JP2883427B2 - Manufacturing method of circuit board with micro probe - Google Patents

Manufacturing method of circuit board with micro probe

Info

Publication number
JP2883427B2
JP2883427B2 JP2231698A JP23169890A JP2883427B2 JP 2883427 B2 JP2883427 B2 JP 2883427B2 JP 2231698 A JP2231698 A JP 2231698A JP 23169890 A JP23169890 A JP 23169890A JP 2883427 B2 JP2883427 B2 JP 2883427B2
Authority
JP
Japan
Prior art keywords
substrate
fine
chemically
photosensitive glass
holes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2231698A
Other languages
Japanese (ja)
Other versions
JPH04112549A (en
Inventor
理 杉原
敬一 山崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HOOYA KK
Original Assignee
HOOYA KK
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Filing date
Publication date
Application filed by HOOYA KK filed Critical HOOYA KK
Priority to JP2231698A priority Critical patent/JP2883427B2/en
Publication of JPH04112549A publication Critical patent/JPH04112549A/en
Application granted granted Critical
Publication of JP2883427B2 publication Critical patent/JP2883427B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Glass Compositions (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、プローブカードに代表される微小探針を有
する回路基板の製法に関する。
Description: TECHNICAL FIELD The present invention relates to a method for manufacturing a circuit board having a small probe represented by a probe card.

[従来の技術] プローブカードに代表される微小探針を有する回路基
板は、従来より、電気回路パターンを設けた絶縁性また
は半導体基板と、微小探針となる複数の導電性金属とを
別々の部材として作製した後、微小探針が所定の配置と
なるように、手作業により上記導電性金属を前記基板上
の所定の位置に固定するとともに、導電性金属と電気回
路パターンとを電気的に接続させることにより製造され
ている。
[Prior Art] Conventionally, a circuit board having a micro probe typified by a probe card has conventionally used an insulating or semiconductor substrate provided with an electric circuit pattern and a plurality of conductive metals serving as micro probes separately. After being manufactured as a member, the conductive metal is fixed to a predetermined position on the substrate by hand so that the microtips have a predetermined arrangement, and the conductive metal and the electric circuit pattern are electrically connected. It is manufactured by connecting.

このような微小探針を有する回路基板においては、被
検査基板(ICチップ等)を検査する際に被検査基板と回
路基板との間に異物が混入することにより微小探針と被
検査基板との接触不良が生じるのを防止するうえから
も、使用時において被検査基板と回路基板との間に所定
の空隙が形成されるよう、微小探針を所望の長さだけ基
板表面から突出させている。また、このような微小探針
を有する回路基板を使用して被検査基板を検査する場
合、微小探針と被検査基板との間で接触不良が生じない
ように、例えば微小探針1本当たり700g程度の負荷をか
けている。
In a circuit board having such a minute probe, when a substrate to be inspected (such as an IC chip) is inspected, a foreign matter enters between the substrate to be inspected and the circuit board, so that the minute probe and the substrate to be inspected become inconsistent. In order to prevent the occurrence of poor contact, the micro probe is projected from the substrate surface by a desired length so that a predetermined gap is formed between the substrate to be inspected and the circuit board during use. I have. Further, when inspecting a substrate to be inspected using a circuit board having such a minute probe, for example, one minute probe is used so that a contact failure does not occur between the minute probe and the substrate to be inspected. The load is about 700g.

ところで、上述した従来の微小探針を有する回路基板
の製法では、製造工程が煩雑になるという問題点、ある
いは被検査基板の高密度化(高集積化)に対する対応が
非常に困難であるという問題点等があったので、本願発
明者は、これらの問題点を解決すべく、特願平1−3118
87号明細書に開示したように、基板に設けた微細孔また
は微細溝内に柱状の導電体を設け、この柱状の導電体の
一端面側の基板の表面部をエッチング除去することによ
り、柱状の導電体の一部を突出させて微小探針とする方
法を提案している。
By the way, in the above-mentioned conventional method of manufacturing a circuit board having a micro probe, the manufacturing process becomes complicated, or it is very difficult to cope with high density (high integration) of a substrate to be inspected. The inventors of the present application have made an attempt to solve these problems with Japanese Patent Application No. Hei.
As disclosed in the specification No. 87, a columnar conductor is provided in a fine hole or microgroove provided in a substrate, and the surface of the substrate on one end surface side of the columnar conductor is removed by etching to form a columnar conductor. Has proposed a method of protruding a part of the conductor to form a micro probe.

[発明が解決しようとする課題] しかしながら、柱状の導電体の一端面側の基板の表面
部をエッチング除去することにより、柱状の導電体の一
部を突出させて微小探針とする方法では、柱状の導電体
の外周に樹脂層を設けた場合、この樹脂層と基板との間
にエッチング液が浸透して、第5図に示すように、柱状
の導電体からなる微小探針50の外周に設けた樹脂層51と
基板52との間に断面がV字状の溝53が生じる。また、柱
状の導電体の外周に樹脂層を設けなくとも、柱状の導電
体と基板との間にエッチング液が浸透した場合には、上
述のようなV字状の溝が生じる。
[Problems to be Solved by the Invention] However, in the method in which a part of the columnar conductor is projected to form a micro probe by etching away the surface of the substrate on one end surface side of the columnar conductor, When a resin layer is provided on the outer periphery of the columnar conductor, the etchant penetrates between the resin layer and the substrate, and as shown in FIG. A groove 53 having a V-shaped cross section is formed between the resin layer 51 and the substrate 52 provided in the above. Further, even when the resin layer is not provided on the outer periphery of the columnar conductor, if the etchant permeates between the columnar conductor and the substrate, the above-described V-shaped groove is generated.

このため、上述した本願発明者の先の発明にも、未だ
下記の問題点が生じるおそれがある。
For this reason, the following problems may still occur in the above-described invention of the present inventor.

すなわち、微小探針を設けるための微細貫通孔を形成
する基板としては、薄肉の化学切削性感光性ガラスを用
いることが特に好ましいが、基板としてこのような薄肉
の基板を用い、柱状の導電体の一端面側の基板の表面部
を単にエッチング除去することにより、柱状の導電体の
一部を所望の長さだけ基板表面から突出させて微小探針
とした場合、基板が薄肉であることとエッチング処理に
より上述のV字状の溝が生じることとから、柱状の導電
体またはこの柱状の導電体の外周に設けられた樹脂層と
基板との接触面積を十分に確保することができず、微小
探針の支持が不確かとなるおそれがある。微小探針の支
持が不確かである場合には、微小探針の折曲、破損、脱
落等をまねくことになり、耐久性、ひいては信頼性に優
れた微小探針を有する回路基板を得ることができないと
いう問題が生じる。
That is, it is particularly preferable to use a thin chemically cut photosensitive glass as a substrate for forming a fine through hole for providing a micro probe, but such a thin substrate is used as a substrate, and a columnar conductor is used. By simply etching away the surface portion of the substrate on one end surface side, a portion of the columnar conductor is projected from the substrate surface by a desired length to form a small probe, and the substrate is thin. Since the above-described V-shaped groove is generated by the etching process, a sufficient contact area between the substrate and the resin layer provided on the outer periphery of the columnar conductor or the columnar conductor cannot be secured, The support of the microprobe may be uncertain. If the support of the microprobe is uncertain, the microprobe may be bent, broken, dropped, etc., and it is possible to obtain a circuit board having a microprobe that is excellent in durability and reliability. A problem arises that it is not possible.

したがって本発明の目的は、本願発明者の先の発明を
更に改善して、薄肉の基板を用いた場合でも、この基板
により微小探針が堅固に支持されている微小探針を有す
る回路基板を得ることができる、微小探針を有する回路
基板の製法を提供することにある。
Accordingly, an object of the present invention is to further improve the prior invention of the present inventor, and to provide a circuit board having a fine probe in which a fine probe is firmly supported by this substrate even when a thin substrate is used. An object of the present invention is to provide a method for manufacturing a circuit board having a microprobe, which can be obtained.

[課題を解決するための手段] 本発明は上記目的を達成するためになされたものであ
り、本発明の微小探針を有する回路基板の製法は、化学
切削性感光性ガラスからなる基板に複数の微細貫通孔を
設ける工程と、前記複数の微細貫通孔を設けた前記基板
の一表面に、前記複数の微細貫通孔とそれぞれ一対一で
対応する複数の微細貫通孔を有し、かつ前記基板よりも
エッチングレートの高い化学切削性感光性ガラスからな
る補助基板を、この補助基板に設けた前記複数の微細貫
通孔と前記基板に設けた前記複数の微細貫通孔とをそれ
ぞれ一対一で連通させて固着させる工程と、前記連通さ
せた複数の微細貫通孔内に柱状の導電体を設ける工程
と、前記柱状の導電体を設けた後の前記補助基板をエッ
チング除去することにより、前記柱状の導電体の一端を
前記基板の表面より突出させる工程と、前記柱状の導電
体と電気的に接続する電気回路パターンを前記基板の表
面に設ける工程とを含むことを特徴とするものである。
Means for Solving the Problems The present invention has been made to achieve the above-mentioned object, and a method of manufacturing a circuit board having a microtip according to the present invention includes the steps of: Providing a plurality of fine through-holes, and having, on one surface of the substrate provided with the plurality of fine through-holes, a plurality of fine through-holes respectively corresponding to the plurality of fine through-holes, and the substrate An auxiliary substrate made of a chemically-cuttable photosensitive glass having a higher etching rate than the above, and the plurality of fine through holes provided in the auxiliary substrate and the plurality of fine through holes provided in the substrate communicate with each other in a one-to-one correspondence. Fixing the columnar conductor, providing a columnar conductor in the plurality of communicated fine through holes, and etching and removing the auxiliary substrate after providing the columnar conductor, thereby forming the columnar conductor. body And a step of providing, on the surface of the substrate, an electric circuit pattern that is electrically connected to the columnar conductor.

