JP2528730Y2 - Ｌｃｒメータ - Google Patents
ＬｃｒメータInfo
- Publication number
- JP2528730Y2 JP2528730Y2 JP305591U JP305591U JP2528730Y2 JP 2528730 Y2 JP2528730 Y2 JP 2528730Y2 JP 305591 U JP305591 U JP 305591U JP 305591 U JP305591 U JP 305591U JP 2528730 Y2 JP2528730 Y2 JP 2528730Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- impedance
- display
- display unit
- admittance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000013598 vector Substances 0.000 claims description 19
- 238000005259 measurement Methods 0.000 claims description 6
- 239000003990 capacitor Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 230000004397 blinking Effects 0.000 description 4
- 230000002950 deficient Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000007689 inspection Methods 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000002847 impedance measurement Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP305591U JP2528730Y2 (ja) | 1991-01-08 | 1991-01-08 | Ｌｃｒメータ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP305591U JP2528730Y2 (ja) | 1991-01-08 | 1991-01-08 | Ｌｃｒメータ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0496072U JPH0496072U (OSRAM) | 1992-08-20 |
| JP2528730Y2 true JP2528730Y2 (ja) | 1997-03-12 |
Family
ID=31731659
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP305591U Expired - Fee Related JP2528730Y2 (ja) | 1991-01-08 | 1991-01-08 | Ｌｃｒメータ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2528730Y2 (OSRAM) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07333303A (ja) * | 1994-06-07 | 1995-12-22 | Sony Corp | 電池素子の短絡検査装置及び検査方法 |
| JP3450962B2 (ja) * | 1996-05-22 | 2003-09-29 | 株式会社モリタ製作所 | インピーダンスオージオメータとそれに用いるグラフの作成装置 |
| JP4596834B2 (ja) * | 2004-07-07 | 2010-12-15 | 日置電機株式会社 | 電子回路検査装置および電子回路検査方法 |
| JP2010243204A (ja) * | 2009-04-01 | 2010-10-28 | Hioki Ee Corp | 検査装置および測定試料の合否範囲設定方法 |
| JP6774848B2 (ja) * | 2016-11-10 | 2020-10-28 | 日本放送協会 | インピーダンス測定装置 |
-
1991
- 1991-01-08 JP JP305591U patent/JP2528730Y2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0496072U (OSRAM) | 1992-08-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 19960820 |
|
| LAPS | Cancellation because of no payment of annual fees |