JP3542828B2 - 試験パターン発生器 - Google Patents

試験パターン発生器 Download PDF

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Publication number
JP3542828B2
JP3542828B2 JP19193194A JP19193194A JP3542828B2 JP 3542828 B2 JP3542828 B2 JP 3542828B2 JP 19193194 A JP19193194 A JP 19193194A JP 19193194 A JP19193194 A JP 19193194A JP 3542828 B2 JP3542828 B2 JP 3542828B2
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JP
Japan
Prior art keywords
data
generator
gate
signal
output
Prior art date
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Expired - Fee Related
Application number
JP19193194A
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English (en)
Japanese (ja)
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JPH0836035A (ja
Inventor
勝 津藤
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Advantest Corp
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Advantest Corp
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Priority to JP19193194A priority Critical patent/JP3542828B2/ja
Priority to TW85100261A priority patent/TW290644B/zh
Publication of JPH0836035A publication Critical patent/JPH0836035A/ja
Application granted granted Critical
Publication of JP3542828B2 publication Critical patent/JP3542828B2/ja
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Expired - Fee Related legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP19193194A 1994-07-22 1994-07-22 試験パターン発生器 Expired - Fee Related JP3542828B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP19193194A JP3542828B2 (ja) 1994-07-22 1994-07-22 試験パターン発生器
TW85100261A TW290644B (enrdf_load_stackoverflow) 1994-07-22 1996-01-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19193194A JP3542828B2 (ja) 1994-07-22 1994-07-22 試験パターン発生器

Publications (2)

Publication Number Publication Date
JPH0836035A JPH0836035A (ja) 1996-02-06
JP3542828B2 true JP3542828B2 (ja) 2004-07-14

Family

ID=16282834

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19193194A Expired - Fee Related JP3542828B2 (ja) 1994-07-22 1994-07-22 試験パターン発生器

Country Status (2)

Country Link
JP (1) JP3542828B2 (enrdf_load_stackoverflow)
TW (1) TW290644B (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4435915B2 (ja) * 1999-11-26 2010-03-24 株式会社アドバンテスト パターン発生方法・パターン発生器・メモリ試験装置
JP2008123623A (ja) * 2006-11-14 2008-05-29 Yokogawa Electric Corp メモリ試験装置
JP2010225239A (ja) * 2009-03-24 2010-10-07 Toshiba Corp 半導体集積回路およびメモリの機能検証方法

Also Published As

Publication number Publication date
TW290644B (enrdf_load_stackoverflow) 1996-11-11
JPH0836035A (ja) 1996-02-06

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