[作 用] 本発明の微小探針を有する回路基板の製法において
は、化学切削性感光性ガラスからなる基板に設けた複数
の微細貫通孔と、前記化学切削性感光性ガラスよりもエ
ッチングレートの高い化学切削性感光性ガラスからなる
補助基板に設けた複数の微細貫通孔とがそれぞれ一対一
で連通してなる微細貫通孔内に柱状の導電体を設けた
後、前記補助基板をエッチング除去することにより、前
記柱状の導電体の一端側を前記基板の表面より突出させ
ている。すなわち、本発明の微小探針を有する回路基板
の製法においては、基板の表面部を実質的にエッチング
除去することなく、柱状の導電体の一端側を基板表面よ
り突出させている。
[Operation] In the method for producing a circuit board having a micro-tip according to the present invention, a plurality of fine through-holes provided in a substrate made of chemically-cuttable photosensitive glass are provided with an etching rate lower than that of the chemically-cuttable photosensitive glass. After providing a columnar conductor in a fine through-hole in which a plurality of fine through-holes provided in an auxiliary substrate made of high chemically-cuttable photosensitive glass communicate with each other in a one-to-one relationship, the auxiliary substrate is etched away. Thereby, one end side of the columnar conductor is projected from the surface of the substrate. That is, in the method of manufacturing a circuit board having a micro probe according to the present invention, one end side of the columnar conductor is projected from the substrate surface without substantially removing the surface of the substrate by etching.

したがって本発明の微小探針を有する回路基板の製法
によれば、薄肉の基板を用いた場合でも、柱状の導電体
または柱状の導電体の外周に設けられた樹脂層と基板と
の間で、柱状の導電体すなわち微小探針を確実に支持す
るに十分な接触面積を確保しつつ、この微小探針を形成
することができ、これにより、微小探針が基板により堅
固に保持された微小探針を有する回路基板を得ることが
可能となる。
Therefore, according to the method for manufacturing a circuit board having a micro probe of the present invention, even when a thin substrate is used, between the substrate and the resin layer provided on the outer periphery of the columnar conductor or the columnar conductor, The microprobe can be formed while ensuring a sufficient contact area for securely supporting the columnar conductor, that is, the microprobe, and thereby, the microprobe that is firmly held by the substrate can be formed. It is possible to obtain a circuit board having a needle.

[実施例] 以下、本発明の実施例について、図面を用いて説明す
る。
[Example] Hereinafter, an example of the present invention will be described with reference to the drawings.

実施例 基板とする化学切削性感光性ガラスとして、100×100
×0.5mmのLiO2−Al2O3−SiO2(Au,Ce)系化学切削性感
光性ガラス(商品名:PEG3、HOYA(株)製)を用い、こ
の化学切削性感光性ガラス(以下、化学切削性感光性ガ
ラス基板という)に複数の微細貫通孔を設ける工程とし
て、この化学切削性感光性ガラス基板に、所定のマスク
を用いた露光処理(Hg−Xeランプを使用、露光時間は20
秒)、約520℃で1時間の現像処理(熱処理)、5%フ
ッ化水素酸でのエッチング処理(酸処理)および純水で
のリンス処理を順次施した。
Example As a chemically cut photosensitive glass used as a substrate, 100 × 100
A 0.5 mm LiO 2 —Al 2 O 3 —SiO 2 (Au, Ce) -based chemically cut photosensitive glass (trade name: PEG3, manufactured by HOYA Corporation) is used. In the process of providing a plurality of fine through holes in a chemically cut photosensitive glass substrate), an exposure process (using an Hg-Xe lamp using a predetermined mask) is performed on the chemically cut photosensitive glass substrate. 20
Second), a development treatment (heat treatment) at about 520 ° C. for 1 hour, an etching treatment (acid treatment) with 5% hydrofluoric acid, and a rinsing treatment with pure water.

これらの処理を施したことにより、第1図(a)に示
すように、開口径50μmの微細貫通孔1が、化学切削性
感光性ガラス基板2の中央部付近に80μm間隔で正方形
状(一辺の長さは約9mm)に設けられた。また同時に、
化学切削性感光性ガラス基板2の縁部から5mmのところ
に、開口径500μmの端子形成用貫通孔3が一定間隔で
複数個設けられた。これらの端子形成用貫通孔3は、各
微細貫通孔1と一対一に対応している。
By performing these treatments, as shown in FIG. 1 (a), fine through-holes 1 having an opening diameter of 50 μm are formed in a square shape (one side) at an interval of 80 μm near the center of the chemically-cuttable photosensitive glass substrate 2. Is about 9mm in length). At the same time,
At a position 5 mm from the edge of the chemically cuttable photosensitive glass substrate 2, a plurality of terminal forming through-holes 3 having an opening diameter of 500 μm were provided at regular intervals. These terminal forming through-holes 3 correspond one-to-one with the respective fine through-holes 1.

また、上記基板に固着させる補助基板を以下の要領で
得た。
An auxiliary substrate to be fixed to the substrate was obtained in the following manner.

まず、補助基板の材料として、20mm×20mm×30μmの
Li2O−Al2O3−SiO2(Au,Ce)系化学切削性感光性ガラス
(商品名:PEG3、HOYA(株)製)を用い、この化学切削
性感光性ガラスの中央部付近に、前述した化学切削性感
光性ガラス基板2の場合と同様にして、開口径50μmの
微細貫通孔を80μm間隔で正方形状(一辺の長さは約9m
m)に設けた。
First, as a material for the auxiliary substrate, 20 mm x 20 mm x 30 μm
Using Li 2 O-Al 2 O 3 -SiO 2 (Au, Ce) -based chemically-cuttable photosensitive glass (trade name: PEG3, manufactured by HOYA Corporation), near the center of the chemically-cuttable photosensitive glass In the same manner as in the case of the chemically-cuttable photosensitive glass substrate 2 described above, fine through-holes having an opening diameter of 50 μm are formed in a square shape at intervals of 80 μm (each side has a length of about 9 m).
m).

次いで、微細貫通孔を設けた後の上記化学切削性感光
性ガラスの全面に、微細貫通孔を設ける場合と同条件の
露光処理および現像処理(熱処理)を施した。これらの
処理を施したことで、フッ化水素酸によるこの化学切削
性感光性ガラスのエッチングレートは、基板である化学
切削性感光性ガラス基板2のエッチングレートの約50倍
となった。以下、この化学切削性感光性ガラスを化学切
削性感光性ガラス補助基板という。
Next, an exposure process and a development process (heat treatment) were performed on the entire surface of the chemically cut photosensitive glass after providing the fine through holes under the same conditions as in the case where the fine through holes were provided. By performing these treatments, the etching rate of the chemically-cuttable photosensitive glass by hydrofluoric acid was about 50 times the etching rate of the chemically-cuttable photosensitive glass substrate 2 as a substrate. Hereinafter, this chemically-cuttable photosensitive glass is referred to as a chemically-cuttable photosensitive glass auxiliary substrate.

次に、化学切削性感光性ガラス基板2の一表面に、こ
の化学切削性感光性ガラス基板2に設けた各微細貫通孔
1と上記化学切削性感光性ガラス補助基板に設けた各微
細貫通孔とをそれぞれ一対一で連通させ、上記化学切削
性感光性ガラス補助基板を固着させる工程として、ま
ず、化学切削性感光性ガラス補助基板の一表面の一部に
エポキシ樹脂系接着剤を塗布した。
Next, on one surface of the chemically cuttable photosensitive glass substrate 2, each fine through hole 1 provided in the chemically cuttable photosensitive glass substrate 2 and each fine through hole provided in the chemically cuttable photosensitive glass auxiliary substrate. As a step of allowing the chemical-cuttable photosensitive glass auxiliary substrate to adhere to each other in a one-to-one manner, first, an epoxy resin-based adhesive was applied to a part of one surface of the chemical-cuttable photosensitive glass auxiliary substrate.

