JP3217639B2 - COG LCD panel - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a COG type liquid crystal display panel having a row of probing pads for each driving IC.

[0002]

2. Description of the Related Art A chip-on-glass (CHIP-type) in which a driving IC is mounted on a glass substrate is a kind of liquid crystal display panel.
There is an ON-GLASS (hereinafter abbreviated as COG) type liquid crystal display panel, which has already been put to practical use.

FIG. 3 is a plan view of the liquid crystal display panel 1 of the COG system, and FIG. 4 is a sectional view taken along the line XX of FIG. According to these figures, the scanning side substrate 4 having the transparent electrodes 2 and 3 formed on the inner surface and the signal side substrate 5 are arranged to face each other, and an alignment film (not shown) is provided on each of the transparent electrodes 2 and 3. ) To form a display area. The substrates 4 and 5 are fixed with a sealant 6 interposed therebetween, and a liquid crystal 8 is sealed in the space between the substrates while maintaining the distance between the substrates by a spacer 7. The transparent electrode 2 on the scanning substrate 4 is electrically connected to the transparent electrode 3 on the signal substrate 5 via an Ag paste 9 provided on an end portion thereof by a printing method.
Reference numeral 10 denotes a driving IC, and reference numeral 11 denotes a signal input cable formed of a flexible printed wiring board. Furthermore, as for the transparent electrode 3 provided on the signal-side substrate 5, a metal layer is formed on the transparent electrode 3 in the non-display area, thereby forming a conductive line 3a having a high conductivity. The resistivity of the wiring is reduced.

According to the liquid crystal display panel 1 having the above-described structure, when the scanning side substrate 4 and the signal side substrate 5 are manufactured,
There is a step of providing a transparent conductive film on the entire surface of the glass substrate, and thereafter forming the transparent electrodes 2 and 3 having a predetermined shape by photoetching. After this step, the conduction test of the transparent electrodes 2 and 3 is performed.

A case where the signal side substrate 5 is inspected for continuity will be described with reference to FIG. This figure shows a transparent electrode pattern immediately before the inspection of the signal side substrate 5. Each transparent electrode 3 in the display area
Are connected to the corresponding conductive lines 3a, and these ends are connected to the IC output line portions 12 serving as bonding pad portions.
Make The (n-1) groups of IC output line units 12 are connected to the corresponding driving ICs 10 in a later step. Reference numeral 13 in the drawing denotes a driving IC mounting area.

When conducting a continuity test, the number of the IC output lines 12 (n-1) plus one is added, that is, the number of the probe 15 provided with n probe pins 14 is changed to each transparent Applied to electrode 3, then between pins 14-1 and 14-2, between pins 14-2 and 14-3,. . . Pin 14- (n-2) and pin 14- (n-
During 1), the presence or absence of conduction between the pins 14- (n-1) and 14-n is checked.

As described above, after inspecting whether or not the row of the transparent electrodes 3 corresponding to a certain driving IC 10 is conductive, the probe 15 is moved to the row of the transparent electrodes 3 corresponding to the adjacent driving IC 10, and the probe 15 is similarly turned on. Check for presence.

[0008]

However, according to the continuity test as described above, if the electrode spacing of the array of the transparent electrodes 3 differs depending on the product, the individual probe 15 is set in accordance with the electrode spacing. Therefore, there is a problem that the type of the probe 15 increases, the number of steps increases, and the manufacturing cost increases.

Accordingly, the present invention has been completed in view of the above circumstances, and an object of the present invention is to provide a COG type liquid crystal display panel in which the continuity inspection of a transparent electrode using a probe is facilitated and the manufacturing cost can be reduced. Is to do.

[0010]

The COG type liquid crystal display panel of the present invention comprises:
A pair of transparent substrates formed by forming a transparent electrode pattern and an alignment film are bonded together via a liquid crystal layer to form a display area, and a plurality of driving ICs are arranged on a non-display area of one of the transparent substrates. The wiring pattern is provided by extending the transparent electrode pattern to the vicinity of the plurality of driving ICs, and the wiring pattern has a row of probing pads corresponding to the individual driving ICs. A transparent electrode to which a voltage is applied by one of the driving ICs is provided to a probing pad of the other driving IC.

[0011]

In the COG type liquid crystal display panel having the above-mentioned structure, the wiring pattern is provided with a row of probing pads corresponding to the individual driving ICs, and a continuity test of the transparent electrode is performed by applying a probe to the row of probing pads. In the configuration, the probe is not directly applied to the transparent electrode as in the past, so that the electrode interval of the array of transparent electrodes is
Even in the case of different products, there is no need to prepare individual probes according to the electrode spacing.

Further, in the above-mentioned probing pad row, the transparent electrode to which a voltage is applied by a certain driving IC among the adjacent driving ICs is provided to the probing pad of the other driving IC, so that each probing pad row is provided. Continuity test can be performed even if the distance is large.

[0013]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a COG type liquid crystal display panel of the present invention will be described in detail. According to the COG type liquid crystal display panel of the embodiment, the shape of the conductive line 3a in the non-display area of the COG type liquid crystal display panel 1 is different, but other configurations are the same as the liquid crystal display panel 1. is there.

