JPH11183862A - Liquid crystal display device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To make it possible to inspect all lines without requiring a specially enough area at the time of inspecting short-circuits in segment lines and common lines formed on a substrate on which a driver IC is formed by a COG type in a simple matrix type liquid crystal display device. SOLUTION: The electrode terminals 5, 6 of segment lines 3 and common lines 4 are formed on a proposed area for mounting an IC. Halves of electrode terminals of respective electrode terminal groups are extended up to length not intersecting with substantial diagonals inside the proposed area to form inspecting extended electrodes 7, 8. These electrodes 7, 8 are formed from every other electrode terminals in respective electrode groups.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device of a simple matrix type (hereinafter referred to as a COG type) which is directly connected to an insulating substrate by mounting (hereinafter referred to as a COG type). In addition to the segment lines, the short-circuit inspection of the adjacent lines can be performed not only on the common lines but also on the common lines. In particular, it is an object of the present invention to provide an extended electrode arrangement structure capable of sufficiently performing a short circuit inspection only at a position where an IC is arranged on an insulating substrate. Naturally, the insulating substrate may be a flexible substrate that has insulating properties and is synthesized by chemical synthesis.
It is natural that it is generally called a system and can be applied in this technical field.

[0002]

2. Description of the Related Art As a function of a simple matrix type LCD is improved, a demand for a technology of high resolution, high definition, light weight, small size and small mounting has been increased. Therefore, common lines (called horizontal lines, scanning lines, etc.)
And segment lines (referred to as vertical lines, signal lines, etc.) affect high resolution and high definition, and have generally been achieved by a driver IC supporting a high duty and achieving high speed. . Needless to say, on the LCD side, how to connect ICs having a large number of pins and how many lines can be formed on glass with good yield were studied. Specifically, the COG method (chip-on-glass, direct mounting) has been realized.

[0003] Conventionally, as an LCD, an attempt has been made to perform a short-circuit inspection of each line by a probing card system used for the production of many pins such as an IC. Because of this, the pattern was not seen, and it was not put to practical use. However, CO
Unless the existence of a short circuit or disconnection is confirmed before connecting the IC chip to the glass after G has reached the stage of practical use, even the chip will be eaten by itself and will be discarded as a defect as it will be damaged. As a fatal flaw.

For this reason, in the case of COG, a check is performed on the segment line side having a large number of sides on the electrode terminals for connecting the electrodes of the chip. This will be described with reference to FIG. 2. One of the insulating substrates 11 provided with the segment lines 13 formed of the transparent electrodes and the other substrate 12 serving as the common lines 14 are bonded to each other. Segment line 13,
If the metal constituting the common line 14 is a transmissive LCD, both are formed of a transparent conductive metal, and the reflective LCD is
If so, one of the lines is an opaque metal or a transparent conductive metal on a reflective polarizer. Each line is an electrode terminal 15 provided on another insulating substrate 12,
It is led to 16. Inspection extension electrodes 17 are provided alternately from the electrode portions 15 to inspect the segment lines 13.

As described above, the inspection extension electrode 17 is provided at every other segment line. However, this is a phenomenon that occurs between two adjacent lines, so that a short circuit occurs between adjacent line lines. This is to take advantage of the fact that if a short circuit has not occurred on the matching line, it will not have occurred as a whole. In the inspection, current was passed using the inspection extension electrode 17 as one pole and the common line electrode 16 as another pole, and if the segment was seen in a stripe (line) shape, it was treated as a good product. Practically, the inspection is conducted by passing an exchange. The common line is basically treated as non-defective without inspection, so if there is a short circuit in this line, there is a dilemma that the IC is thrown away. However, as a result, there was no further plan, and after all, he was satisfied with performing the short-circuit inspection of only the segment line.

[0006] In the above-mentioned conventional technology, COG connected and fixed to a transparent glass substrate has been described. However, it is obvious that the present invention can be applied to the COF method. In other words, this is a technique including a mounting method of directly connecting a transparent insulating synthetic substrate, and the purpose and effect are the same. Hereinafter, only the COG method will be described using a glass substrate as an example of an insulating substrate.

[0007]

The fact that there is no inspection on the common line side as described above means that it is not easy to know which process is good or not even if the yield is good or bad, and it is guessed. There was no other way. Of course, it takes time and people to inspect and identify the short part, then cut the short part, or use a dummy with correlation that can simulate the important factors of each process up to the common line side electrode. Although it is not impossible to increase the accuracy of the guess by using it, it was inconvenient for man-hours and personnel on the production line.