次いで、第1図(b)に示すように、化学切削性感光
性ガラス基板2に設けた各微細貫通孔1と化学切削性感
光性ガラス補助基板4に設けた各微細貫通孔5とがそれ
ぞれ一対一で連通するよう、化学切削性感光性ガラス基
板2の厚さ方向の一表面とエポキシ樹脂系接着剤(図示
せず)を塗布した化学切削性感光性ガラス補助基板4の
表面とを当接させて、エポキシ系接着剤により、化学切
削性感光性ガラス基板2の一表面に化学切削性感光性ガ
ラス補助基板4を固着させた。このときの微細貫通孔1
と微細貫通孔5との位置合わせは、化学切削性感光性ガ
ラス基板2に予め付しておいた微細貫通孔1と所定の位
置関係にあるマーク(図示せず)と、化学切削性感光性
ガラス補助基板4に予め付しておいた微細貫通孔5と所
定の位置関係にあるマーク(図示せず)とを一致させる
ことで行った。なお、微細貫通孔1が設けられた後の化
学切削性感光性ガラス基板2と化学切削性感光性ガラス
補助基板4との固着物、以下、基材6という。
Next, as shown in FIG. 1 (b), each fine through-hole 1 provided in the chemically-cuttable photosensitive glass substrate 2 and each fine through-hole 5 provided in the chemically-cuttable photosensitive glass auxiliary substrate 4 are respectively formed. One surface in the thickness direction of the chemically-cuttable photosensitive glass substrate 2 and the surface of the chemically-cuttable photosensitive glass auxiliary substrate 4 coated with an epoxy resin-based adhesive (not shown) are so contacted as to be in one-to-one communication. Then, the chemically cuttable photosensitive glass auxiliary substrate 4 was fixed to one surface of the chemically cuttable photosensitive glass substrate 2 with an epoxy adhesive. Fine through hole 1 at this time
The alignment between the fine through-holes 5 and the marks (not shown) having a predetermined positional relationship with the fine through-holes 1 previously attached to the chemically-cuttable photosensitive glass substrate 2 is performed. This was performed by matching the fine through-holes 5 previously provided on the glass auxiliary substrate 4 with marks (not shown) having a predetermined positional relationship. In addition, the fixed substance of the chemically-cuttable photosensitive glass substrate 2 and the chemically-cuttable photosensitive glass auxiliary substrate 4 after the fine through-holes 1 are provided, hereinafter referred to as a base material 6.

次に、連通させた複数の微細貫通孔内に柱状の導電体
を設ける工程として、まず、微細貫通孔1と微細貫通孔
5とが連通してなる微細貫通孔の内壁を、エポキシ樹脂
系接着剤をIPA(イソプロピルアルコール)に溶解させ
て得た溶液(容量比で、エポキシ樹脂系接着剤/IPA=1/
30)でぬらした後、乾燥固化させて、第1図(c)に示
すように、微細貫通孔1と微細貫通孔5とが連通してな
る微細貫通孔の内壁に、エポキシ樹脂層7aを設けた。ま
た同時に、化学切削性感光性ガラス基板2に設けた各端
子形成用貫通孔3の内壁にも、同様にしてエポキシ樹脂
層7bを設けた。これらのエポキシ樹脂層7aおよび7bは、
後述する無電解メッキにより析出する金属の化学切削性
感光性ガラス基板2上および化学切削性感光性ガラス補
助基板4上への付着性を向上させるためのものである。
Next, as a step of providing a columnar conductor in the plurality of communicating fine through holes, first, an inner wall of the fine through hole in which the fine through hole 1 and the fine through hole 5 communicate with each other is bonded with an epoxy resin adhesive. Solution obtained by dissolving the agent in IPA (isopropyl alcohol) (by volume, epoxy resin adhesive / IPA = 1 /
After wetting in step 30), the resin is dried and solidified, and as shown in FIG. 1 (c), an epoxy resin layer 7a is applied to the inner wall of the fine through hole in which the fine through hole 1 and the fine through hole 5 communicate. Provided. At the same time, an epoxy resin layer 7b was similarly provided on the inner wall of each terminal forming through hole 3 provided in the chemically cut photosensitive glass substrate 2. These epoxy resin layers 7a and 7b
This is for improving the adhesion of the metal deposited by the electroless plating described later on the chemically cuttable photosensitive glass substrate 2 and the chemically cuttable photosensitive glass auxiliary substrate 4.

次いで、エポキシ樹脂層7aを設けた後の基材6に無電
解Ni−Pメッキ(部分メッキ)処理を施して、第1図
(d)に示すように、各エポキシ樹脂層7a上に、微細貫
通孔1と微細貫通孔4とが連通してなる各微細貫通孔を
閉塞するNi−P8aを析出させた。また同時に、各エポキ
シ樹脂層7b上に、各端子形成用貫通孔3を閉塞させるこ
となく、Ni−P 8bを析出させた。
Next, the substrate 6 after the provision of the epoxy resin layer 7a is subjected to an electroless Ni-P plating (partial plating) treatment, and a fine pattern is formed on each epoxy resin layer 7a as shown in FIG. 1 (d). Ni-P8a, which closes each fine through-hole formed by communication between the through-hole 1 and the fine through-hole 4, was deposited. At the same time, Ni-P 8b was deposited on each epoxy resin layer 7b without closing each through hole 3 for forming a terminal.

このときの無電解Ni−Pメッキ処理は、活性化、
触媒付与、触媒活性化、無電解メッキの順で、それ
ぞれ以下の要領で行った。
The electroless Ni-P plating process at this time is activated,
The steps were as follows in the order of catalyst application, catalyst activation, and electroless plating.

活性化 活性化剤として、ITOリダクター(商品名、奥野製薬
(株)製)に塩酸を加えてpHを8.8とした溶液を、その
濃度が200ml/となるように純水で希釈して得た液温45
℃の水溶液中に2分間浸漬した後、純水で洗浄した。
Activation As an activator, a solution was prepared by adding hydrochloric acid to an ITO reducer (trade name, manufactured by Okuno Pharmaceutical Co., Ltd.) to a pH of 8.8, and the solution was diluted with pure water to a concentration of 200 ml /. Liquid temperature 45
After being immersed in an aqueous solution of 2 ° C. for 2 minutes, the substrate was washed with pure water.

触媒付与 塩化バナジウムおよび塩化スズの塩酸溶液(商品名:I
TOキャタリスト、奥野製薬(株)製)と、バッファ(商
品名:ITO−SAL、奥野製薬(株)製)と、35%塩酸と
を、それぞれ60ml/、50g/、150ml/の割合で純水
に添加して得た液温35℃の水溶液中に6分間浸漬した
後、純水で洗浄した。
Hydrochloride solution of vanadium chloride and tin chloride (trade name: I
TO Catalyst, manufactured by Okuno Pharmaceutical Co., Ltd.), buffer (trade name: ITO-SAL, manufactured by Okuno Pharmaceutical Co., Ltd.) and 35% hydrochloric acid at a ratio of 60 ml /, 50 g /, 150 ml /, respectively. After being immersed in an aqueous solution at a liquid temperature of 35 ° C. obtained by adding to water for 6 minutes, it was washed with pure water.

触媒活性化 触媒活性化剤であるITOアクセレーター(商品名、奥
野製薬(株)製)を200ml/となるように純水で希釈し
て得た液温25℃の水溶液中に2分間浸漬した後、純水で
洗浄した。
Catalyst activation A catalyst activator, an ITO accelerator (trade name, manufactured by Okuno Pharmaceutical Co., Ltd.) was immersed in an aqueous solution at a liquid temperature of 25 ° C. obtained by diluting with 200 ml / pure water with pure water for 2 minutes. Thereafter, the substrate was washed with pure water.

無電解メッキ 還元剤としてITO−90−M(商品名、奥野製薬(株)
製)を、Ni2+イオンとピロリン酸イオン(還元剤)とを
含むニッケル塩水溶液としてITO−90−1(商品名、奥
野製薬(株)製)を用い、これらを100ml/および50ml
/の割合で純水に添加して得た液温80℃の水溶液中に
6時間浸漬した後、純水で洗浄した。なお、析出速度は
約1μm/10分である。
Electroless plating ITO-90-M (trade name, Okuno Pharmaceutical Co., Ltd.) as a reducing agent
Manufactured by ITO-90-1 (trade name, manufactured by Okuno Pharmaceutical Co., Ltd.) as a nickel salt aqueous solution containing Ni 2+ ion and pyrophosphate ion (reducing agent).
It was immersed in an aqueous solution at a liquid temperature of 80 ° C. obtained by adding to pure water at a ratio of / for 6 hours, and then washed with pure water. The deposition rate is about 1 μm / 10 minutes.

この後、Ni−P 8aにおいて基材6の表面より突出して
いる部分を酸化セリウムからなる研摩剤を用いて研摩除
去し、洗浄を行って、第1図(e)に示すように、微細
貫通孔1と微細貫通孔5とが連通してなる各微細貫通孔
内に、化学切削性感光性ガラス基板2の厚さ方向の一表
面と実質的に同一の平面上に一方の端面を有し、化学切
削性感光性ガラス補助基板4の厚さ方向の一表面と実質
的に同一の平面上にもう一方の端面を有するNi−P柱状
体8cを設けた。また同様に、Ni−P 8bにおいて化学切削
性感光性ガラス基板2の表面より突出している部分を研
摩除去し、洗浄を行って、第1図(e)に示したよう
に、各端子形成用貫通孔3内に、化学切削性感光性ガラ
ス基板2の厚さ方向の一表面と実質的に同一の平面上に
一方の端面を有し、化学切削性感光性ガラス基板2の厚
さ方向の他の一表面と実質的に同一の平面上にもう一方
の端面を有するNi−P中空円柱状体8dを設けた。
Thereafter, the portion of the Ni-P 8a protruding from the surface of the substrate 6 is polished and removed using an abrasive made of cerium oxide, and is washed, and as shown in FIG. In each of the fine through-holes in which the hole 1 and the fine through-hole 5 communicate with each other, one end face is provided on the substantially same plane as one surface in the thickness direction of the chemically-cuttable photosensitive glass substrate 2. A Ni-P columnar body 8c having the other end surface on the substantially same plane as one surface in the thickness direction of the chemically-cuttable photosensitive glass auxiliary substrate 4 was provided. Similarly, a portion of the Ni-P 8b protruding from the surface of the chemically cuttable photosensitive glass substrate 2 is polished and removed, followed by cleaning, and as shown in FIG. In the through hole 3, one end surface is substantially on the same plane as one surface in the thickness direction of the chemically-cuttable photosensitive glass substrate 2, and has one end surface in the thickness direction of the chemically-cuttable photosensitive glass substrate 2. A Ni-P hollow cylindrical body 8d having the other end surface on the substantially same plane as the other surface was provided.

