TW290644B - - Google Patents
Info
- Publication number
- TW290644B TW290644B TW85100261A TW85100261A TW290644B TW 290644 B TW290644 B TW 290644B TW 85100261 A TW85100261 A TW 85100261A TW 85100261 A TW85100261 A TW 85100261A TW 290644 B TW290644 B TW 290644B
- Authority
- TW
- Taiwan
Links
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19193194A JP3542828B2 (ja) | 1994-07-22 | 1994-07-22 | 試験パターン発生器 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW290644B true TW290644B (zh) | 1996-11-11 |
Family
ID=16282834
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW85100261A TW290644B (zh) | 1994-07-22 | 1996-01-10 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP3542828B2 (zh) |
| TW (1) | TW290644B (zh) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4435915B2 (ja) * | 1999-11-26 | 2010-03-24 | 株式会社アドバンテスト | パターン発生方法・パターン発生器・メモリ試験装置 |
| JP2008123623A (ja) * | 2006-11-14 | 2008-05-29 | Yokogawa Electric Corp | メモリ試験装置 |
| JP2010225239A (ja) * | 2009-03-24 | 2010-10-07 | Toshiba Corp | 半導体集積回路およびメモリの機能検証方法 |
-
1994
- 1994-07-22 JP JP19193194A patent/JP3542828B2/ja not_active Expired - Fee Related
-
1996
- 1996-01-10 TW TW85100261A patent/TW290644B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0836035A (ja) | 1996-02-06 |
| JP3542828B2 (ja) | 2004-07-14 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |