JP2899307B2 - 電子デバイス試験システム - Google Patents
電子デバイス試験システムInfo
- Publication number
- JP2899307B2 JP2899307B2 JP1117645A JP11764589A JP2899307B2 JP 2899307 B2 JP2899307 B2 JP 2899307B2 JP 1117645 A JP1117645 A JP 1117645A JP 11764589 A JP11764589 A JP 11764589A JP 2899307 B2 JP2899307 B2 JP 2899307B2
- Authority
- JP
- Japan
- Prior art keywords
- test head
- cable
- cradle
- leg
- cable support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q1/00—Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
- B23Q1/0009—Energy-transferring means or control lines for movable machine parts; Control panels or boxes; Control parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
Landscapes
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Memory System Of A Hierarchy Structure (AREA)
- Debugging And Monitoring (AREA)
- Measuring Fluid Pressure (AREA)
- Molding Of Porous Articles (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/193,768 US4893074A (en) | 1988-05-13 | 1988-05-13 | Electronic device testing system |
US193768 | 1988-05-13 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0273170A JPH0273170A (ja) | 1990-03-13 |
JP2899307B2 true JP2899307B2 (ja) | 1999-06-02 |
Family
ID=22714925
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1117645A Expired - Fee Related JP2899307B2 (ja) | 1988-05-13 | 1989-05-12 | 電子デバイス試験システム |
Country Status (8)
Country | Link |
---|---|
US (1) | US4893074A (es) |
EP (1) | EP0342045B1 (es) |
JP (1) | JP2899307B2 (es) |
AT (1) | ATE134772T1 (es) |
DE (1) | DE68925750T2 (es) |
ES (1) | ES2083379T3 (es) |
HK (1) | HK209396A (es) |
SG (1) | SG43806A1 (es) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5030869A (en) * | 1990-07-25 | 1991-07-09 | Intest Corporation | Device testing system with cable pivot |
US5270641A (en) * | 1992-01-22 | 1993-12-14 | Everett Charles Technologies, Inc. | Dual side access test fixture |
US5600258A (en) * | 1993-09-15 | 1997-02-04 | Intest Corporation | Method and apparatus for automated docking of a test head to a device handler |
US6057695A (en) * | 1993-09-15 | 2000-05-02 | Intest Corporation | Method and apparatus for automated docking of a test head to a device handler |
US5440943A (en) * | 1993-09-15 | 1995-08-15 | Intest Corporation | Electronic test head manipulator |
US5561386A (en) * | 1994-02-23 | 1996-10-01 | Fujitsu Limited | Chip tester with improvements in handling efficiency and measurement precision |
US5982182A (en) * | 1994-09-01 | 1999-11-09 | Chiu; Michael A. | Interface apparatus for automatic test equipment with positioning modules incorporating kinematic surfaces |
US5550466A (en) * | 1994-09-30 | 1996-08-27 | Hewlett-Packard Company | Hinged conduit for routing cables in an electronic circuit tester |
DE69522586T2 (de) * | 1995-02-23 | 2002-07-11 | Aesop Inc | Manipulator für einen testkopf einer automatischen testanlage |
US5608334A (en) * | 1995-04-20 | 1997-03-04 | Intest Corporation | Device testing system with cable pivot and method of installation |
US5606262A (en) * | 1995-06-07 | 1997-02-25 | Teradyne, Inc. | Manipulator for automatic test equipment test head |
DE19622475A1 (de) * | 1996-06-05 | 1997-12-11 | Index Werke Kg Hahn & Tessky | Werkzeugmaschine |
US5923180A (en) * | 1997-02-04 | 1999-07-13 | Hewlett-Packard Company | Compliant wafer prober docking adapter |
WO1999004273A1 (en) * | 1997-07-15 | 1999-01-28 | Wentworth Laboratories, Inc. | Probe station with multiple adjustable probe supports |
MY138984A (en) | 2000-03-01 | 2009-08-28 | Intest Corp | Vertical counter balanced test head manipulator |
US6741072B2 (en) * | 2000-09-15 | 2004-05-25 | James E. Orsillo | Docking system for connecting a tester to a probe station using an A-type docking configuration |