次に、Ni−P柱状体8cを設けた後の化学切削性感光性
ガラス補助基板4をエッチング除去することにより、Ni
−P柱状体8cの一端を化学切削性感光性ガラス基板2の
表面より突出させる工程として、Ni−P柱状体8cを設け
た後の基材6を5%フッ化水素酸に2分間浸漬した。
Next, the chemically-cuttable photosensitive glass auxiliary substrate 4 provided with the Ni-P columnar bodies 8c is removed by etching.
As a step of projecting one end of the P column 8c from the surface of the chemically cut photosensitive glass substrate 2, the substrate 6 provided with the Ni-P column 8c was immersed in 5% hydrofluoric acid for 2 minutes. .

これにより、化学切削性感光性ガラス補助基板4は完
全にエッチング除去された。このとき化学切削性感光性
ガラス基板2もエッチングされたが、5%フッ化水素酸
による化学切削性感光性ガラス基板2のエッチングレー
トは、化学切削性感光性ガラス補助基板4のエッチング
レートの約1/50であるので、このときエッチングされた
表面部の厚さは僅かに0.6μm程度であり、実用上無視
できる範囲である。
As a result, the chemically-cuttable photosensitive glass auxiliary substrate 4 was completely removed by etching. At this time, the chemically cut photosensitive glass substrate 2 was also etched, but the etching rate of the chemically cut photosensitive glass substrate 2 with 5% hydrofluoric acid was about the same as the etching rate of the chemically cut photosensitive glass auxiliary substrate 4. Since it is 1/50, the thickness of the etched surface at this time is only about 0.6 μm, which is a range that can be ignored in practical use.

化学切削性感光性ガラス補助基板4がエッチング除去
され後の基材6の端面図を、第1図(f)に示す。
FIG. 1 (f) shows an end view of the base material 6 after the chemically-cuttable photosensitive glass auxiliary substrate 4 has been removed by etching.

第1図(f)に示すように、化学切削性感光性ガラス
補助基板4がエッチング除去されたことにより、Ni−P
柱状体8cの一端は化学切削性感光性ガラス基板2の表面
より約30μm突出した。この、一端が突出したNi−P柱
状体8cが、微小探針に相当する。
As shown in FIG. 1 (f), the chemically-cuttable photosensitive glass auxiliary substrate 4 was etched away, and the Ni-P
One end of the columnar body 8c protrudes about 30 μm from the surface of the chemically cut photosensitive glass substrate 2. The Ni-P column 8c protruding at one end corresponds to a minute probe.

次に、Ni−P柱状体8cと電気的に接続する電気回路パ
ターンを化学切削性感光性ガラス基板2の表面に設ける
工程として、まず、化学切削性感光性ガラス基板2にお
いて化学切削性感光性ガラス補助基板4を固着させた表
面の反対側の表面に、第1図(g)に示すように、厚さ
約1000ÅのITO(酸化インジウム・スズ)膜9a(シート
抵抗30〜40Ω/□)を成膜した。ITO膜9aの成膜は、DC
スパッタ法により行った。このとき、各端子形成用貫通
孔3内に設けたNi−P中空円柱状体8dの開口部上には、
ITO膜は成膜されなかった。
Next, as a step of providing an electric circuit pattern electrically connected to the Ni-P columnar body 8c on the surface of the chemically-cuttable photosensitive glass substrate 2, first, the chemically-cuttable photosensitive glass substrate 2 is used. As shown in FIG. 1 (g), an ITO (indium tin oxide) film 9a (sheet resistance 30 to 40Ω / □) having a thickness of about 1000 に is formed on the surface opposite to the surface on which the glass auxiliary substrate 4 is fixed. Was formed. The ITO film 9a is formed by DC
This was performed by a sputtering method. At this time, on the opening of the Ni-P hollow cylindrical body 8d provided in each terminal forming through hole 3,
No ITO film was formed.

ITO膜9aを成膜した後、第1図(h)に示すように、
このITO膜9a上にフォトレジスト(商品名:ヘキストAZ1
350、ヘキスト・ジャパン(株)製)を約10000Åの厚さ
にスピン・コートしてフォトレジスト層10aを設け、90
℃で30分間ベークした。
After forming the ITO film 9a, as shown in FIG.
A photoresist (trade name: Hoechst AZ1) is formed on the ITO film 9a.
350, manufactured by Hoechst Japan Co., Ltd.) and spin-coated to a thickness of about 10,000 mm to form a photoresist layer 10a,
Bake at ℃ for 30 minutes.

次いで、所定のパターンが付いたフォトマスクを用い
てのコンタクト露光処理および現像処理を行って、第1
図(i)に示すように、ITO膜9a上にレジストパターン1
0bを形成し、このレジストパターン10bを120℃で30分間
ポストベークした。
Next, a contact exposure process and a development process using a photomask having a predetermined pattern
As shown in FIG. 1I, a resist pattern 1 is formed on the ITO film 9a.
0b was formed, and the resist pattern 10b was post-baked at 120 ° C. for 30 minutes.

ポストベーク後、レジストパターン10bが形成された
化学切削性感光性ガラス基板2を、40ボーメ度FeCl3
溶液と36%HCl水溶液との1:1混液(液温50℃)中に約1
分間浸漬することにより、第1図(j)に示すように、
レジストパターン10bをマスクとしたITO膜9aのエッチン
グ除去を行った。
After post-baking, the chemically cut photosensitive glass substrate 2 on which the resist pattern 10b is formed is placed in a 1: 1 mixed solution (solution temperature: 50 ° C.) of a 40 baume FeCl 3 aqueous solution and a 36% HCl aqueous solution for about 1 hour.
By immersing for 1 minute, as shown in FIG.
The ITO film 9a was removed by etching using the resist pattern 10b as a mask.

次いで、純水を用いてリンス処理を施した後に、有機
溶剤(イソプロピルアルコール)を用いてレジストパタ
ーン10bを剥離して、第1図(k)に示すように、Ni−
P柱状体8cの一端と電気的に接続するITO膜からなる複
数の電気回路パターン9bを、化学切削性感光性ガラス基
板2表面に形成した。なお、各電気回路パターン9bは、
Ni−P柱状体8cの一端と電気的に接続するとともに、こ
のNi−P柱状体8c一対一に対応している、端子形成用貫
通孔3内に設けたNi−P中空円柱状体8dとも電気的に接
続している。
Next, after performing a rinsing process using pure water, the resist pattern 10b is peeled off using an organic solvent (isopropyl alcohol), and as shown in FIG.
A plurality of electric circuit patterns 9b composed of an ITO film electrically connected to one end of the P pillar 8c were formed on the surface of the chemically cut photosensitive glass substrate 2. In addition, each electric circuit pattern 9b is
While being electrically connected to one end of the Ni-P column 8c, the Ni-P column 8c and the Ni-P hollow column 8d provided in the terminal forming through-hole 3 corresponding to the Ni-P column 8c one-to-one. Electrically connected.

この後、電気回路パターン9bの電気抵抗を低減させる
ことを目的として、以下の要領で、電気回路パターン9b
上にNi−P層を設けた。
Thereafter, for the purpose of reducing the electric resistance of the electric circuit pattern 9b, the electric circuit pattern 9b
An Ni-P layer was provided thereon.

まず、Ni−P柱状体8cが突出している側の化学切削性
感光性ガラス基板2表面上に、第1図(l)に示すよう
に、保護用の透明粘着テープ11を貼り付けた。次いで、
前述したNi−P 8a、8bを析出させる場合と同様にして無
電解Ni−Pメッキ処理を行って、第1図(m)に示すよ
うに、電気回路パターン9b上に厚さ2μmのNi−P層12
を析出させた。このときの無電解メッキの処理時間は、
約20分とした。
First, as shown in FIG. 1 (l), a protective transparent adhesive tape 11 was stuck on the surface of the chemically cut photosensitive glass substrate 2 on the side where the Ni-P columnar body 8c protrudes. Then
Electroless Ni-P plating is performed in the same manner as in the case of depositing Ni-Ps 8a and 8b described above, and as shown in FIG. 1 (m), Ni-P of 2 μm thickness is formed on the electric circuit pattern 9b. P layer 12
Was precipitated. The processing time of the electroless plating at this time is
Approximately 20 minutes.

