JP3542828B2 - 試験パターン発生器 - Google Patents

試験パターン発生器 Download PDF

Info

Publication number
JP3542828B2
JP3542828B2 JP19193194A JP19193194A JP3542828B2 JP 3542828 B2 JP3542828 B2 JP 3542828B2 JP 19193194 A JP19193194 A JP 19193194A JP 19193194 A JP19193194 A JP 19193194A JP 3542828 B2 JP3542828 B2 JP 3542828B2
Authority
JP
Japan
Prior art keywords
data
generator
gate
signal
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP19193194A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0836035A (ja
Inventor
勝 津藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP19193194A priority Critical patent/JP3542828B2/ja
Priority to TW85100261A priority patent/TW290644B/zh
Publication of JPH0836035A publication Critical patent/JPH0836035A/ja
Application granted granted Critical
Publication of JP3542828B2 publication Critical patent/JP3542828B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP19193194A 1994-07-22 1994-07-22 試験パターン発生器 Expired - Fee Related JP3542828B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP19193194A JP3542828B2 (ja) 1994-07-22 1994-07-22 試験パターン発生器
TW85100261A TW290644B (enrdf_load_stackoverflow) 1994-07-22 1996-01-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19193194A JP3542828B2 (ja) 1994-07-22 1994-07-22 試験パターン発生器

Publications (2)

Publication Number Publication Date
JPH0836035A JPH0836035A (ja) 1996-02-06
JP3542828B2 true JP3542828B2 (ja) 2004-07-14

Family

ID=16282834

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19193194A Expired - Fee Related JP3542828B2 (ja) 1994-07-22 1994-07-22 試験パターン発生器

Country Status (2)

Country Link
JP (1) JP3542828B2 (enrdf_load_stackoverflow)
TW (1) TW290644B (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4435915B2 (ja) * 1999-11-26 2010-03-24 株式会社アドバンテスト パターン発生方法・パターン発生器・メモリ試験装置
JP2008123623A (ja) * 2006-11-14 2008-05-29 Yokogawa Electric Corp メモリ試験装置
JP2010225239A (ja) * 2009-03-24 2010-10-07 Toshiba Corp 半導体集積回路およびメモリの機能検証方法

Also Published As

Publication number Publication date
JPH0836035A (ja) 1996-02-06
TW290644B (enrdf_load_stackoverflow) 1996-11-11

Similar Documents

Publication Publication Date Title
JP2527935B2 (ja) 半導体メモリ試験装置
JP2814268B2 (ja) 演算機能内蔵メモリ用パターン発生装置
KR100410872B1 (ko) 선형 피드백 시프트 레지스터를 이용한 빌트-인 셀프테스트 회로 및 그 방법
JPH0434109B2 (enrdf_load_stackoverflow)
JP3871384B2 (ja) 半導体メモリ試験装置用不良解析メモリ
JP3542828B2 (ja) 試験パターン発生器
JP2000276367A (ja) データ書込装置、データ書込方法、及び試験装置
US6601204B1 (en) Pattern generating method, pattern generator using the method, and memory tester using the pattern generator
US6032275A (en) Test pattern generator
KR100238933B1 (ko) 시험 패턴 발생기
KR100330174B1 (ko) 낸드형 플래시 메모리의 테스트 장치 및 방법
JP2003004810A (ja) 半導体デバイス試験装置
JP4722226B2 (ja) パターン発生器
JP2820991B2 (ja) メモリ試験装置
JP3119383B2 (ja) データ幅切り換え機能付半導体メモリ試験装置
JPH0894723A (ja) メモリ半導体試験装置
JPH11184678A (ja) パターン発生器
JPH0283473A (ja) Ｉｃ試験装置
JPH0862301A (ja) 高速パターン発生器
JPS6112294B2 (enrdf_load_stackoverflow)
CN119277226A (zh) 测试电路、测试系统及存储系统
JP2512931B2 (ja) Ｅｃｃ回路テストパタ−ン発生装置
JP2720761B2 (ja) 半導体集積回路試験装置
JP2705359B2 (ja) トレース回路
JPH0862303A (ja) 高速パターン発生器

Legal Events

Date Code Title Description
TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20040309

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20040402

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090409

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090409

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100409

Year of fee payment: 6

LAPS Cancellation because of no payment of annual fees