/42—Alignment or registration features, e.g. alignment marks on the mask substrates
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
    • G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
    • G03F1/84—Inspecting

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
JP2000287510A 2000-09-21 2000-09-21 位相シフトマスク Expired - Fee Related JP3715189B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2000287510A JP3715189B2 (ja) 2000-09-21 2000-09-21 位相シフトマスク
TW090102774A TW535210B (en) 2000-09-21 2001-02-08 Phase shift mask and its manufacturing method
US09/800,501 US6558855B2 (en) 2000-09-21 2001-03-08 Phase shift mask and manufacturing the same
US09/809,094 US6576379B2 (en) 2000-09-21 2001-03-16 Phaseshift mask and manufacturing the same
KR1020010013883A KR100706731B1 (ko) 2000-09-21 2001-03-17 위상 시프트 마스크

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000287510A JP3715189B2 (ja) 2000-09-21 2000-09-21 位相シフトマスク

Publications (3)

Publication Number Publication Date
JP2002099071A JP2002099071A (ja) 2002-04-05
JP2002099071A5 JP2002099071A5 (https=) 2004-12-16
JP3715189B2 true JP3715189B2 (ja) 2005-11-09

Family

ID=18771241

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000287510A Expired - Fee Related JP3715189B2 (ja) 2000-09-21 2000-09-21 位相シフトマスク

Country Status (4)

Country Link
US (2) US6558855B2 (https=)
JP (1) JP3715189B2 (https=)
KR (1) KR100706731B1 (https=)
TW (1) TW535210B (https=)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW541605B (en) * 2000-07-07 2003-07-11 Hitachi Ltd Fabrication method of semiconductor integrated circuit device
KR100877708B1 (ko) * 2001-03-29 2009-01-07 다이니폰 인사츠 가부시키가이샤 패턴 형성체의 제조 방법 및 그것에 사용하는 포토마스크
JP4053263B2 (ja) * 2001-08-17 2008-02-27 株式会社ルネサステクノロジ 半導体装置の製造方法
JP2003110082A (ja) * 2001-09-28 2003-04-11 Mitsubishi Electric Corp リードフレーム、半導体装置および半導体チップの載置位置確認方法
CN1653392A (zh) * 2002-01-24 2005-08-10 杜邦光掩公司 光掩模及其制备方法
GB0215243D0 (en) * 2002-07-02 2002-08-14 Koninkl Philips Electronics Nv Mask and manufacturing method using mask
US7205074B2 (en) * 2002-12-31 2007-04-17 Intel Corporation Venting of pellicle cavity for a mask
JP2005134666A (ja) * 2003-10-30 2005-05-26 Hoya Corp フォトマスク及び映像デバイスの製造方法
US7459095B2 (en) * 2004-10-21 2008-12-02 Corning Incorporated Opaque chrome coating suitable for etching
JP4450743B2 (ja) * 2005-02-08 2010-04-14 富士通マイクロエレクトロニクス株式会社 フォトマスク、フォトマスクの製造方法及び半導体装置の製造方法
JP4587837B2 (ja) * 2005-02-18 2010-11-24 Ｈｏｙａ株式会社 グレートーンマスクの製造方法及びグレートーンマスク
JP4843304B2 (ja) * 2005-12-14 2011-12-21 富士通セミコンダクター株式会社 フォトマスクの製造方法、デバイスの製造方法、及び、フォトマスクのモニタ方法
JP4936515B2 (ja) * 2006-05-18 2012-05-23 Ｈｏｙａ株式会社 フォトマスクの製造方法、およびハーフトーン型位相シフトマスクの製造方法
KR20100101916A (ko) * 2009-03-10 2010-09-20 주식회사 하이닉스반도체 형광층을 이용한 위상반전마스크 제조방법
KR102077337B1 (ko) * 2015-04-17 2020-02-13 에스케이하이닉스 주식회사 프리-얼라인먼트 키를 갖는 포토마스크 및 이를 포함하는 포토리소그라피 장비

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6132908A (en) * 1990-10-26 2000-10-17 Nikon Corporation Photo mask and exposure method using the same
JPH05181257A (ja) 1992-01-06 1993-07-23 Sharp Corp 光露光用マスク
JP2864915B2 (ja) 1992-12-07 1999-03-08 株式会社日立製作所 半導体装置の製造方法
US5413884A (en) * 1992-12-14 1995-05-09 American Telephone And Telegraph Company Grating fabrication using electron beam lithography
JPH08152716A (ja) * 1994-11-28 1996-06-11 Mitsubishi Electric Corp ネガ型レジスト及びレジストパターンの形成方法
US5987160A (en) * 1997-04-02 1999-11-16 Delco Electronics Corporation Method and apparatus for inspecting a photoresist material by inducing and detecting fluorescence of the photoresist material

Also Published As

Publication number Publication date
US6558855B2 (en) 2003-05-06
KR100706731B1 (ko) 2007-04-13
US6576379B2 (en) 2003-06-10
KR20020023091A (ko) 2002-03-28
TW535210B (en) 2003-06-01
JP2002099071A (ja) 2002-04-05
US20020053748A1 (en) 2002-05-09
US20020034694A1 (en) 2002-03-21

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