Ni−P層12を析出させた後、透明粘着テープ11を剥離
して、第1図(n)に示すように、Ni−P柱状体8cの一
端と電気的に接続する電気回路パターンとして、ITO膜
からなる電気回路パターン9b上にNi−P層12を設けてな
る複数の電気回路パターン13を有する化学切削性感光性
ガラス基板2、すなわち微小探針を有する回路基板14を
得た。
After depositing the Ni-P layer 12, the transparent adhesive tape 11 is peeled off, and as shown in FIG. 1 (n), as an electric circuit pattern electrically connected to one end of the Ni-P columnar body 8c, A chemically-cuttable photosensitive glass substrate 2 having a plurality of electric circuit patterns 13 in which a Ni-P layer 12 is provided on an electric circuit pattern 9b made of an ITO film, that is, a circuit substrate 14 having a fine probe was obtained.

このようにしてなる、微小探針を有する回路基板14
を、電気回路パターン13を設けた側から見た上面図を第
2図(a)に示す。また、第2図(a)における中央部
(微細貫通孔1を設けた部分)の拡大図を第2図(b)
に示す。なお、第2図(a)および(b)において第1
図と共通する部材については、第1図と同じ符号を付し
てその説明を省略する。
The circuit board 14 having the fine probe thus formed
FIG. 2 (a) shows a top view of FIG. 2 as viewed from the side where the electric circuit pattern 13 is provided. FIG. 2 (b) is an enlarged view of the central portion (portion where the fine through hole 1 is provided) in FIG. 2 (a).
Shown in 2 (a) and 2 (b).
The same reference numerals as those in FIG. 1 denote the same members as those in FIG. 1, and a description thereof will be omitted.

この後、本実施例においては、微小探針を有する回路
基板14(以下、単に回路基板14という)の機械的強度の
補強を目的として、この回路基板14表面上に、以下の要
領で補強用基板を固着させた。
Thereafter, in the present embodiment, for the purpose of reinforcing the mechanical strength of the circuit board 14 having the fine probe (hereinafter, simply referred to as the circuit board 14), the reinforcement is provided on the surface of the circuit board 14 in the following manner. The substrate was fixed.

まず、補強用基板の材料として100×100×2mmのLi2O
−Al2O3−SiO2(Au,Ce)系化学切削性感光性ガラス(商
品名:PEG3、HOYA(株)製)板を用い、前述した、化学
切削性感光性ガラス基板2に複数の微細貫通孔1および
端子形成用貫通孔3を設ける工程と同様に、所定のマス
クを使用しての露光処理、現像処理(熱処理)、エッチ
ング処理(酸処理)およびリンス処理を施して、第3図
(a)に示すように、化学切削性感光性ガラス板20の縁
部から5mmのところに、開口径500μmの貫通孔21を一定
間隔で複数個設けた。これらの貫通孔21は、化学切削性
感光性ガラス基板2に設けた各端子形成用貫通孔3と一
対一に対応している。
First, 100 × 100 × 2mm Li 2 O
-Al 2 O 3 -SiO 2 (Au, Ce) -based chemically cut photosensitive glass (trade name: PEG3, manufactured by HOYA Corporation) Similarly to the step of providing the fine through-holes 1 and the through-holes 3 for forming terminals, exposure processing using a predetermined mask, development processing (heat treatment), etching processing (acid processing), and rinsing processing are performed. As shown in FIG. 5A, a plurality of through holes 21 having an opening diameter of 500 μm were provided at a constant interval at 5 mm from the edge of the chemically cut photosensitive glass plate 20. These through holes 21 correspond one-to-one with the terminal forming through holes 3 provided in the chemically cut photosensitive glass substrate 2.

貫通孔21を設けた後、前述した、化学切削性感光性ガ
ラス基板2に設けた複数の微細貫通孔1内および端子形
成用貫通孔3内にNi−P柱状体8a、8bを設ける場合と同
様にして、まず、第3図(b)に示すように、化学切削
性感光性ガラス板20に設けた各貫通孔21の内壁にエポキ
シ樹脂層22を設け、このエポキシ樹脂層22を設けた化学
切削性感光性ガラス板20に無電解Ni−Pメッキ(部分メ
ッキ)処理を11時間施して、第3図(c)に示すよう
に、各貫通孔21内のエポキシ樹脂層22上および各貫通孔
21の開口部近傍の化学切削性感光性ガラス板20表面に、
各貫通孔21を閉塞させることなく、Ni−P 23aを析出さ
せた。次いで、各貫通孔21の開口部近傍の化学切削性感
光性ガラス板20表面に付着したNi−Pを、酸化セリウム
からなる研摩剤を用いて研摩除去し、洗浄を行って、第
3図(d)に示すように、各貫通孔21内に、化学切削性
感光性ガラス板20の厚さ方向の一表面と実質的に同一の
平面上に一方の端面を有し、前記ガラス板20の厚さ方向
の他の一表面と実質的に同一の平面上にもう一方の端面
を有するNi−P中空円柱状体23bを設けた。
After the through holes 21 are provided, the Ni-P columnar bodies 8a and 8b are provided in the plurality of fine through holes 1 and the terminal forming through holes 3 provided in the chemically-cuttable photosensitive glass substrate 2 as described above. Similarly, first, as shown in FIG. 3 (b), an epoxy resin layer 22 was provided on the inner wall of each through hole 21 provided in the chemically cut photosensitive glass plate 20, and this epoxy resin layer 22 was provided. An electroless Ni-P plating (partial plating) treatment is applied to the chemically cut photosensitive glass plate 20 for 11 hours, and as shown in FIG. Through hole
On the surface of the chemically cut photosensitive glass plate 20 near the opening of 21,
Ni-P 23a was deposited without closing each through hole 21. Next, the Ni-P attached to the surface of the chemically cut photosensitive glass plate 20 near the opening of each through hole 21 is polished and removed using an abrasive made of cerium oxide, and washed, and FIG. As shown in d), each of the through-holes 21 has one end surface on a plane substantially flush with one surface in the thickness direction of the chemically-cuttable photosensitive glass plate 20, and A Ni-P hollow cylindrical body 23b having the other end face was provided on a plane substantially the same as the other surface in the thickness direction.

次いで、各貫通孔21内にNi−P中空円柱状体23bを設
けた化学切削性感光性ガラス板20と、回路基板14とを、
第3図(e)に示すように、ホットメルト型シート状接
着剤24を介して積層して固定した。このときの積層およ
び固定は、回路基板14に設けた複数の電気回路パターン
13が積層物の内側に位置するように行うとともに、化学
切削性感光性ガラス板20に設けた各貫通孔21と感光性ガ
ラス基板2に設けた各端子形成用貫通孔3との位置が合
うように行った。
Next, the chemically-cuttable photosensitive glass plate 20 provided with the Ni-P hollow cylindrical body 23b in each through hole 21 and the circuit board 14,
As shown in FIG. 3 (e), they were laminated and fixed via a hot melt type sheet adhesive 24. At this time, the lamination and fixing are performed by a plurality of electric circuit patterns provided on the circuit board 14.
13 is located inside the laminate, and the positions of the through holes 21 provided in the chemically cuttable photosensitive glass plate 20 and the terminal forming through holes 3 provided in the photosensitive glass substrate 2 match. Went like so.

次に、この積層物に上方から約400gの荷重をかけ真空
オーブン中で120〜140℃に加熱した後、冷却して、第3
図(f)に示すように、ホットメルト型シート状接着剤
24により、各貫通孔21内にNi−P中空円柱状体23bを設
けた化学切削性感光性ガラス板20と回路基板14とを固着
させた。
Next, a load of about 400 g was applied to the laminate from above, and the laminate was heated to 120 to 140 ° C. in a vacuum oven.
As shown in Fig. (F), hot melt type sheet adhesive
24, the chemically-cuttable photosensitive glass plate 20 provided with the Ni-P hollow cylindrical body 23b in each through hole 21 and the circuit board 14 were fixed.

固着後、化学切削性感光性ガラス板20に設けた各貫通
孔21から鋭利な先端を有する針金を差し込むことによ
り、化学切削性感光性ガラス板20に設けた各貫通孔21と
化学切削性感光性ガラス基板2に設けた各端子形成用貫
通孔3との間に介在しているホットメルト型シート状接
着剤24に穿設を施して、第3図(g)に示すように、回
路基板14に、複数の貫通孔21内にNi−P中空円柱状体23
bを設けた化学切削性感光性ガラス板20からなる補強用
基板を設けた。
After fixing, a wire having a sharp tip is inserted from each through-hole 21 provided in the chemically-cuttable photosensitive glass plate 20 so that each of the through-holes 21 provided in the chemically-cuttable photosensitive glass plate 20 and the chemically-cuttable photosensitive glass plate 20 are connected. The hot-melt type sheet adhesive 24 interposed between each terminal forming through hole 3 provided in the functional glass substrate 2 is perforated to form a circuit board as shown in FIG. 3 (g). 14, a plurality of Ni-P hollow cylindrical bodies 23 in a plurality of through holes 21.
A reinforcing substrate made of the chemically cut photosensitive glass plate 20 provided with b was provided.

さらに本実施例では、以下の要領で接続端子を付設し
た。
Further, in this embodiment, connection terminals are provided in the following manner.