[0008]

SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned conventional problems, and has a common line extending to an electrode pad at a position where a driver IC is to be connected on a glass substrate. Inspection extension electrodes are applied alternately to every other line that constitutes each line, and the test extension electrodes are energized to inspect short-circuit failure of both lines. An electrode structure is provided. At this time, the inspection extension electrode must not extend from the expected position of the driver IC to the outside, and there are various cases for effectively extending both of them, but a virtual diagonal line is basically formed. It is extended by the rule which does not exceed. As a result, the non-defective pattern when inspected becomes a pattern that can be expressed as a "checkerboard pattern" or a "hatched pattern", so that a single inspection can sufficiently perform both lines of reliable inspection.

[0009]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below in detail with reference to the plan view of FIG. The present invention relates to a COG type or COF type LCD, in which two insulating substrates 1 and 2 are arranged facing each other, and a segment line 3 and a common line 4 provided on each insulating substrate face each other. And each line is extended to a position where the IC is to be installed, and reaches the electrode terminals 5 and 6 of the corresponding IC. Needless to say, the display unit is divided into one or both sides of a short side of a predetermined position of the driver IC via a conductive paste with respect to a common line which is sealed with liquid crystal and exists on the upper insulating substrate.

According to the present invention, an area where an IC is to be installed is defined by electrodes 5 and 6 on the LCD side provided on the insulating substrate 2 at positions corresponding to the bump electrodes of the IC, and is generally a rectangular area. Is defined as a predetermined area, and the inspection extension electrodes 7 and 8 are provided within a range not protruding from the area defined by the predetermined area. That is, even if the electrode arrangement of the IC is uneven, it is assumed that the largest rectangle constituted by the IC is provided, and the inspection extension electrode is provided only within the area so as not to protrude from the area. In other words, it can be rephrased. Furthermore,
As long as neither the segment line 3 nor the common line 4 is provided with a dummy electrode, every other line is extended inward, so that substantially half of each line is provided with a test extension electrode.
In addition, these inspection extension electrodes are set to have a length that does not cross a substantial diagonal line of the area where the planned installation position of the IC is determined. Naturally, if these inspection extension electrodes randomly cross the diagonal line or each extension electrode group that substitutes for the diagonal line, short-circuit will occur unless the three-dimensional intersection occurs, and the intended purpose will not be achieved.

[0011]

According to the present invention, all of the shorts of the common line and the segment line can be visually inspected by the inspection extension electrode. That is, all of the common-side extension electrodes 8 and all of the segment-side extension electrodes 7 are short-circuited with conductive rubber, and when each of them is energized, each display element becomes a “checkered pattern” or a “shaded pattern”. However, if there is a short defect somewhere, a voltage is applied to the line having the defect, and the display appears as a "checkerboard pattern arranged in a continuous bar".

By inspecting 1/4 as the display element, all the display elements can be inspected completely for the short inspection. According to the present invention, both the segment-side electrode and the common-side electrode are practically extended to take out half the number of the respective electrodes, and are distributed in an appropriate area and within the area where the IC is to be installed. Therefore, miniaturization, which is a feature of the COG system, can be kept and an extension electrode for inspection can be provided. The term “substantially half of the electrode terminals” according to the present invention is used to avoid obscuring the meaning, such as excluding or including dummy electrodes, or half the number of odd-numbered electrodes. However, the difference between what is easily related to the production of LCDs and the half that is easily understood is not strict as long as the purpose is the same, and a difference that can understand the purpose should be recognized.

According to the present invention, a short-circuit defect can be removed before connecting an IC chip. Therefore, it is possible to completely discriminate a chip from a chip defect, thereby reducing analysis time and directly reducing unnecessary material loss. I was able to do it.

[Brief description of the drawings]

FIG. 1 is a schematic plan view for explaining the present invention.

FIG. 2 is a schematic plan view for explaining a conventional example.

Claims (2)

[Claims] The present invention relates to a simple matrix type liquid crystal display device. The driver IC is provided near an electrode terminal of a segment line and a common line which are provided to extend to a predetermined position of a driver IC directly mounted on an insulating substrate of the liquid crystal display device. A liquid crystal display device, wherein an inspection extension electrode provided to extend to electrode terminals of substantially half of both the segment line and the common line is arranged in a region to be directly mounted. . 2. An electrode terminal of a segment IC and a common line, which are provided to extend to a predetermined position of a driver IC directly mounted on an insulating substrate of a liquid crystal display device of a simple matrix type, and are provided with the driver IC. An extension electrode for inspection which is provided to extend to the electrode terminals of substantially half of both the segment line and the common line in the area to be directly mounted, and the terminal of the extension electrode for inspection from the electrode terminal 2. The liquid crystal display device according to claim 1, wherein the distance from the electrode terminal is shorter than the distance from the electrode terminal to a substantially diagonal line of the area where the IC is to be directly mounted.