JP2582154Y2 - 半導体装置 - Google Patents

半導体装置

Info

Publication number
JP2582154Y2
JP2582154Y2 JP1990402871U JP40287190U JP2582154Y2 JP 2582154 Y2 JP2582154 Y2 JP 2582154Y2 JP 1990402871 U JP1990402871 U JP 1990402871U JP 40287190 U JP40287190 U JP 40287190U JP 2582154 Y2 JP2582154 Y2 JP 2582154Y2
Authority
JP
Japan
Prior art keywords
fuse element
transistor
terminal
power supply
parallel test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1990402871U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0488041U (US20020128544A1-20020912-P00008.png
Inventor
浩 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP1990402871U priority Critical patent/JP2582154Y2/ja
Publication of JPH0488041U publication Critical patent/JPH0488041U/ja
Application granted granted Critical
Publication of JP2582154Y2 publication Critical patent/JP2582154Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
JP1990402871U 1990-12-11 1990-12-11 半導体装置 Expired - Lifetime JP2582154Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990402871U JP2582154Y2 (ja) 1990-12-11 1990-12-11 半導体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990402871U JP2582154Y2 (ja) 1990-12-11 1990-12-11 半導体装置

Publications (2)

Publication Number Publication Date
JPH0488041U JPH0488041U (US20020128544A1-20020912-P00008.png) 1992-07-30
JP2582154Y2 true JP2582154Y2 (ja) 1998-09-30

Family

ID=31880723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990402871U Expired - Lifetime JP2582154Y2 (ja) 1990-12-11 1990-12-11 半導体装置

Country Status (1)

Country Link
JP (1) JP2582154Y2 (US20020128544A1-20020912-P00008.png)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012033972A (ja) * 2011-11-04 2012-02-16 Renesas Electronics Corp 半導体装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62112298A (ja) * 1985-11-09 1987-05-23 Mitsubishi Electric Corp 半導体集積回路
JPS63197116A (ja) * 1987-02-12 1988-08-16 Toshiba Corp フロ−テイング検出回路
JPH02112261A (ja) * 1988-10-20 1990-04-24 Mitsubishi Electric Corp 半導体集積回路装置
JPH02170566A (ja) * 1988-12-23 1990-07-02 Fujitsu Ltd 微小電圧入力試験用分圧回路の接続方法

Also Published As

Publication number Publication date
JPH0488041U (US20020128544A1-20020912-P00008.png) 1992-07-30

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term