HK209396A - Electronic device testing system - Google Patents

Electronic device testing system

Info

Publication number
HK209396A
HK209396A HK209396A HK209396A HK209396A HK 209396 A HK209396 A HK 209396A HK 209396 A HK209396 A HK 209396A HK 209396 A HK209396 A HK 209396A HK 209396 A HK209396 A HK 209396A
Authority
HK
Hong Kong
Prior art keywords
test head
test
electronic device
cable
testing system
Prior art date
Application number
HK209396A
Other languages
English (en)
Inventor
Alyn R Holt
Bryan R Moore
Original Assignee
Intest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intest Corp filed Critical Intest Corp
Publication of HK209396A publication Critical patent/HK209396A/xx

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q1/00—Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
    • B23Q1/0009—Energy-transferring means or control lines for movable machine parts; Control panels or boxes; Control parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals

Landscapes

  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Memory System Of A Hierarchy Structure (AREA)
  • Debugging And Monitoring (AREA)
  • Measuring Fluid Pressure (AREA)
  • Molding Of Porous Articles (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
HK209396A 1988-05-13 1996-11-21 Electronic device testing system HK209396A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/193,768 US4893074A (en) 1988-05-13 1988-05-13 Electronic device testing system

Publications (1)

Publication Number Publication Date
HK209396A true HK209396A (en) 1996-11-29

Family

ID=22714925

Family Applications (1)

Application Number Title Priority Date Filing Date
HK209396A HK209396A (en) 1988-05-13 1996-11-21 Electronic device testing system

Country Status (8)

Country Link
US (1) US4893074A (es)
EP (1) EP0342045B1 (es)
JP (1) JP2899307B2 (es)
AT (1) ATE134772T1 (es)
DE (1) DE68925750T2 (es)
ES (1) ES2083379T3 (es)
HK (1) HK209396A (es)
SG (1) SG43806A1 (es)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5030869A (en) * 1990-07-25 1991-07-09 Intest Corporation Device testing system with cable pivot
US5270641A (en) * 1992-01-22 1993-12-14 Everett Charles Technologies, Inc. Dual side access test fixture
US5600258A (en) * 1993-09-15 1997-02-04 Intest Corporation Method and apparatus for automated docking of a test head to a device handler
US6057695A (en) * 1993-09-15 2000-05-02 Intest Corporation Method and apparatus for automated docking of a test head to a device handler
US5440943A (en) * 1993-09-15 1995-08-15 Intest Corporation Electronic test head manipulator
US5561386A (en) * 1994-02-23 1996-10-01 Fujitsu Limited Chip tester with improvements in handling efficiency and measurement precision
US5982182A (en) * 1994-09-01 1999-11-09 Chiu; Michael A. Interface apparatus for automatic test equipment with positioning modules incorporating kinematic surfaces
US5550466A (en) * 1994-09-30 1996-08-27 Hewlett-Packard Company Hinged conduit for routing cables in an electronic circuit tester
DE69522586T2 (de) * 1995-02-23 2002-07-11 Aesop Inc Manipulator für einen testkopf einer automatischen testanlage
US5608334A (en) * 1995-04-20 1997-03-04 Intest Corporation Device testing system with cable pivot and method of installation
US5606262A (en) * 1995-06-07 1997-02-25 Teradyne, Inc. Manipulator for automatic test equipment test head
DE19622475A1 (de) * 1996-06-05 1997-12-11 Index Werke Kg Hahn & Tessky Werkzeugmaschine
US5923180A (en) * 1997-02-04 1999-07-13 Hewlett-Packard Company Compliant wafer prober docking adapter
WO1999004273A1 (en) * 1997-07-15 1999-01-28 Wentworth Laboratories, Inc. Probe station with multiple adjustable probe supports
MY138984A (en) 2000-03-01 2009-08-28 Intest Corp Vertical counter balanced test head manipulator
US6741072B2 (en) * 2000-09-15 2004-05-25 James E. Orsillo Docking system for connecting a tester to a probe station using an A-type docking configuration
US6586925B2 (en) 2001-04-09 2003-07-01 St Assembly Test Services Ltd. Method and apparatus for establishing quick and reliable connection between a semiconductor device handler plate and a semiconductor device test head plate
AU2002355083A1 (en) * 2001-07-16 2003-03-03 Intest Ip Corp. Test head docking system and method
US6646431B1 (en) 2002-01-22 2003-11-11 Elite E/M, Inc. Test head manipulator
US6722215B2 (en) * 2002-06-18 2004-04-20 Michael Caradonna Manipulator apparatus with low-cost compliance
US8350584B2 (en) * 2006-12-29 2013-01-08 Intest Corporation Test head positioning system and method
TWI490513B (zh) 2006-12-29 2015-07-01 Intest Corp 用於使負載沿平移軸線平移之負載定位系統以及使負載達到平衡之方法
WO2008137182A2 (en) * 2007-05-07 2008-11-13 Intest Corporation Cradle and cable handler for a test head manipulator
US8212578B1 (en) 2008-03-17 2012-07-03 Intest Corporation Test head positioner system
US8844387B1 (en) * 2010-07-09 2014-09-30 General Construction Company, Inc. Inspection sled
US8981807B2 (en) 2010-07-27 2015-03-17 Intest Corporation Positioner system and method of positioning
SG10201605656TA (en) 2011-07-12 2016-08-30 Intest Corp Method and apparatus for docking a test head with a peripheral
WO2013106177A1 (en) 2012-01-09 2013-07-18 Packsize Llc Cable-based measuring system
JP7183667B2 (ja) * 2018-09-27 2022-12-06 株式会社ジェイテクト ラインガイド機構及び旋回装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3731191A (en) * 1969-12-22 1973-05-01 Ibm Micro-miniature probe assembly
GB2040856A (en) * 1979-01-23 1980-09-03 Rich Services Inc Roy Cable handling systems
US4229136A (en) * 1979-03-19 1980-10-21 International Business Machines Corporation Programmable air pressure counterbalance system for a manipulator
US4379335A (en) * 1980-10-28 1983-04-05 Auto-Place, Inc. Electronic controller and portable programmer system for a pneumatically-powered point-to-point robot
US4705447A (en) * 1983-08-11 1987-11-10 Intest Corporation Electronic test head positioner for test systems
DE3382550D1 (de) * 1982-08-25 1992-05-27 Intest Corp Einstellvorrichtung fuer elektronische testkoepfe.
US4588346A (en) * 1982-08-25 1986-05-13 Intest Corporation Positioner for maintaining an object in a substantially weightless condition
US4527942A (en) * 1982-08-25 1985-07-09 Intest Corporation Electronic test head positioner for test systems
US4652204A (en) * 1985-08-02 1987-03-24 Arnett Edward M Apparatus for handling hazardous materials
IT208046Z2 (it) * 1986-09-15 1988-03-31 Tecno Mobili E Forniture Per A Organo passocavo flessibile a snodi bidirezionali.

Also Published As

Publication number Publication date
ES2083379T3 (es) 1996-04-16
EP0342045A2 (en) 1989-11-15
ATE134772T1 (de) 1996-03-15
US4893074A (en) 1990-01-09
DE68925750D1 (de) 1996-04-04
EP0342045B1 (en) 1996-02-28
DE68925750T2 (de) 1996-09-19
SG43806A1 (en) 1997-11-14
JP2899307B2 (ja) 1999-06-02
EP0342045A3 (en) 1991-06-19
JPH0273170A (ja) 1990-03-13

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)