まず、第4図(a)に示すように、化学切削性感光性
ガラス板20に設けた各貫通孔21から直径300μmのステ
ンレス製針金30をそれぞれ差し込み、これらステンレス
製針金30の先端が、化学切削性感光性ガラス基板2に設
けた各端子形成用貫通孔3に達し、かつこの端子形成用
貫通孔3から突出しない状態に保持した。
First, as shown in FIG. 4 (a), a stainless steel wire 30 having a diameter of 300 μm is inserted from each through hole 21 provided in the chemically cuttable photosensitive glass plate 20, and the tip of the stainless steel wire 30 is It reached each terminal forming through hole 3 provided in the cuttable photosensitive glass substrate 2 and was kept in a state where it did not protrude from the terminal forming through hole 3.

次いで、ステンレス製針金30と貫通孔21および端子形
成用貫通孔3との間に溶融ハンダを流し込んだ後、硬化
させて、第4図(b)に示すようにステンレス製針金30
をハンダ31により固定し、これによりステンレス製針金
30からなる接続端子を形成して、接続端子および補強用
基板が付設された本発明の微小探針を有する回路基板32
を得た。
Next, a molten solder is poured between the stainless wire 30 and the through hole 21 and the through hole 3 for forming a terminal, and then hardened, and as shown in FIG.
Is fixed by the solder 31 and the stainless steel wire
A circuit board 32 having a micro-tip according to the present invention having a connection terminal formed of 30 and having a connection terminal and a reinforcing substrate attached thereto
I got

本発明は、以上説明した実施例に限定されるものでは
なく、下記の変形例や応用例を含むものである。
The present invention is not limited to the embodiments described above, but includes the following modifications and application examples.

まず、実施例では基板として方形状の化学切削性感光
性ガラスを用いたが、本発明の微小探針を有する回路基
板の製法においては、基板である化学切削性感光性ガラ
スの形状は特に限定されるものではなく、円板状等、適
宜変形可能である。
First, in the example, a square chemically cut photosensitive glass was used as a substrate. However, in the method of manufacturing a circuit board having a micro probe according to the present invention, the shape of the chemically cut photosensitive glass as the substrate is particularly limited. However, the shape can be appropriately changed to a disk shape or the like.

また実施例では、補助基板の材料として基板と同質の
化学切削性感光性ガラスを用いたが、本発明の微小探針
を有する回路基板の製法において補助基板として用いる
化学切削性感光性ガラスは、基板として用いた化学切削
性感光性ガラスよりもエッチングレートの高い化学切削
性感光性ガラスであれば特に限定されるものではない。
基板と同組成(同質)の化学切削性感光性ガラスであっ
ても、実施例から明らかなように、露光処理および現像
処理を施すことにより、すなわち結晶化させることによ
り、基板よりもエッチングレートを高くすることができ
る。このときのエッチングレートは、露光時間、現像処
理温度、現像処理時間等を変えることにより、ある範囲
内で変化させることができる。補助基板として実施例で
用いたPEG3(HOYA(株)製)を使用する場合の最適露光
時間は15〜20秒である。なお、表−1に各種化学切削性
感光性ガラスの組成を示す。
In the examples, the chemically cut photosensitive glass of the same quality as the substrate was used as the material of the auxiliary substrate.However, the chemically cut photosensitive glass used as the auxiliary substrate in the method of manufacturing a circuit board having a micro probe of the present invention is: There is no particular limitation as long as it is a chemically cut photosensitive glass having a higher etching rate than the chemically cut photosensitive glass used as the substrate.
As is clear from the examples, even the chemically cut photosensitive glass having the same composition (same quality as the substrate) has an etching rate higher than that of the substrate by performing exposure processing and development processing, that is, by crystallization. Can be higher. The etching rate at this time can be changed within a certain range by changing the exposure time, the development processing temperature, the development processing time, and the like. When PEG3 (manufactured by HOYA Corporation) used in the examples is used as the auxiliary substrate, the optimal exposure time is 15 to 20 seconds. Table 1 shows the compositions of various chemically-cuttable photosensitive glasses.

補助基板の厚さは、微小探針の基板からの突出長に応
じて適宜選択される。
The thickness of the auxiliary substrate is appropriately selected according to the length of projection of the minute probe from the substrate.

また実施例では、補助基板を基板に固着させるにあた
ってエポキシ樹脂系接着剤を用いたが、シラノール系接
着剤等の他の種類の接着剤等により固着させてもよい。
さらに、補助基板と基板との少なくとも一方を他方に押
圧することで、補助基板と基板とを密着させてもよく、
本明細書における固着とは、押圧による密着も含むもの
とする。
In the embodiment, the epoxy resin-based adhesive is used for fixing the auxiliary substrate to the substrate. However, the auxiliary substrate may be fixed to another type of adhesive such as a silanol-based adhesive.
Further, by pressing at least one of the auxiliary substrate and the substrate to the other, the auxiliary substrate and the substrate may be brought into close contact with each other,
In this specification, the term “fixation” also includes adhesion by pressing.

補助基板に設ける微細貫通孔の口径は、基板に設けた
微細貫通孔の口径と同じなくてもよく、基板に設けた微
細貫通孔の口径より小さくてもよい。補助基板に設ける
微細貫通孔の口径が大きすぎると、最終的に得られる複
数の微小探針において、隣り合う微小探針の先端部同士
が接触するおそれが生じる。
The diameter of the fine through-hole provided in the auxiliary substrate may not be the same as the diameter of the fine through-hole provided in the substrate, and may be smaller than the diameter of the fine through-hole provided in the substrate. If the diameter of the fine through-hole provided in the auxiliary substrate is too large, there is a possibility that the tips of adjacent fine probes may come into contact with each other in a plurality of finally obtained fine probes.

また実施例では、柱状のNi−Pを設けた後の基材を5
%フッ化水素酸に浸漬することにより、補助基板をエッ
チング除去したが、浸漬法の他に、スプレー法、RIE
(反応性エッチング)やプラズマエッチング等のドライ
エッチング等によっても、補助基板を除去することがで
きる。このときのエッチング液としては、5%フッ化水
素酸の他に、各種濃度のフッ化水素酸、ケイフッ化水素
酸、フッ化アンモニウム水溶液等を用いることができ
る。エッチング液としてフッ化水素酸を用いる場合い
は、特に、2〜6%フッ化水素酸を用いることにより基
板のエッチング量を抑制しつつ補助基板をエッチング除
去することができる。
In the embodiment, the base material after the columnar Ni-P is
The auxiliary substrate was removed by etching by immersion in hydrofluoric acid.
The auxiliary substrate can also be removed by dry etching such as (reactive etching) or plasma etching. At this time, in addition to 5% hydrofluoric acid, various concentrations of hydrofluoric acid, hydrosilicofluoric acid, an aqueous solution of ammonium fluoride, and the like can be used. When hydrofluoric acid is used as the etchant, the use of 2 to 6% hydrofluoric acid enables the auxiliary substrate to be etched away while suppressing the amount of etching of the substrate.

微細貫通孔は、実施例で説明したフォトリソグラフィ
ー法の他に、他の手法によるフォトリソグラフィー法、
放電加工、印刷法、印刷加工、レーザー加工等により設
けてもよい。基板および/または補助基板としてセラミ
ックスを用いる場合は、グリーンシートの段階で複数の
微細貫通孔を設けてから焼結してもよい。
Fine through-holes, in addition to the photolithography method described in the examples, photolithography by other methods,
It may be provided by electric discharge machining, printing, printing, laser machining or the like. When ceramics are used as the substrate and / or the auxiliary substrate, a plurality of fine through holes may be provided at the stage of the green sheet and then sintered.

基板の材質および形状ならびにこの基板に微細貫通孔
を形成する方法は、目的とする微小探針を有する回路基
板に要求される微小探針の大きさおよび数、微小探針の
配置精度、回路基板の用途およびその使用環境等に応じ
て、適宜選択される。微細な微小探針(例えば探針径が
300μm以下の微小探針)を高い精度の下に多数配置す
る場合には、実施例で説明したように、基板として化学
切削性感光性ガラスを用いたフォトリソグラフィー法に
より微細貫通孔を形成することが特に好ましい。
The material and shape of the substrate and the method of forming the fine through-holes in the substrate are based on the size and number of the microprobes required for the circuit board having the target microprobe, the placement accuracy of the microprobe, the circuit board Is appropriately selected in accordance with the use of the device and its use environment. A minute probe (for example, when the probe diameter is
When arranging a large number of microprobes (300 μm or less) with high precision, as described in the embodiment, it is necessary to form fine through holes by photolithography using a chemically cut photosensitive glass as a substrate. Is particularly preferred.

また、補助基板の材質およびこの補助基板に微細貫通
孔を形成する方法も、目的とする微小探針を有する回路
基板に要求される微小探針の大きさおよび数、微小探針
の配置精度等に応じて、適宜選択される。
The material of the auxiliary substrate and the method of forming the fine through-holes in the auxiliary substrate also include the size and number of the fine probes required for the circuit substrate having the target fine probes, the placement accuracy of the fine probes, and the like. Is appropriately selected according to the conditions.

基板に設けた微細貫通孔と補助基板に設けた微細貫通
孔とが連通してなる微細貫通孔内に柱状の導電体を設け
るにあたっては、実施例で用いた無電解Ni−Pメッキの
他、Co,Ni,Cu,Pd,Ag,Pt,Au等の導電性金属を無電解ッキ
処理してもよく、またこれらの金属とB,N,P,V,Mn,Fe,Z
n,Mo,Sn,W,Re,Tl等とを含有するものを無電解メッキ処
理してもよい。また、上述したものを途中まで無メ電解
メッキ処理し、さらに適当なリード線を形成した後電解
メッキ処理にてAu,Ag,Pt,Cr,Cu,Ni,Co等を析出させても
よい。
In providing the columnar conductor in the fine through hole in which the fine through hole provided in the substrate and the fine through hole provided in the auxiliary substrate communicate with each other, in addition to the electroless Ni-P plating used in the examples, Conductive metals such as Co, Ni, Cu, Pd, Ag, Pt, and Au may be electrolessly treated, and these metals and B, N, P, V, Mn, Fe, Z
Those containing n, Mo, Sn, W, Re, Tl, etc. may be subjected to electroless plating. Further, the above-mentioned components may be subjected to electroless plating halfway, and after forming a suitable lead wire, Au, Ag, Pt, Cr, Cu, Ni, Co, etc. may be deposited by electrolytic plating.

さらに、微細貫通孔に溶融ハンダを流し込む方法や、
導電性樹脂を流し込む方法等を適用することもできる。
溶融ハンダあるいは導電性樹脂を流し込む方法によれ
ば、基板および/または探針形成用補助層に設けた微細
貫通孔内に、容易に柱状の微細導電体を設けることがで
きる。
Furthermore, a method of pouring molten solder into the fine through holes,
A method of pouring a conductive resin or the like can also be applied.
According to the method of pouring the molten solder or the conductive resin, the columnar fine conductor can be easily provided in the fine through hole provided in the substrate and / or the probe forming auxiliary layer.

なお実施例では、無電解メッキにより析出する金属の
基板上および補助基板上への付着性を向上させるため
に、基板に設けた微細貫通孔と補助基板に設けた微細貫
通孔とが連通してなる微細貫通孔の内壁にエポキシ樹脂
層を設けたが、エポキシ樹脂に代えてフォトレジストま
たはアルコキシド等の、基板との密着性のよい材料や、
これらの材料にPd,Au,Pt等の触媒金属粉末を分散含有さ
せたものを用いても同様の効果が得られる。無電解メッ
キ処理の方法や基板および補助基板の材質によっては、
樹脂層等を設けなくとも、基板に設けた微細貫通孔と補
助基板に設けた微細貫通孔とが連通してなる微細貫通孔
内に柱状の導電体を設けることができる。
In the embodiment, in order to improve the adhesion of the metal deposited by electroless plating on the substrate and the auxiliary substrate, the fine through-hole provided in the substrate and the fine through-hole provided in the auxiliary substrate communicate with each other. An epoxy resin layer was provided on the inner wall of the fine through hole, but instead of epoxy resin, a material having good adhesion to the substrate, such as a photoresist or an alkoxide,
The same effect can be obtained by using a material in which a catalytic metal powder such as Pd, Au, Pt or the like is dispersed and contained in these materials. Depending on the method of electroless plating and the material of the substrate and auxiliary substrate,
Even without providing a resin layer or the like, a columnar conductor can be provided in a fine through hole in which the fine through hole provided in the substrate and the fine through hole provided in the auxiliary substrate communicate with each other.

また実例例では、柱状の導電体において電気回路パタ
ーンと接続する一端面を、基板の一表面と実質的に同一
の平面上に設けたが、柱状の導電体において電気回路パ
ターンと接続する一端面は、基板表面と実質的に同一の
平面上に設けなくてもよく、実質的に同一の平面より突
出していてもよい。すなわち、柱状の導電体において電
気回路パターンと接続する一端面は、電気回路パターン
が形成できる程度であれば、基板表面から突出していて
もよい。
Further, in the example, the one end face connected to the electric circuit pattern in the columnar conductor is provided on substantially the same plane as one surface of the substrate, but the one end face connected to the electric circuit pattern in the columnar conductor is provided. Need not be provided on substantially the same plane as the substrate surface, and may protrude from the substantially same plane. That is, one end face of the columnar conductor connected to the electric circuit pattern may protrude from the substrate surface as long as the electric circuit pattern can be formed.

なお、柱状の導電体を設けるにあたって、電気回路パ
ターンを設ける側の基板表面に予めテープ等を貼り付け
ておくことにより、得られる柱状の導電体の一端を、基
板の一表面と実質的に同一の平面上に形成することがで
きる。
In providing the columnar conductor, one end of the obtained columnar conductor is substantially the same as one surface of the substrate by previously attaching tape or the like to the surface of the substrate on which the electric circuit pattern is provided. Can be formed on a plane.

また実施例においては、電気回路パターンをITO膜とN
i−P層との2層構造としたが、1層構造あるいは3層
以上の多層構造としてもよく、その材料もITOおよびNi
−Pに限定されるものではなく、Cr、Au、Ag、Cu、Ni等
の導電性物質から適宜選択することができる。ITO膜に
よる電気回路パターンと柱状の導電体との間の電気抵抗
は、実施例のように、ITO膜上に厚さ1〜5μmのNi−
P層を設けることにより、より小さくすることができ
る。さらに、このNi−P層を酸化から保護するために、
Ni−P層を金により被覆してもよく、金による被覆は、
無電解メッキ法あるいは電解メッキ法を用いて常法によ
り行うことができる。
Further, in the embodiment, the electric circuit pattern is formed by the ITO film and the N film.
Although it has a two-layer structure with an i-P layer, it may have a one-layer structure or a multi-layer structure of three or more layers.
The material is not limited to -P and can be appropriately selected from conductive materials such as Cr, Au, Ag, Cu, and Ni. The electric resistance between the electric circuit pattern formed by the ITO film and the columnar conductor is, as shown in the embodiment, a Ni-film having a thickness of 1 to 5 μm on the ITO film.
By providing the P layer, the size can be further reduced. Furthermore, in order to protect this Ni-P layer from oxidation,
The Ni-P layer may be coated with gold.
It can be performed by an ordinary method using an electroless plating method or an electrolytic plating method.

このような電気回路パターンは、実施例ではフォトリ
ソグラフィー法により形成したが、スクリーン印刷法や
オフセット印刷法等の他の方法で形成してもよい。
In this embodiment, such an electric circuit pattern is formed by a photolithography method, but may be formed by another method such as a screen printing method or an offset printing method.

また実施例では、化学切削性感光性ガラス板からなる
補助用基板を付設したが、本発明の微小探針を有する回
路基板の製法においては、補強用基板を付設する工程は
必ずしも必要な工程ではない。なお補強用基板を付設す
る場合の補強用基板の材料は、所望の機械的強度を有す
る絶縁性物質または半導体であれば特に限定されず、無
機物であっても有機物であってもよい。このときの補強
用基板の形状は特に限定されるものではなく、回路基板
としての機械的強度を向上させることができ、かつ基板
に生じる歪みを抑制することができる形状であれば、例
えば十字状等、種々の形状にすることができる。基板と
補強用基板とを固着させるにあたっては、実施例で用い
たホットメルト型シート状接着剤の他に、各種絶縁性接
着剤、半田ガラス、両面テープ等を用いることができ、
その他、熱融着、ボルト締め等によっても固着させるこ
とができる。
In the examples, the auxiliary substrate made of a chemically-cuttable photosensitive glass plate is provided.However, in the method of manufacturing a circuit board having a micro probe of the present invention, the step of providing the reinforcing substrate is not necessarily required. Absent. The material of the reinforcing substrate when the reinforcing substrate is provided is not particularly limited as long as it is an insulating substance or a semiconductor having a desired mechanical strength, and may be an inorganic substance or an organic substance. The shape of the reinforcing substrate at this time is not particularly limited. For example, a cross shape may be used as long as the mechanical strength of the circuit board can be improved and the distortion generated on the board can be suppressed. And various other shapes. In fixing the substrate and the reinforcing substrate, in addition to the hot melt type sheet adhesive used in the examples, various insulating adhesives, solder glass, double-sided tape, etc. can be used,
In addition, it can be fixed by heat fusion, bolting, or the like.

また実施例では接続端子を付設したが、本発明の微小
探針を有する回路基板の製法においては、接続端子を設
ける工程は必ずしも必要な工程ではない。なお、接続端
子を付設する場合の接続端子の構造は特に限定されるも
のではなく、微小探針を有する回路基板に設けた電気回
路パターンと外部装置とを電気的に接続することができ
さえすれば、いかなる構造の接続端子であってもよく、
その形成方法も適宜選択することができる。
Although the connection terminal is provided in the embodiment, the step of providing the connection terminal is not always necessary in the method of manufacturing a circuit board having a micro probe according to the present invention. The structure of the connection terminal in the case where the connection terminal is provided is not particularly limited, and any structure that can electrically connect an electric circuit pattern provided on a circuit board having a microprobe and an external device can be used. Any structure connection terminal may be used.
The formation method can also be appropriately selected.

