JP3444429B2 - イオントラップ質量分析計の改良された使用方法 - Google Patents

イオントラップ質量分析計の改良された使用方法

Info

Publication number
JP3444429B2
JP3444429B2 JP15304193A JP15304193A JP3444429B2 JP 3444429 B2 JP3444429 B2 JP 3444429B2 JP 15304193 A JP15304193 A JP 15304193A JP 15304193 A JP15304193 A JP 15304193A JP 3444429 B2 JP3444429 B2 JP 3444429B2
Authority
JP
Japan
Prior art keywords
ion trap
mass spectrometer
ions
trap mass
field
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP15304193A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0696727A (ja
Inventor
グレゴリー・ジェイ・ウェルズ
ミングダ・ウォン
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Varian Inc
Original Assignee
Varian Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Varian Inc filed Critical Varian Inc
Publication of JPH0696727A publication Critical patent/JPH0696727A/ja
Application granted granted Critical
Publication of JP3444429B2 publication Critical patent/JP3444429B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP15304193A 1992-05-29 1993-05-31 イオントラップ質量分析計の改良された使用方法 Expired - Fee Related JP3444429B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US89099192A 1992-05-29 1992-05-29
US890991 1992-05-29

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2003145488A Division JP2004004082A (ja) 1992-05-29 2003-05-22 イオントラップ質量分析計の改良された使用方法

Publications (2)

Publication Number Publication Date
JPH0696727A JPH0696727A (ja) 1994-04-08
JP3444429B2 true JP3444429B2 (ja) 2003-09-08

Family

ID=25397431

Family Applications (2)

Application Number Title Priority Date Filing Date
JP15304193A Expired - Fee Related JP3444429B2 (ja) 1992-05-29 1993-05-31 イオントラップ質量分析計の改良された使用方法
JP2003145488A Pending JP2004004082A (ja) 1992-05-29 2003-05-22 イオントラップ質量分析計の改良された使用方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2003145488A Pending JP2004004082A (ja) 1992-05-29 2003-05-22 イオントラップ質量分析計の改良された使用方法

Country Status (4)

Country Link
EP (1) EP0575777B1 (enExample)
JP (2) JP3444429B2 (enExample)
CA (1) CA2097211A1 (enExample)
DE (3) DE69333589T2 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5448061A (en) * 1992-05-29 1995-09-05 Varian Associates, Inc. Method of space charge control for improved ion isolation in an ion trap mass spectrometer by dynamically adaptive sampling
US5291017A (en) * 1993-01-27 1994-03-01 Varian Associates, Inc. Ion trap mass spectrometer method and apparatus for improved sensitivity
US5396064A (en) * 1994-01-11 1995-03-07 Varian Associates, Inc. Quadrupole trap ion isolation method
DE4425384C1 (de) * 1994-07-19 1995-11-02 Bruker Franzen Analytik Gmbh Verfahren zur stoßinduzierten Fragmentierung von Ionen in Ionenfallen
US5714755A (en) * 1996-03-01 1998-02-03 Varian Associates, Inc. Mass scanning method using an ion trap mass spectrometer
DE19932839B4 (de) * 1999-07-14 2007-10-11 Bruker Daltonik Gmbh Fragmentierung in Quadrupol-Ionenfallenmassenspektrometern
JP4384542B2 (ja) 2004-05-24 2009-12-16 株式会社日立ハイテクノロジーズ 質量分析装置
DE102005061425B4 (de) * 2005-12-22 2009-06-10 Bruker Daltonik Gmbh Rückgesteuerte Fragmentierung in Ionenfallen-Massenspektrometern
JP4996962B2 (ja) 2007-04-04 2012-08-08 株式会社日立ハイテクノロジーズ 質量分析装置
GB201208733D0 (en) * 2012-05-18 2012-07-04 Micromass Ltd Excitation of reagent molecules within a rf confined ion guide or ion trap to perform ion molecule, ion radical or ion-ion interaction experiments
DE102013213501A1 (de) * 2013-07-10 2015-01-15 Carl Zeiss Microscopy Gmbh Massenspektrometer, dessen Verwendung, sowie Verfahren zur massenspektrometrischen Untersuchung eines Gasgemisches
US10985002B2 (en) * 2019-06-11 2021-04-20 Perkinelmer Health Sciences, Inc. Ionization sources and methods and systems using them
CN114823276B (zh) * 2022-05-31 2026-06-16 至秦仪器科技(合肥)有限公司 一种用于质谱的离子阱及质谱仪
CN116930306A (zh) * 2023-06-09 2023-10-24 清华大学 基于离子阱对样品进行淌度分析的方法、离子阱质谱仪及其用途

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0409362B1 (en) * 1985-05-24 1995-04-19 Finnigan Corporation Method of operating an ion trap
US4686367A (en) * 1985-09-06 1987-08-11 Finnigan Corporation Method of operating quadrupole ion trap chemical ionization mass spectrometry
DE3886922T2 (de) * 1988-04-13 1994-04-28 Bruker Franzen Analytik Gmbh Methode zur Massenanalyse einer Probe mittels eines Quistors und zur Durchführung dieses Verfahrens entwickelter Quistor.
EP0362432A1 (en) * 1988-10-07 1990-04-11 Bruker Franzen Analytik GmbH Improvement of a method of mass analyzing a sample
US5200613A (en) * 1991-02-28 1993-04-06 Teledyne Mec Mass spectrometry method using supplemental AC voltage signals

Also Published As

Publication number Publication date
DE69321165T2 (de) 1999-06-02
CA2097211A1 (en) 1993-11-30
DE69328979T2 (de) 2001-02-15
DE69333589T2 (de) 2005-02-03
EP0575777A2 (en) 1993-12-29
EP0575777B1 (en) 1998-09-23
DE69321165D1 (de) 1998-10-29
DE69328979D1 (de) 2000-08-10
DE69333589D1 (de) 2004-09-16
JP2004004082A (ja) 2004-01-08
EP0575777A3 (enExample) 1994-03-16
JPH0696727A (ja) 1994-04-08

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