US6586925B2 (en) | 2001-04-09 | 2003-07-01 | St Assembly Test Services Ltd. | Method and apparatus for establishing quick and reliable connection between a semiconductor device handler plate and a semiconductor device test head plate |
AU2002355083A1 (en) * | 2001-07-16 | 2003-03-03 | Intest Ip Corp. | Test head docking system and method |
US6646431B1 (en) | 2002-01-22 | 2003-11-11 | Elite E/M, Inc. | Test head manipulator |
US6722215B2 (en) * | 2002-06-18 | 2004-04-20 | Michael Caradonna | Manipulator apparatus with low-cost compliance |
US8350584B2 (en) * | 2006-12-29 | 2013-01-08 | Intest Corporation | Test head positioning system and method |
TWI490513B (zh) | 2006-12-29 | 2015-07-01 | Intest Corp | 用於使負載沿平移軸線平移之負載定位系統以及使負載達到平衡之方法 |
WO2008137182A2 (en) * | 2007-05-07 | 2008-11-13 | Intest Corporation | Cradle and cable handler for a test head manipulator |
US8212578B1 (en) | 2008-03-17 | 2012-07-03 | Intest Corporation | Test head positioner system |
US8844387B1 (en) * | 2010-07-09 | 2014-09-30 | General Construction Company, Inc. | Inspection sled |
US8981807B2 (en) | 2010-07-27 | 2015-03-17 | Intest Corporation | Positioner system and method of positioning |
SG10201605656TA (en) | 2011-07-12 | 2016-08-30 | Intest Corp | Method and apparatus for docking a test head with a peripheral |
WO2013106177A1 (en) | 2012-01-09 | 2013-07-18 | Packsize Llc | Cable-based measuring system |
JP7183667B2 (ja) * | 2018-09-27 | 2022-12-06 | 株式会社ジェイテクト | ラインガイド機構及び旋回装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3731191A (en) * | 1969-12-22 | 1973-05-01 | Ibm | Micro-miniature probe assembly |
GB2040856A (en) * | 1979-01-23 | 1980-09-03 | Rich Services Inc Roy | Cable handling systems |
US4229136A (en) * | 1979-03-19 | 1980-10-21 | International Business Machines Corporation | Programmable air pressure counterbalance system for a manipulator |
US4379335A (en) * | 1980-10-28 | 1983-04-05 | Auto-Place, Inc. | Electronic controller and portable programmer system for a pneumatically-powered point-to-point robot |
US4705447A (en) * | 1983-08-11 | 1987-11-10 | Intest Corporation | Electronic test head positioner for test systems |
DE3382550D1 (de) * | 1982-08-25 | 1992-05-27 | Intest Corp | Einstellvorrichtung fuer elektronische testkoepfe. |
US4588346A (en) * | 1982-08-25 | 1986-05-13 | Intest Corporation | Positioner for maintaining an object in a substantially weightless condition |
US4527942A (en) * | 1982-08-25 | 1985-07-09 | Intest Corporation | Electronic test head positioner for test systems |
US4652204A (en) * | 1985-08-02 | 1987-03-24 | Arnett Edward M | Apparatus for handling hazardous materials |
IT208046Z2 (it) * | 1986-09-15 | 1988-03-31 | Tecno Mobili E Forniture Per A | Organo passocavo flessibile a snodi bidirezionali. |
-
1988
- 1988-05-13 US US07/193,768 patent/US4893074A/en not_active Expired - Lifetime
-
1989
- 1989-05-11 AT AT89304810T patent/ATE134772T1/de not_active IP Right Cessation
- 1989-05-11 DE DE68925750T patent/DE68925750T2/de not_active Expired - Fee Related
- 1989-05-11 EP EP89304810A patent/EP0342045B1/en not_active Expired - Lifetime
- 1989-05-11 SG SG1996001063A patent/SG43806A1/en unknown
- 1989-05-11 ES ES89304810T patent/ES2083379T3/es not_active Expired - Lifetime
- 1989-05-12 JP JP1117645A patent/JP2899307B2/ja not_active Expired - Fee Related
-
1996
- 1996-11-21 HK HK209396A patent/HK209396A/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
ES2083379T3 (es) | 1996-04-16 |
EP0342045A2 (en) | 1989-11-15 |
ATE134772T1 (de) | 1996-03-15 |
US4893074A (en) | 1990-01-09 |
DE68925750D1 (de) | 1996-04-04 |
EP0342045B1 (en) | 1996-02-28 |
DE68925750T2 (de) | 1996-09-19 |
HK209396A (en) | 1996-11-29 |
SG43806A1 (en) | 1997-11-14 |
EP0342045A3 (en) | 1991-06-19 |
JPH0273170A (ja) | 1990-03-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |