JP3642172B2 - 胴割れ粒判別方法及び胴割れ粒選別装置 - Google Patents

胴割れ粒判別方法及び胴割れ粒選別装置 Download PDF

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Publication number
JP3642172B2
JP3642172B2 JP03368298A JP3368298A JP3642172B2 JP 3642172 B2 JP3642172 B2 JP 3642172B2 JP 03368298 A JP03368298 A JP 03368298A JP 3368298 A JP3368298 A JP 3368298A JP 3642172 B2 JP3642172 B2 JP 3642172B2
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Prior art keywords
grain
level difference
signal
light
grains
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Japanese (ja)
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JPH11218495A5 (enExample
JPH11218495A (ja
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覺 佐竹
正博 恵木
隆文 伊藤
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Satake Corp
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Satake Corp
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JP03368298A 1998-01-30 1998-01-30 胴割れ粒判別方法及び胴割れ粒選別装置 Expired - Fee Related JP3642172B2 (ja)

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JP03368298A JP3642172B2 (ja) 1998-01-30 1998-01-30 胴割れ粒判別方法及び胴割れ粒選別装置

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Application Number Priority Date Filing Date Title
JP03368298A JP3642172B2 (ja) 1998-01-30 1998-01-30 胴割れ粒判別方法及び胴割れ粒選別装置

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JPH11218495A JPH11218495A (ja) 1999-08-10
JPH11218495A5 JPH11218495A5 (enExample) 2004-12-02
JP3642172B2 true JP3642172B2 (ja) 2005-04-27

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JP03368298A Expired - Fee Related JP3642172B2 (ja) 1998-01-30 1998-01-30 胴割れ粒判別方法及び胴割れ粒選別装置

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008018419A (ja) * 2006-06-15 2008-01-31 Satake Corp 光学式胴割選別機

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4697510B2 (ja) * 2004-03-17 2011-06-08 株式会社サタケ 穀粒胴割判別装置
US7851722B2 (en) 2006-06-15 2010-12-14 Satake Corporation Optical cracked-grain selector
JP5035696B2 (ja) * 2008-09-17 2012-09-26 株式会社サタケ 光学式胴割選別機
JP7641876B2 (ja) * 2021-10-07 2025-03-07 株式会社クボタ 検査装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008018419A (ja) * 2006-06-15 2008-01-31 Satake Corp 光学式胴割選別機

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JPH11218495A (ja) 1999-08-10

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