JP2532081Y2 - Ic試験装置 - Google Patents
Ic試験装置Info
- Publication number
- JP2532081Y2 JP2532081Y2 JP8896489U JP8896489U JP2532081Y2 JP 2532081 Y2 JP2532081 Y2 JP 2532081Y2 JP 8896489 U JP8896489 U JP 8896489U JP 8896489 U JP8896489 U JP 8896489U JP 2532081 Y2 JP2532081 Y2 JP 2532081Y2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- voltage source
- circuit
- relay
- bias voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8896489U JP2532081Y2 (ja) | 1989-07-28 | 1989-07-28 | Ic試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8896489U JP2532081Y2 (ja) | 1989-07-28 | 1989-07-28 | Ic試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0328480U JPH0328480U (enExample) | 1991-03-20 |
| JP2532081Y2 true JP2532081Y2 (ja) | 1997-04-09 |
Family
ID=31638559
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8896489U Expired - Lifetime JP2532081Y2 (ja) | 1989-07-28 | 1989-07-28 | Ic試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2532081Y2 (enExample) |
-
1989
- 1989-07-28 JP JP8896489U patent/JP2532081Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0328480U (enExample) | 1991-03-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |