ES2083379T3 - Sistema de comprobacion de dispositivos electronicos. - Google Patents
Sistema de comprobacion de dispositivos electronicos.Info
- Publication number
- ES2083379T3 ES2083379T3 ES89304810T ES89304810T ES2083379T3 ES 2083379 T3 ES2083379 T3 ES 2083379T3 ES 89304810 T ES89304810 T ES 89304810T ES 89304810 T ES89304810 T ES 89304810T ES 2083379 T3 ES2083379 T3 ES 2083379T3
- Authority
- ES
- Spain
- Prior art keywords
- test head
- test
- electronic device
- cable
- cable support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q1/00—Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
- B23Q1/0009—Energy-transferring means or control lines for movable machine parts; Control panels or boxes; Control parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
Landscapes
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Memory System Of A Hierarchy Structure (AREA)
- Debugging And Monitoring (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Molding Of Porous Articles (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Fluid Pressure (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
SISTEMA DE EXAMEN PARA DISPOSITIVO ELECTRONICO DEL TIPO EN EL QUE UN CABEZAL EXAMINADOR SE MONTA CON MOVIMIENTO PIVOTANTE SOBRE TRES EJES ORTOGONALES. UN CABLE SE INTRODUCE EN EL CABEZAL DE EXAMEN A LO LARGO DE UN EJE PERPENDICULAR QUE SE EXTIENDE A TRAVES DE LOS MEDIOS POR LOS CUALES LA CABEZA DE EXAMEN SE MONTA PARA EL MOVIMIENTO PIVOTANTE SOBRE EL EJE HORIZONTAL. EL SISTEMA TAMBIEN TIENE UN SOPORTE PARA EL CABLE SUJETO A UN EXTREMO PARA QUE EL CABEZAL O LA HORQUILLA DEL MISMO, Y EN EL EXTREMO OPUESTO A UNA CABINA QUE CONTIENE PARTE DE LOS COMPONENTES ELECTRONICOS. EL CABLE, QUE SE EXTIENDE ENTRE LA CABINA Y EL CABEZAL, SE SOPORTA MEDIANTE UN SOPORTE ADECUADO. EL SOPORTE DEL CABLE SE DISPONE PARA AJUSTAR CAMBIOS EN LOS ESPACIOS DE SU EXTREMO Y LA ORIENTACION DE SU EJE PRODUCIDO POR CAMBIOS EN LA POSICION O EN LA ORIENTACION DEL CABEZAL DE EXAMEN.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/193,768 US4893074A (en) | 1988-05-13 | 1988-05-13 | Electronic device testing system |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2083379T3 true ES2083379T3 (es) | 1996-04-16 |
Family
ID=22714925
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES89304810T Expired - Lifetime ES2083379T3 (es) | 1988-05-13 | 1989-05-11 | Sistema de comprobacion de dispositivos electronicos. |
Country Status (8)
Country | Link |
---|---|
US (1) | US4893074A (es) |
EP (1) | EP0342045B1 (es) |
JP (1) | JP2899307B2 (es) |
AT (1) | ATE134772T1 (es) |
DE (1) | DE68925750T2 (es) |
ES (1) | ES2083379T3 (es) |
HK (1) | HK209396A (es) |
SG (1) | SG43806A1 (es) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5030869A (en) * | 1990-07-25 | 1991-07-09 | Intest Corporation | Device testing system with cable pivot |
US5270641A (en) * | 1992-01-22 | 1993-12-14 | Everett Charles Technologies, Inc. | Dual side access test fixture |
US5600258A (en) * | 1993-09-15 | 1997-02-04 | Intest Corporation | Method and apparatus for automated docking of a test head to a device handler |
US5440943A (en) * | 1993-09-15 | 1995-08-15 | Intest Corporation | Electronic test head manipulator |
US6057695A (en) * | 1993-09-15 | 2000-05-02 | Intest Corporation | Method and apparatus for automated docking of a test head to a device handler |
US5561386A (en) * | 1994-02-23 | 1996-10-01 | Fujitsu Limited | Chip tester with improvements in handling efficiency and measurement precision |
US5982182A (en) * | 1994-09-01 | 1999-11-09 | Chiu; Michael A. | Interface apparatus for automatic test equipment with positioning modules incorporating kinematic surfaces |
US5550466A (en) * | 1994-09-30 | 1996-08-27 | Hewlett-Packard Company | Hinged conduit for routing cables in an electronic circuit tester |
DE69522586T2 (de) * | 1995-02-23 | 2002-07-11 | Aesop Inc | Manipulator für einen testkopf einer automatischen testanlage |
US5608334A (en) * | 1995-04-20 | 1997-03-04 | Intest Corporation | Device testing system with cable pivot and method of installation |
US5606262A (en) * | 1995-06-07 | 1997-02-25 | Teradyne, Inc. | Manipulator for automatic test equipment test head |
DE19622475A1 (de) * | 1996-06-05 | 1997-12-11 | Index Werke Kg Hahn & Tessky | Werkzeugmaschine |
US5923180A (en) * | 1997-02-04 | 1999-07-13 | Hewlett-Packard Company | Compliant wafer prober docking adapter |
WO1999004273A1 (en) * | 1997-07-15 | 1999-01-28 | Wentworth Laboratories, Inc. | Probe station with multiple adjustable probe supports |
MY138984A (en) | 2000-03-01 | 2009-08-28 | Intest Corp | Vertical counter balanced test head manipulator |
US6741072B2 (en) * | 2000-09-15 | 2004-05-25 | James E. Orsillo | Docking system for connecting a tester to a probe station using an A-type docking configuration |
US6586925B2 (en) | 2001-04-09 | 2003-07-01 | St Assembly Test Services Ltd. | Method and apparatus for establishing quick and reliable connection between a semiconductor device handler plate and a semiconductor device test head plate |
CN1280635C (zh) * | 2001-07-16 | 2006-10-18 | 因泰斯特Ip公司 | 测试头对接系统及方法 |
US6646431B1 (en) | 2002-01-22 | 2003-11-11 | Elite E/M, Inc. | Test head manipulator |
US6722215B2 (en) * | 2002-06-18 | 2004-04-20 | Michael Caradonna | Manipulator apparatus with low-cost compliance |
US8350584B2 (en) * | 2006-12-29 | 2013-01-08 | Intest Corporation | Test head positioning system and method |
TWI490513B (zh) | 2006-12-29 | 2015-07-01 | Intest Corp | 用於使負載沿平移軸線平移之負載定位系統以及使負載達到平衡之方法 |
EP2150823A4 (en) * | 2007-05-07 | 2016-12-21 | Intest Corp | BOWL AND SHELL HANDLER FOR A TEST HEAD MANIPULATOR |
US8212578B1 (en) | 2008-03-17 | 2012-07-03 | Intest Corporation | Test head positioner system |
US8844387B1 (en) * | 2010-07-09 | 2014-09-30 | General Construction Company, Inc. | Inspection sled |
US8981807B2 (en) | 2010-07-27 | 2015-03-17 | Intest Corporation | Positioner system and method of positioning |
US20140317453A1 (en) | 2011-07-12 | 2014-10-23 | Intest Corporation | Method and apparatus for docking a test head with a peripheral |
US9541422B2 (en) * | 2012-01-09 | 2017-01-10 | Packsize Llc | Cable-based measuring system |
JP7183667B2 (ja) * | 2018-09-27 | 2022-12-06 | 株式会社ジェイテクト | ラインガイド機構及び旋回装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3731191A (en) * | 1969-12-22 | 1973-05-01 | Ibm | Micro-miniature probe assembly |
GB2040856A (en) * | 1979-01-23 | 1980-09-03 | Rich Services Inc Roy | Cable handling systems |
US4229136A (en) * | 1979-03-19 | 1980-10-21 | International Business Machines Corporation | Programmable air pressure counterbalance system for a manipulator |
US4379335A (en) * | 1980-10-28 | 1983-04-05 | Auto-Place, Inc. | Electronic controller and portable programmer system for a pneumatically-powered point-to-point robot |
US4588346A (en) * | 1982-08-25 | 1986-05-13 | Intest Corporation | Positioner for maintaining an object in a substantially weightless condition |
US4527942A (en) * | 1982-08-25 | 1985-07-09 | Intest Corporation | Electronic test head positioner for test systems |
DE3382550D1 (de) * | 1982-08-25 | 1992-05-27 | Intest Corp | Einstellvorrichtung fuer elektronische testkoepfe. |
US4705447A (en) * | 1983-08-11 | 1987-11-10 | Intest Corporation | Electronic test head positioner for test systems |
US4652204A (en) * | 1985-08-02 | 1987-03-24 | Arnett Edward M | Apparatus for handling hazardous materials |
IT208046Z2 (it) * | 1986-09-15 | 1988-03-31 | Tecno Mobili E Forniture Per A | Organo passocavo flessibile a snodi bidirezionali. |
-
1988
- 1988-05-13 US US07/193,768 patent/US4893074A/en not_active Expired - Lifetime
-
1989
- 1989-05-11 AT AT89304810T patent/ATE134772T1/de not_active IP Right Cessation
- 1989-05-11 ES ES89304810T patent/ES2083379T3/es not_active Expired - Lifetime
- 1989-05-11 EP EP89304810A patent/EP0342045B1/en not_active Expired - Lifetime
- 1989-05-11 DE DE68925750T patent/DE68925750T2/de not_active Expired - Fee Related
- 1989-05-11 SG SG1996001063A patent/SG43806A1/en unknown
- 1989-05-12 JP JP1117645A patent/JP2899307B2/ja not_active Expired - Fee Related
-
1996
- 1996-11-21 HK HK209396A patent/HK209396A/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE68925750T2 (de) | 1996-09-19 |
EP0342045B1 (en) | 1996-02-28 |
EP0342045A2 (en) | 1989-11-15 |
EP0342045A3 (en) | 1991-06-19 |
SG43806A1 (en) | 1997-11-14 |
US4893074A (en) | 1990-01-09 |
JP2899307B2 (ja) | 1999-06-02 |
DE68925750D1 (de) | 1996-04-04 |
JPH0273170A (ja) | 1990-03-13 |
HK209396A (en) | 1996-11-29 |
ATE134772T1 (de) | 1996-03-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG2A | Definitive protection |
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