JP2552185Y2 - Ｉｃ試験装置 - Google Patents

Ｉｃ試験装置

Info

Publication number
JP2552185Y2
JP2552185Y2 JP1990057097U JP5709790U JP2552185Y2 JP 2552185 Y2 JP2552185 Y2 JP 2552185Y2 JP 1990057097 U JP1990057097 U JP 1990057097U JP 5709790 U JP5709790 U JP 5709790U JP 2552185 Y2 JP2552185 Y2 JP 2552185Y2
Authority
JP
Japan
Prior art keywords
delay circuit
trigger signal
circuit
test
clock
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP1990057097U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0416379U (enrdf_load_stackoverflow
Inventor
康之 平井
隆幸 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP1990057097U priority Critical patent/JP2552185Y2/ja
Publication of JPH0416379U publication Critical patent/JPH0416379U/ja
Application granted granted Critical
Publication of JP2552185Y2 publication Critical patent/JP2552185Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
JP1990057097U 1990-05-30 1990-05-30 Ｉｃ試験装置 Expired - Fee Related JP2552185Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990057097U JP2552185Y2 (ja) 1990-05-30 1990-05-30 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990057097U JP2552185Y2 (ja) 1990-05-30 1990-05-30 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0416379U JPH0416379U (enrdf_load_stackoverflow) 1992-02-10
JP2552185Y2 true JP2552185Y2 (ja) 1997-10-27

Family

ID=31581502

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990057097U Expired - Fee Related JP2552185Y2 (ja) 1990-05-30 1990-05-30 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2552185Y2 (enrdf_load_stackoverflow)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH073775B2 (ja) * 1986-03-20 1995-01-18 富士通株式会社 ストロボ電子ビ−ム装置
JPH0747750Y2 (ja) * 1988-06-08 1995-11-01 株式会社アドバンテスト 電子ビームテストシステム

Also Published As

Publication number Publication date
JPH0416379U (enrdf_load_stackoverflow) 1992-02-10

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