JP3231329B2 - 多孔性半導体処理コンポネントの浸漬試験 - Google Patents

多孔性半導体処理コンポネントの浸漬試験

Info

Publication number
JP3231329B2
JP3231329B2 JP50974495A JP50974495A JP3231329B2 JP 3231329 B2 JP3231329 B2 JP 3231329B2 JP 50974495 A JP50974495 A JP 50974495A JP 50974495 A JP50974495 A JP 50974495A JP 3231329 B2 JP3231329 B2 JP 3231329B2
Authority
JP
Japan
Prior art keywords
component
cover plate
processing
cover
front surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP50974495A
Other languages
English (en)
Japanese (ja)
Other versions
JPH09503055A (ja
Inventor
エル． マラード，リチャード
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of JPH09503055A publication Critical patent/JPH09503055A/ja
Application granted granted Critical
Publication of JP3231329B2 publication Critical patent/JP3231329B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/265—Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/223—Supports, positioning or alignment in fixed situation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/10—Number of transducers
    • G01N2291/101—Number of transducers one transducer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/263—Surfaces
    • G01N2291/2632—Surfaces flat

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP50974495A 1993-09-21 1994-07-11 多孔性半導体処理コンポネントの浸漬試験 Expired - Fee Related JP3231329B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US124,332 1980-02-25
US08/124,332 1993-09-21
US08/124,332 US6085591A (en) 1993-09-21 1993-09-21 Immersion testing porous semiconductor processing components
PCT/US1994/007792 WO1995008766A1 (en) 1993-09-21 1994-07-11 Immersion testing porous semiconductor processing components

Publications (2)

Publication Number Publication Date
JPH09503055A JPH09503055A (ja) 1997-03-25
JP3231329B2 true JP3231329B2 (ja) 2001-11-19

Family

ID=22414250

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50974495A Expired - Fee Related JP3231329B2 (ja) 1993-09-21 1994-07-11 多孔性半導体処理コンポネントの浸漬試験

Country Status (5)

Country Link
US (1) US6085591A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JP3231329B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
AU (1) AU7359994A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
TW (1) TW252218B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
WO (1) WO1995008766A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6591680B2 (en) * 2001-06-15 2003-07-15 General Electric Company System and method for ultrasonic immersion inspection of components
US7131333B2 (en) * 2002-07-16 2006-11-07 Sonix, Inc. Pulse echo ultrasonic test chamber for tray production system
US7181969B2 (en) * 2002-07-16 2007-02-27 Sonix, Inc. Ultrasonic test chamber for tray production system and the like
US7013732B2 (en) * 2003-02-19 2006-03-21 Sonix, Inc. Method and apparatus for temperature-controlled ultrasonic inspection
US7661315B2 (en) * 2004-05-24 2010-02-16 Sonix, Inc. Method and apparatus for ultrasonic scanning of a fabrication wafer
US7249514B2 (en) * 2004-11-30 2007-07-31 The Boeing Company Repositionable mask for ultrasonic inspection
US7917317B2 (en) * 2006-07-07 2011-03-29 Sonix, Inc. Ultrasonic inspection using acoustic modeling
CA2661439A1 (en) * 2006-08-22 2008-08-14 Tactical Design Labs Top lock security holster
US20080179360A1 (en) * 2006-10-23 2008-07-31 Lowe Michael V Top lock security holster ii
GB0807955D0 (en) * 2008-05-01 2008-06-11 Airbus Uk Ltd Ultrasound inspection method and apparatus
KR101975741B1 (ko) * 2009-11-13 2019-05-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 타깃 재료의 포장 방법 및 타깃의 장착 방법

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH589277A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 1973-11-26 1977-06-30 Western Electric Co
US4059098A (en) * 1975-07-21 1977-11-22 Stanford Research Institute Flexible ultrasound coupling system
DE2607485C3 (de) * 1976-02-20 1978-09-28 Mannesmann Ag, 4000 Duesseldorf Verfahren zum Einstellen von Einschallwinkeln bei der US-Prüfung von Rohren, Bändern und gebogenen Blechen
US4158308A (en) * 1977-09-22 1979-06-19 Automation Industries, Inc. Time-variable bandwidth ultrasonic testing apparatus
US4252022A (en) * 1978-11-17 1981-02-24 Westinghouse Electric Corp. Detection, characterization and studying of flaws in work by acoustic imaging
SU1104412A1 (ru) * 1982-03-31 1984-07-23 Институт Прикладной Физики Ан Бсср Датчик контрол работы ванны дл ультразвуковой обработки изделий
DE3337842A1 (de) * 1982-10-26 1984-04-26 Storz Instrument Co., St. Louis, Mo. Ultraschallsonde
JPS60249944A (ja) * 1984-05-28 1985-12-10 株式会社日立メディコ 超音波探触子
JPH02193065A (ja) * 1989-01-20 1990-07-30 Canon Inc 超音波装置
SU1693532A1 (ru) * 1989-06-16 1991-11-23 Всесоюзный Теплотехнический Научно-Исследовательский Институт Им.Ф.Э.Дзержинского Способ ультразвукового контрол швов аустенитных сварных соединений
US5123281A (en) * 1990-04-20 1992-06-23 General Dynamics Corporation Ultrasonic testing device
US5406849A (en) * 1992-07-31 1995-04-18 The United States Of America, As Represented By The Secretary Of Commerce Method and apparatus for detecting guided leaky waves in acoustic microscopy
US5406850A (en) * 1993-01-14 1995-04-18 Tosoh Smd, Inc. Method of non-destructively testing a sputtering target

Also Published As

Publication number Publication date
AU7359994A (en) 1995-04-10
JPH09503055A (ja) 1997-03-25
WO1995008766A1 (en) 1995-03-30
TW252218B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1995-07-21
US6085591A (en) 2000-07-11

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