In the case of the COG type liquid crystal display panel of the present embodiment, when manufacturing the scanning side substrate 4 and the signal side substrate 5, a transparent conductive film is provided on one surface of a glass substrate, and a predetermined shape is formed by the next photoetching. There is a step of forming the transparent electrodes 2 and 3, and after this step, a continuity test of the two transparent electrodes 2 and 3 is performed.

FIG. 1 shows a transparent electrode pattern immediately before the inspection of the signal side substrate 5. Each of the transparent electrodes 3 in the display area is connected to a corresponding one of the conductive lines 3b, and a bonding pad portion (IC output line portion) is formed at these ends. In this example, the bonding pad portion is provided. Also serve as the probing pad row 16.

The probing pad row 16 has (n-
1) A group of IC output lines and one n-th pad, and the (n-1) group of IC output lines are connected to the driving IC 10 in a later step. . The transparent electrode connected to the n-th pad is connected to the first first IC output line of the adjacent driving IC 10. Reference numeral 13 in the drawing denotes a driving IC mounting area.

Next, the continuity test will be described with reference to FIG. n
The probe 18 provided with the probe pins 17 is applied to the probing pad row 16 of n pads, and then between the pins 17-1 and 17-2, and between the pins 17-2 and 1
7-3,. . . Pin 17- (n-2) and Pin 17
Between pin 17- (n-1) and pin 17
By examining the presence or absence of continuity with −n, a continuity test is performed on the arrangement of the transparent electrodes 3 corresponding to one drive IC 10.

Next, the probe 18 or the signal-side substrate 5 is moved to move the probe 18 to the adjacent driving I
It is applied to the probing pad row 16 corresponding to C10, and the conduction is similarly inspected.

Thus, in the COG type liquid crystal display panel having the above-described structure, the probing pad array 16 corresponding to each drive IC is formed on the conductive line 3b, and the probe 18 is applied to the probing pad array 16 so that the transparent electrode 3 is formed. Continuity test can be performed. And
In this probing pad row 16, the probing pad row 16 of adjacent driving ICs is provided with the transparent electrode 3 to which a voltage is applied by a certain driving IC to the probing pad row 16 of the other driving IC. Continuity test can be performed even if the distance is large.

Therefore, even when the electrode intervals of the array of the transparent electrodes 3 are different between products, it is no longer necessary to prepare individual probes according to the electrode intervals.

Note that the present invention is not limited to the liquid crystal panel as in the above embodiment, and various changes and improvements may be made without departing from the scope of the present invention.

[0022]

As described above, in the COG mode liquid crystal display panel of the present invention, the wiring pattern has individual driving I
A probing pad row is provided corresponding to C, and a continuity test of the transparent electrode is performed by applying a probe to the probing pad row. Further, in the probing pad row, a certain driving IC among adjacent driving ICs is provided. Is applied to the probing pad of the other driving IC. According to such a configuration, the continuity test can be performed even if the probing pad rows are separated, and Since the probe is not directly applied to the transparent electrode, there is no need to prepare individual probes according to the electrode interval, even if the electrode interval of the array of transparent electrodes differs between products. In addition, it is possible to provide a COG type liquid crystal display panel in which conduction inspection of a transparent electrode using a probe is facilitated and manufacturing cost can be reduced.

[Brief description of the drawings]

FIG. 1 is an explanatory diagram showing a transparent electrode pattern of a substrate in a liquid crystal display panel of an example.

FIG. 2 is an explanatory diagram showing a continuity test for the transparent electrode pattern of FIG. 1;

FIG. 3 is a plan view of the liquid crystal display panel.

FIG. 4 is a sectional view taken along the line XX of FIG. 3;

FIG. 5 is an explanatory view showing a conventional continuity test for a transparent electrode pattern.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Liquid crystal display panel 2, 3 Transparent electrode 4 Scanning substrate 5 Signal side substrate 8 Liquid crystal 10 Driving IC 3a, 3b Conductive line 12 IC output line part 13 Driving IC mounting area 14, 17 Probe pin 15, 18 Probe 16 Probing Pad row

Continuation of front page (56) References JP-A-5-264987 (JP, A) JP-A-4-37146 (JP, A) JP-A-3-212619 (JP, A) JP-A-5-303106 (JP) JP-A-7-84278 (JP, A) JP-A-64-77025 (JP, A) JP-A-6-82802 (JP, A) JP-A-3-25419 (JP, A) 4-75029 (JP, A) Japanese Utility Model Hei 5-2182 (JP, U) (58) Field surveyed (Int. Cl. ⁷ , DB name) G02F 1/1345

Claims (1)

(57) [Claims] 1. A display region is formed by bonding a pair of transparent substrates formed of a transparent electrode pattern and an alignment film via a liquid crystal layer, and a plurality of driving substrates are formed on a non-display region of one of the transparent substrates. And a wiring pattern extending from the transparent electrode pattern to the vicinity of the plurality of driving ICs. The wiring pattern has a row of probing pads corresponding to each driving IC. And the adjacent driving I
C. A COG type liquid crystal display panel, wherein a transparent electrode to which a voltage is applied by one of the driving ICs is applied to a probing pad of the other driving IC.