本発明の微小探針を有する回路基板の製法における工
程順は、微小探針が確実に支持されている微小探針を有
する回路基板が最終的に得られれば、実施例で例示した
工程順に限定されるものではない。例えば、実施例では
柱状の導電体の一端を基板の表面より突出させる工程の
後に電気回路パターンを設ける工程を行ったが、柱状の
導電体を設ける工程の後に電気回路パターンを設ける工
程を行い、この後、柱状の導電体の一端を基板の表面よ
り突出させる工程を行ってもよい。また、柱状の導電体
を設ける工程の後に電気回路パターンを設ける工程を行
い、次いで補強用基板を設ける工程および接続端子を設
ける工程を行った後に、柱状の導電体の一端を基板の表
面より突出させる工程を行ってもよい。あるいはまた、
柱状の導電体を設ける工程の後に電気回路パターンを設
ける工程を行い、次いで補強用基板を設ける工程を行っ
た後に、柱状の導電体の一端を基板の表面より突出させ
る工程を行い、この後、接続端子を設ける工程を行って
もよい。
The order of the steps in the method for manufacturing a circuit board having a microprobe of the present invention is limited to the order of the steps exemplified in the examples as long as a circuit board having a microprobe in which the microprobe is securely supported is finally obtained. It is not something to be done. For example, in the embodiment, the step of providing the electric circuit pattern was performed after the step of projecting one end of the columnar conductor from the surface of the substrate, but the step of providing the electric circuit pattern was performed after the step of providing the columnar conductor, Thereafter, a step of projecting one end of the columnar conductor from the surface of the substrate may be performed. After the step of providing the columnar conductor, a step of providing an electric circuit pattern is performed, and then, a step of providing a reinforcing substrate and a step of providing connection terminals are performed. May be performed. Alternatively,
Performing the step of providing an electric circuit pattern after the step of providing a columnar conductor, and then performing the step of providing a reinforcing substrate, performing a step of projecting one end of the columnar conductor from the surface of the substrate, and thereafter, A step of providing connection terminals may be performed.

なお、プローブカードのように、微小探針を有する回
路基板中に作業用の開口部が求められる場合には、基板
として作業用の開口部を設けた化学切削性感光性ガラス
を用いる他に、工程として、基板あるいは得られた微小
探針を有する回路基板中に作業用の開口部を設ける工程
を加えて得もよい。補強用基板を付設する場合には、補
強用基板として作業用の開口部を設けた絶縁性物質また
は半導体を用いる他に、工程として、補強用基板に作業
用の開口部を設ける工程を加えてもよい。基板、補強用
基板、あるいは補強用基板を付設した微小探針を有する
回路基板に作業用の開口部を設けるにあたっては、エッ
チング、レーザー加工、ケミカルドリル等の公知の手段
を適用することができる。
When a working opening is required in a circuit board having a fine probe, such as a probe card, in addition to using a chemically cut photosensitive glass provided with a working opening as a substrate, As a step, a step of providing a working opening in a substrate or a circuit board having the obtained microprobe may be added. When a reinforcing substrate is provided, in addition to using an insulating substance or a semiconductor having an opening for operation as a substrate for reinforcing, a step of providing an opening for operation on the substrate for reinforcement is added as a step. Is also good. In providing a working opening in a substrate, a reinforcing substrate, or a circuit board having a microprobe provided with the reinforcing substrate, known means such as etching, laser processing, and chemical drilling can be applied.

[発明の効果] 以上説明したように、本発明の微小探針を有する回路
基板の製法によれば、微小探針となる部材を基板上の所
定の位置に手作業により固定させる工程を経ることな
く、微小探針が確実に支持されている、微小探針を有す
る回路基板を得ることができる。換言すれば、微小探針
の折曲、破損、脱落等のおそれが少なく、被検査基板と
の間で接触不良が生じるおそれの少ない、微小探針を有
する回路基板を得ることができる。
[Effects of the Invention] As described above, according to the method of manufacturing a circuit board having a micro probe of the present invention, a process of manually fixing a member to be a micro probe at a predetermined position on the substrate is performed. In addition, it is possible to obtain a circuit board having a minute probe in which the minute probe is securely supported. In other words, it is possible to obtain a circuit board having a micro probe, which is less likely to be bent, broken, dropped, or the like of the micro probe, and is less likely to cause poor contact with the substrate to be inspected.

したがって本発明を実施することにより、被検査基板
の高密度化(高集積化)に対して容易に対応しつつ、耐
久性、ひいては信頼性に優れた微小探針を有する回路基
板を提供することが可能となる。
Therefore, by carrying out the present invention, it is possible to provide a circuit board having a microprobe having excellent durability and, consequently, excellent reliability while easily coping with high density (high integration) of a substrate to be inspected. Becomes possible.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明に基づいて微小探針を有する回路基板を
製造する際の各工程の一例を模式的に説明するための端
面図、第2図は本発明に基づいて得られた微小探針を有
する回路基板の一例を模式的に示す上面図、第3図は本
発明に基づいて得られた微小探針を有する回路基板に補
強用基板を付設する場合の工程の一例を模式的に説明す
るための端面図、第4図は接続端子を付設する場合の工
程の一例を模式的に説明するための端面図、第5図は柱
状の導電体の外周に設けた樹脂層と基板との間にエッチ
ング液が浸透することにより生じる断面がV字状の溝を
模式的に示す部分端面図である。 1……基板に設けた微細貫通孔、2……化学切削性感光
性ガラス基板、4……補助基板、5……補助基板に設け
た微細貫通孔、8c……柱状の導電体、13……電気回路パ
ターン、微小探針を有する回路基板、32……補強用基板
および接続端子を付設した微小探針を有する回路基板。
FIG. 1 is an end view for schematically explaining an example of each step in manufacturing a circuit board having a micro probe according to the present invention, and FIG. 2 is a micro probe obtained based on the present invention. FIG. 3 is a top view schematically illustrating an example of a circuit board having a needle, and FIG. 3 is a schematic view illustrating an example of a process in a case where a reinforcing substrate is attached to a circuit board having a microprobe obtained according to the present invention. FIG. 4 is an end view for schematically explaining an example of a process for attaching a connection terminal, and FIG. 5 is a resin layer and a substrate provided on the outer periphery of a columnar conductor. FIG. 4 is a partial end view schematically showing a V-shaped groove formed by the penetration of an etching solution between the grooves. 1 ... fine through-holes provided in the substrate, 2 ... chemically-cuttable photosensitive glass substrate, 4 ... auxiliary substrate, 5 ... fine through-holes provided in the auxiliary substrate, 8c ... columnar conductor, 13 ... ... A circuit board having an electric circuit pattern and a minute probe, 32... A circuit board having a minute probe provided with a reinforcing substrate and connection terminals.

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.6,DB名) H01L 21/66 G01R 31/26 G01R 1/073 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 6 , DB name) H01L 21/66 G01R 31/26 G01R 1/073

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】化学切削性感光性ガラスからなる基板に複
数の微細貫通孔を設ける工程と、 前記複数の微細貫通孔を設けた前記基板の一表面に、前
記複数の微細貫通孔とそれぞれ一対一で対応する複数の
微細貫通孔を有し、かつ前記基板よりもエッチングレー
トの高い化学切削性感光性ガラスからなる補助基板を、
この補助基板に設けた前記複数の微細貫通孔と前記基板
に設けた前記複数の微細貫通孔とをそれぞれ一対一で連
通させて固着させる工程と、 前記連通させた複数の微細貫通孔内に柱状の導電体を設
ける工程と、 前記柱状の導電体を設けた後の前記補助基板をエッチン
グ除去することにより、前記柱状の導電体の一端を前記
基板の表面より突出させる工程と、 前記柱状の導電体と電気的に接続する電気回路パターン
を前記基板の表面に設ける工程と、 を含むことを特徴とする、微小探針を有する回路基板の
製法。
A step of providing a plurality of fine through holes in a substrate made of chemically cut photosensitive glass; and forming a pair of the plurality of fine through holes on one surface of the substrate provided with the plurality of fine through holes. Having a plurality of fine through holes corresponding to one, and an auxiliary substrate made of chemically cut photosensitive glass having a higher etching rate than the substrate,
A step of connecting and fixing the plurality of fine through-holes provided in the auxiliary substrate and the plurality of fine through-holes provided in the substrate in a one-to-one correspondence, and forming a columnar shape in the plurality of connected fine through-holes. A step of providing one of the conductors; and a step of protruding one end of the columnar conductor from the surface of the substrate by etching and removing the auxiliary substrate after the provision of the columnar conductor. Providing a circuit pattern electrically connected to the body on the surface of the substrate, the method comprising the steps of:
JP2231698A 1990-08-31 1990-08-31 Manufacturing method of circuit board with micro probe Expired - Lifetime JP2883427B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2231698A JP2883427B2 (en) 1990-08-31 1990-08-31 Manufacturing method of circuit board with micro probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2231698A JP2883427B2 (en) 1990-08-31 1990-08-31 Manufacturing method of circuit board with micro probe

Publications (2)

Publication Number Publication Date
JPH04112549A JPH04112549A (en) 1992-04-14
JP2883427B2 true JP2883427B2 (en) 1999-04-19

Family

ID=16927602

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2231698A Expired - Lifetime JP2883427B2 (en) 1990-08-31 1990-08-31 Manufacturing method of circuit board with micro probe

Country Status (1)

Country Link
JP (1) JP2883427B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4157589B1 (en) * 2007-01-30 2008-10-01 京セラ株式会社 Probe card assembly substrate, probe card assembly and semiconductor wafer inspection method

Also Published As

Publication number Publication date
JPH04112549A (en) 1992-04-14

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